Desenvolvimento de metodologia e código computacional para a medida de espessura de revestimentos em metal por fluorescência de raios X

• Autor(a) principal: Sousa, Luiz Fernando Rosalba Telles de
• Data de Publicação: 2016
• Tipo de documento: Tese
• Idioma: por
• Título da fonte: Biblioteca Digital de Teses e Dissertações da UERJ
• Texto Completo: http://www.bdtd.uerj.br/handle/1/13694
• topic: XRF; X-Ray; Thickness; Thin films; EDXRF; Revestimentos; Revestimento de metal; Raios X - Métodos de simulação; Raios X - Fluorescência; XRF; Espessura; Filmes finos; EDXRF; CNPQ::ENGENHARIAS::ENGENHARIA NUCLEAR

Present work performs experimental and computational studies about the transport of X-rays through matter using dispersive energy (EDRXF). The experiments were performed using two EDXRF kits, the Bruker and Amptek in energy range of 30 to 40 keV focusing on iron, copper, alloys of iron, manganese and the commonly used in industry steel 1020. Feasibility of using two methods based on Beer law with purpose to determinate the thickness of thin coatings of nickel and zinc were analyzed. Simulations were developed using consecrated programs based on the Monte Carlo method for transport of radiation through matter: the GEANT4 software, XRMC 6.4 and MCNPX 26e. A new methodology for determining the area under characteristic peaks of energy is presented. The methodology counts with different interpolation and integration algorithms, and also can provide spectral manipulation. The developed program in this work is able to determinate the thickness of coatings in simulated homogeneous materials using a simple and quick environment with absolute errors below 0.6 μm for thicknesses up to 1 micrometers. In the range of 1 to 20 μm error show oscillation. Results acquired with one of the methods achieved more consistent results. For the experimental samples there was no agreement among the proposed methods. In experimentation again, one of the methods shows values closer to the expected, about 10 micrometers.