Spectral domain analysis of double screen frequency selective surfaces

Detalhes bibliográficos
Autor(a) principal: Campos, Antonio Luiz Pereira de Siqueira
Data de Publicação: 2012
Outros Autores: Silva, Tércio de Lima
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Repositório Institucional da UFRN
Texto Completo: https://repositorio.ufrn.br/handle/123456789/45557
Resumo: This paper presents a numerical investigation for a double screen frequency selective surface (FSS) with perfectly conducting rectangular patch elements. The analysis uses a full wave technique to obtain the scattering characteristics. The analysis combines the immitance approach and the method of moments to obtain the scattered fields and, consequently, the scattering characteristics of the structure. For validation of the analysis, numerical results are compared with measured and numerical results presented by another authors. A good agreement was obtained with experimental results
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spelling Campos, Antonio Luiz Pereira de SiqueiraSilva, Tércio de Lima2022-01-04T13:59:05Z2022-01-04T13:59:05Z2012-06CAMPOS, Antonio Luiz Pereira de Siqueira; SILVA, Tércio de Lima; Spectral Domain Analysis of Double Screen Frequency Selective Surfaces. Journal of Microwaves, Optoelectronics and Electromagnetic Applications, Vol. 11, No. 1, June 2012. Disponível em: https://www.scielo.br/j/jmoea/a/CJc6yVqmmgBZsbLjjdvDxnC/?lang=en. Acesso em: 04 jan. 2022. https://doi.org/10.1590/S2179-10742012000100007.2179-1074https://repositorio.ufrn.br/handle/123456789/4555710.1590/S2179-10742012000100007SBMO/SBMagAttribution-NonCommercial 3.0 Brazilhttp://creativecommons.org/licenses/by-nc/3.0/br/info:eu-repo/semantics/openAccessMethod of MomentsImmitance ApproachFSSSpectral Domain AnalysisDouble Screen FSSSpectral domain analysis of double screen frequency selective surfacesinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articleThis paper presents a numerical investigation for a double screen frequency selective surface (FSS) with perfectly conducting rectangular patch elements. The analysis uses a full wave technique to obtain the scattering characteristics. The analysis combines the immitance approach and the method of moments to obtain the scattered fields and, consequently, the scattering characteristics of the structure. For validation of the analysis, numerical results are compared with measured and numerical results presented by another authors. A good agreement was obtained with experimental resultsengreponame:Repositório Institucional da UFRNinstname:Universidade Federal do Rio Grande do Norte (UFRN)instacron:UFRNORIGINALSpectralDomainAnalysis_Campos_2012.pdfSpectralDomainAnalysis_Campos_2012.pdfapplication/pdf150272https://repositorio.ufrn.br/bitstream/123456789/45557/1/SpectralDomainAnalysis_Campos_2012.pdfc16b7f11eb2e0c82de7f2ac493fbadffMD51CC-LICENSElicense_rdflicense_rdfapplication/rdf+xml; charset=utf-8920https://repositorio.ufrn.br/bitstream/123456789/45557/2/license_rdf728dfda2fa81b274c619d08d1dfc1a03MD52LICENSElicense.txtlicense.txttext/plain; charset=utf-81484https://repositorio.ufrn.br/bitstream/123456789/45557/3/license.txte9597aa2854d128fd968be5edc8a28d9MD53123456789/455572022-01-04 10:59:07.408oai:https://repositorio.ufrn.br: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Repositório de PublicaçõesPUBhttp://repositorio.ufrn.br/oai/opendoar:2022-01-04T13:59:07Repositório Institucional da UFRN - Universidade Federal do Rio Grande do Norte (UFRN)false
dc.title.pt_BR.fl_str_mv Spectral domain analysis of double screen frequency selective surfaces
title Spectral domain analysis of double screen frequency selective surfaces
spellingShingle Spectral domain analysis of double screen frequency selective surfaces
Campos, Antonio Luiz Pereira de Siqueira
Method of Moments
Immitance Approach
FSS
Spectral Domain Analysis
Double Screen FSS
title_short Spectral domain analysis of double screen frequency selective surfaces
title_full Spectral domain analysis of double screen frequency selective surfaces
title_fullStr Spectral domain analysis of double screen frequency selective surfaces
title_full_unstemmed Spectral domain analysis of double screen frequency selective surfaces
title_sort Spectral domain analysis of double screen frequency selective surfaces
author Campos, Antonio Luiz Pereira de Siqueira
author_facet Campos, Antonio Luiz Pereira de Siqueira
Silva, Tércio de Lima
author_role author
author2 Silva, Tércio de Lima
author2_role author
dc.contributor.author.fl_str_mv Campos, Antonio Luiz Pereira de Siqueira
Silva, Tércio de Lima
dc.subject.por.fl_str_mv Method of Moments
Immitance Approach
FSS
Spectral Domain Analysis
Double Screen FSS
topic Method of Moments
Immitance Approach
FSS
Spectral Domain Analysis
Double Screen FSS
description This paper presents a numerical investigation for a double screen frequency selective surface (FSS) with perfectly conducting rectangular patch elements. The analysis uses a full wave technique to obtain the scattering characteristics. The analysis combines the immitance approach and the method of moments to obtain the scattered fields and, consequently, the scattering characteristics of the structure. For validation of the analysis, numerical results are compared with measured and numerical results presented by another authors. A good agreement was obtained with experimental results
publishDate 2012
dc.date.issued.fl_str_mv 2012-06
dc.date.accessioned.fl_str_mv 2022-01-04T13:59:05Z
dc.date.available.fl_str_mv 2022-01-04T13:59:05Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/article
format article
status_str publishedVersion
dc.identifier.citation.fl_str_mv CAMPOS, Antonio Luiz Pereira de Siqueira; SILVA, Tércio de Lima; Spectral Domain Analysis of Double Screen Frequency Selective Surfaces. Journal of Microwaves, Optoelectronics and Electromagnetic Applications, Vol. 11, No. 1, June 2012. Disponível em: https://www.scielo.br/j/jmoea/a/CJc6yVqmmgBZsbLjjdvDxnC/?lang=en. Acesso em: 04 jan. 2022. https://doi.org/10.1590/S2179-10742012000100007.
dc.identifier.uri.fl_str_mv https://repositorio.ufrn.br/handle/123456789/45557
dc.identifier.issn.none.fl_str_mv 2179-1074
dc.identifier.doi.none.fl_str_mv 10.1590/S2179-10742012000100007
identifier_str_mv CAMPOS, Antonio Luiz Pereira de Siqueira; SILVA, Tércio de Lima; Spectral Domain Analysis of Double Screen Frequency Selective Surfaces. Journal of Microwaves, Optoelectronics and Electromagnetic Applications, Vol. 11, No. 1, June 2012. Disponível em: https://www.scielo.br/j/jmoea/a/CJc6yVqmmgBZsbLjjdvDxnC/?lang=en. Acesso em: 04 jan. 2022. https://doi.org/10.1590/S2179-10742012000100007.
2179-1074
10.1590/S2179-10742012000100007
url https://repositorio.ufrn.br/handle/123456789/45557
dc.language.iso.fl_str_mv eng
language eng
dc.rights.driver.fl_str_mv Attribution-NonCommercial 3.0 Brazil
http://creativecommons.org/licenses/by-nc/3.0/br/
info:eu-repo/semantics/openAccess
rights_invalid_str_mv Attribution-NonCommercial 3.0 Brazil
http://creativecommons.org/licenses/by-nc/3.0/br/
eu_rights_str_mv openAccess
dc.publisher.none.fl_str_mv SBMO/SBMag
publisher.none.fl_str_mv SBMO/SBMag
dc.source.none.fl_str_mv reponame:Repositório Institucional da UFRN
instname:Universidade Federal do Rio Grande do Norte (UFRN)
instacron:UFRN
instname_str Universidade Federal do Rio Grande do Norte (UFRN)
instacron_str UFRN
institution UFRN
reponame_str Repositório Institucional da UFRN
collection Repositório Institucional da UFRN
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