Structural complexity of disordered surfaces: analyzing the porous silicon SFM patterns

Detalhes bibliográficos
Autor(a) principal: Rosa, R. R.
Data de Publicação: 2007
Outros Autores: Baroni, M. P. M. A., Zaniboni, G. T., Silva, A. Ferreira da, Roman, L. S., Pontes, J., Bolzan, M. J. A.
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Repositório Institucional da UFBA
Texto Completo: http://repositorio.ufba.br/ri/handle/ri/14664
Resumo: Texto completo: acesso restrito. p. 666-673
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spelling Rosa, R. R.Baroni, M. P. M. A.Zaniboni, G. T.Silva, A. Ferreira daRoman, L. S.Pontes, J.Bolzan, M. J. A.Rosa, R. R.Baroni, M. P. M. A.Zaniboni, G. T.Silva, A. Ferreira daRoman, L. S.Pontes, J.Bolzan, M. J. A.2014-02-21T18:41:43Z2007http://repositorio.ufba.br/ri/handle/ri/14664v. 386, n. 2Texto completo: acesso restrito. p. 666-673This paper introduces a relative structural complexity measure for the characterization of disordered surfaces. Numerical solutions of 2d+1 KPZ equation and scanning force microscopy (SFM) patterns of porous silicon samples are analyzed using this methodology. The results and phenomenological interpretation indicate that the proposed measure is efficient for quantitatively characterize the structural complexity of disordered surfaces (and interfaces) observed and/or simulated in nano, micro and ordinary scales.Submitted by Suelen Reis (suziy.ellen@gmail.com) on 2013-12-17T11:46:56Z No. of bitstreams: 1 1-s2.0-S0378437107009557-main.pdf: 439420 bytes, checksum: dbcc5bfac935096efb9f56363126a89c (MD5)Approved for entry into archive by Alda Lima da Silva (sivalda@ufba.br) on 2014-02-21T18:41:43Z (GMT) No. of bitstreams: 1 1-s2.0-S0378437107009557-main.pdf: 439420 bytes, checksum: dbcc5bfac935096efb9f56363126a89c (MD5)Made available in DSpace on 2014-02-21T18:41:43Z (GMT). No. of bitstreams: 1 1-s2.0-S0378437107009557-main.pdf: 439420 bytes, checksum: dbcc5bfac935096efb9f56363126a89c (MD5) Previous issue date: 2007http://dx.doi.org/10.1016/j.physa.2007.08.044reponame:Repositório Institucional da UFBAinstname:Universidade Federal da Bahia (UFBA)instacron:UFBADisordered surfacesStructural complexityGradient pattern analysisWavelet multiresolution analysisEuler characteristicKPZ equationPorous siliconStructural complexity of disordered surfaces: analyzing the porous silicon SFM patternsPhysica A: Statistical Mechanics and its Applicationsinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/article10000-01-01info:eu-repo/semantics/openAccessengORIGINAL1-s2.0-S0378437107009557-main.pdf1-s2.0-S0378437107009557-main.pdfapplication/pdf439420https://repositorio.ufba.br/bitstream/ri/14664/1/1-s2.0-S0378437107009557-main.pdfdbcc5bfac935096efb9f56363126a89cMD51LICENSElicense.txtlicense.txttext/plain1345https://repositorio.ufba.br/bitstream/ri/14664/2/license.txtff6eaa8b858ea317fded99f125f5fcd0MD52TEXT1-s2.0-S0378437107009557-main.pdf.txt1-s2.0-S0378437107009557-main.pdf.txtExtracted texttext/plain26295https://repositorio.ufba.br/bitstream/ri/14664/3/1-s2.0-S0378437107009557-main.pdf.txtea6957b7d058f7e0d4d94b23ef6921e2MD53ri/146642022-07-05 14:02:48.547oai:repositorio.ufba.br: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Repositório InstitucionalPUBhttp://192.188.11.11:8080/oai/requestopendoar:19322022-07-05T17:02:48Repositório Institucional da UFBA - Universidade Federal da Bahia (UFBA)false
dc.title.pt_BR.fl_str_mv Structural complexity of disordered surfaces: analyzing the porous silicon SFM patterns
dc.title.alternative.pt_BR.fl_str_mv Physica A: Statistical Mechanics and its Applications
title Structural complexity of disordered surfaces: analyzing the porous silicon SFM patterns
spellingShingle Structural complexity of disordered surfaces: analyzing the porous silicon SFM patterns
Rosa, R. R.
Disordered surfaces
Structural complexity
Gradient pattern analysis
Wavelet multiresolution analysis
Euler characteristic
KPZ equation
Porous silicon
title_short Structural complexity of disordered surfaces: analyzing the porous silicon SFM patterns
title_full Structural complexity of disordered surfaces: analyzing the porous silicon SFM patterns
title_fullStr Structural complexity of disordered surfaces: analyzing the porous silicon SFM patterns
title_full_unstemmed Structural complexity of disordered surfaces: analyzing the porous silicon SFM patterns
title_sort Structural complexity of disordered surfaces: analyzing the porous silicon SFM patterns
author Rosa, R. R.
author_facet Rosa, R. R.
Baroni, M. P. M. A.
Zaniboni, G. T.
Silva, A. Ferreira da
Roman, L. S.
Pontes, J.
Bolzan, M. J. A.
author_role author
author2 Baroni, M. P. M. A.
Zaniboni, G. T.
Silva, A. Ferreira da
Roman, L. S.
Pontes, J.
Bolzan, M. J. A.
author2_role author
author
author
author
author
author
dc.contributor.author.fl_str_mv Rosa, R. R.
Baroni, M. P. M. A.
Zaniboni, G. T.
Silva, A. Ferreira da
Roman, L. S.
Pontes, J.
Bolzan, M. J. A.
Rosa, R. R.
Baroni, M. P. M. A.
Zaniboni, G. T.
Silva, A. Ferreira da
Roman, L. S.
Pontes, J.
Bolzan, M. J. A.
dc.subject.por.fl_str_mv Disordered surfaces
Structural complexity
Gradient pattern analysis
Wavelet multiresolution analysis
Euler characteristic
KPZ equation
Porous silicon
topic Disordered surfaces
Structural complexity
Gradient pattern analysis
Wavelet multiresolution analysis
Euler characteristic
KPZ equation
Porous silicon
description Texto completo: acesso restrito. p. 666-673
publishDate 2007
dc.date.issued.fl_str_mv 2007
dc.date.accessioned.fl_str_mv 2014-02-21T18:41:43Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/article
format article
status_str publishedVersion
dc.identifier.uri.fl_str_mv http://repositorio.ufba.br/ri/handle/ri/14664
dc.identifier.number.pt_BR.fl_str_mv v. 386, n. 2
url http://repositorio.ufba.br/ri/handle/ri/14664
identifier_str_mv v. 386, n. 2
dc.language.iso.fl_str_mv eng
language eng
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.source.pt_BR.fl_str_mv http://dx.doi.org/10.1016/j.physa.2007.08.044
dc.source.none.fl_str_mv reponame:Repositório Institucional da UFBA
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