Photoluminescence, photoabsorption and photoemission studies of hydrazone thin film used as hole transporting material in OLEDs

• Autor(a) principal: Quirino,W. G.
• Data de Publicação: 2008
• Outros Autores: Legnani,C., Cremona,M., Reyes,R., Mota,G. V., Weibel,D. E., Rocco,M. L. M.
• Tipo de documento: Artigo
• Idioma: eng
• Título da fonte: Journal of the Brazilian Chemical Society (Online)
• Texto Completo: http://old.scielo.br/scielo.php?script=sci_arttext&pid=S0103-50532008000500010
• topic: photoluminescence; photoabsorption; photoemission; MTCD; OLED degradation

Photoluminescence (PL) emission of 1-(3-methylphenyl)-1,2,3,4-tetrahydroquinoline-6-carboxyaldehyde-1,1 -diphenylhydrazone (MTCD) thin films was monitored as a function of UV irradiation, and it was found to decrease exponentially with the exposure time. In order to gain insight into the degradation mechanisms and evaluate the electronic structure of this organic material used with good results as hole transporting layer (HTL) in the fabrication of organic light emitting diodes (OLEDs), synchrotron radiation-based photoabsorption and photoemission techniques at the carbon and nitrogen 1s edges as well as at the valence band were employed. The influence of sunlight was simulated using non-monochromatized synchrotron radiation. After exposure all the spectra show a decrease of the photoabsorption and photoemission signals, however, while it is less accentuated at the carbon edge, at the nitrogen edge and at the valence region it decreases drastically. The loss of nitrogen is suggested to be the main step in the disruption of the π system, leading to the failure of the devices fabricated with this compound as hole transporting layer.