Electrical characterization of in situ polymerized polyaniline thin films.
Autor(a) principal: | |
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Data de Publicação: | 2007 |
Outros Autores: | , , |
Tipo de documento: | Artigo |
Idioma: | eng |
Título da fonte: | Repositório Institucional da UFOP |
Texto Completo: | http://www.repositorio.ufop.br/handle/123456789/4493 https://doi.org/10.1016/j.mseb.2007.07.071 |
Resumo: | The alternating conductivity, σ*(f) = σ (f) + iσ(f), of in situ polymerized polyaniline thin films doped with hydrochloric acid, deposited on top of an interdigitated gold line array previously deposited on glass substrates, were measured in the frequency (f) range between 0.1 Hz to 10 MHz and in the temperature range from 100 to 430 K. The results for σ (f) are typical of a disordered solid material: for frequencies lower than a certain hopping frequency γhop, log[σ (f)] is frequency-independent rising almost linearly for in log f > γhop. A master curve was thus obtained by plotting the real component of the conductivity using normalized scales σ (f)/σdc and f/γhop, which is indicative of a single process operating in the whole frequency range. An expression encompassing the conduction through a disordered structure taken from previous random free energy barrier model for hopping carriers, as well a dielectric function to represent the capacitive behavior of the PAni was employed to fit the experimental results. The dielectric constant and activation energy for hopping carriers were obtained as function of the polymer doping level. |
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Electrical characterization of in situ polymerized polyaniline thin films.PolyanilineIn situ polymerizationElectrical propertiesImpedance spectroscopyThe alternating conductivity, σ*(f) = σ (f) + iσ(f), of in situ polymerized polyaniline thin films doped with hydrochloric acid, deposited on top of an interdigitated gold line array previously deposited on glass substrates, were measured in the frequency (f) range between 0.1 Hz to 10 MHz and in the temperature range from 100 to 430 K. The results for σ (f) are typical of a disordered solid material: for frequencies lower than a certain hopping frequency γhop, log[σ (f)] is frequency-independent rising almost linearly for in log f > γhop. A master curve was thus obtained by plotting the real component of the conductivity using normalized scales σ (f)/σdc and f/γhop, which is indicative of a single process operating in the whole frequency range. An expression encompassing the conduction through a disordered structure taken from previous random free energy barrier model for hopping carriers, as well a dielectric function to represent the capacitive behavior of the PAni was employed to fit the experimental results. The dielectric constant and activation energy for hopping carriers were obtained as function of the polymer doping level.2015-02-25T16:16:34Z2015-02-25T16:16:34Z2007info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articleapplication/pdfTRAVAIN, S. A. et al. Electrical characterization of in situ polymerized polyaniline thin films. Materials Science and Engineering. B, Solid State Materials for Advanced Technology, v. 143, p. 31-37, 2007. Disponível em: <https://www.sciencedirect.com/science/article/pii/S0921510707003935>. Acesso em: 23 fev. 2015.0921-5107http://www.repositorio.ufop.br/handle/123456789/4493https://doi.org/10.1016/j.mseb.2007.07.071O periódico Materials Science and Engineering. B concede permissão para depósito do artigo no Repositório Institucional da UFOP. Número da licença: 3565381195952.info:eu-repo/semantics/openAccessTravain, Silmar AntonioFerreira, Guilherme Fontes LealGiacometti, José AlbertoBianchi, Rodrigo Fernandoengreponame:Repositório Institucional da UFOPinstname:Universidade Federal de Ouro Preto (UFOP)instacron:UFOP2019-06-24T12:53:29Zoai:repositorio.ufop.br:123456789/4493Repositório InstitucionalPUBhttp://www.repositorio.ufop.br/oai/requestrepositorio@ufop.edu.bropendoar:32332019-06-24T12:53:29Repositório Institucional da UFOP - Universidade Federal de Ouro Preto (UFOP)false |
dc.title.none.fl_str_mv |
Electrical characterization of in situ polymerized polyaniline thin films. |
title |
Electrical characterization of in situ polymerized polyaniline thin films. |
spellingShingle |
Electrical characterization of in situ polymerized polyaniline thin films. Travain, Silmar Antonio Polyaniline In situ polymerization Electrical properties Impedance spectroscopy |
title_short |
Electrical characterization of in situ polymerized polyaniline thin films. |
title_full |
Electrical characterization of in situ polymerized polyaniline thin films. |
title_fullStr |
Electrical characterization of in situ polymerized polyaniline thin films. |
title_full_unstemmed |
Electrical characterization of in situ polymerized polyaniline thin films. |
title_sort |
Electrical characterization of in situ polymerized polyaniline thin films. |
author |
Travain, Silmar Antonio |
author_facet |
Travain, Silmar Antonio Ferreira, Guilherme Fontes Leal Giacometti, José Alberto Bianchi, Rodrigo Fernando |
author_role |
author |
author2 |
Ferreira, Guilherme Fontes Leal Giacometti, José Alberto Bianchi, Rodrigo Fernando |
author2_role |
author author author |
dc.contributor.author.fl_str_mv |
Travain, Silmar Antonio Ferreira, Guilherme Fontes Leal Giacometti, José Alberto Bianchi, Rodrigo Fernando |
dc.subject.por.fl_str_mv |
Polyaniline In situ polymerization Electrical properties Impedance spectroscopy |
topic |
Polyaniline In situ polymerization Electrical properties Impedance spectroscopy |
description |
The alternating conductivity, σ*(f) = σ (f) + iσ(f), of in situ polymerized polyaniline thin films doped with hydrochloric acid, deposited on top of an interdigitated gold line array previously deposited on glass substrates, were measured in the frequency (f) range between 0.1 Hz to 10 MHz and in the temperature range from 100 to 430 K. The results for σ (f) are typical of a disordered solid material: for frequencies lower than a certain hopping frequency γhop, log[σ (f)] is frequency-independent rising almost linearly for in log f > γhop. A master curve was thus obtained by plotting the real component of the conductivity using normalized scales σ (f)/σdc and f/γhop, which is indicative of a single process operating in the whole frequency range. An expression encompassing the conduction through a disordered structure taken from previous random free energy barrier model for hopping carriers, as well a dielectric function to represent the capacitive behavior of the PAni was employed to fit the experimental results. The dielectric constant and activation energy for hopping carriers were obtained as function of the polymer doping level. |
publishDate |
2007 |
dc.date.none.fl_str_mv |
2007 2015-02-25T16:16:34Z 2015-02-25T16:16:34Z |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/article |
format |
article |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
TRAVAIN, S. A. et al. Electrical characterization of in situ polymerized polyaniline thin films. Materials Science and Engineering. B, Solid State Materials for Advanced Technology, v. 143, p. 31-37, 2007. Disponível em: <https://www.sciencedirect.com/science/article/pii/S0921510707003935>. Acesso em: 23 fev. 2015. 0921-5107 http://www.repositorio.ufop.br/handle/123456789/4493 https://doi.org/10.1016/j.mseb.2007.07.071 |
identifier_str_mv |
TRAVAIN, S. A. et al. Electrical characterization of in situ polymerized polyaniline thin films. Materials Science and Engineering. B, Solid State Materials for Advanced Technology, v. 143, p. 31-37, 2007. Disponível em: <https://www.sciencedirect.com/science/article/pii/S0921510707003935>. Acesso em: 23 fev. 2015. 0921-5107 |
url |
http://www.repositorio.ufop.br/handle/123456789/4493 https://doi.org/10.1016/j.mseb.2007.07.071 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
application/pdf |
dc.source.none.fl_str_mv |
reponame:Repositório Institucional da UFOP instname:Universidade Federal de Ouro Preto (UFOP) instacron:UFOP |
instname_str |
Universidade Federal de Ouro Preto (UFOP) |
instacron_str |
UFOP |
institution |
UFOP |
reponame_str |
Repositório Institucional da UFOP |
collection |
Repositório Institucional da UFOP |
repository.name.fl_str_mv |
Repositório Institucional da UFOP - Universidade Federal de Ouro Preto (UFOP) |
repository.mail.fl_str_mv |
repositorio@ufop.edu.br |
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1813002842932248576 |