Grain size effect on the electrical response of SnO2 thin and thick film gas sensors
Autor(a) principal: | |
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Data de Publicação: | 2009 |
Outros Autores: | , , , , , , |
Tipo de documento: | Artigo |
Idioma: | eng |
Título da fonte: | Repositório Institucional da UNESP |
Texto Completo: | http://dx.doi.org/10.1590/S1516-14392009000100010 http://hdl.handle.net/11449/30584 |
Resumo: | Porous nano and micro crystalline tin oxide films were deposited by RF Magnetron Sputtering and doctor blade techniques, respectively. Electrical resistance and impedance spectroscopy measurements, as a function of temperature and atmosphere, were performed in order to determine the influence of the microstructure and working conditions over the electrical response of the sensors. The conductivity of all samples increases with the temperature and decreases in oxygen, as expected for an n-type semiconducting material. The impedance plots indicated the existence of two time constants related to the grains and the grain boundaries. The Nyquist diagrams at low frequencies revealed the changes that took place in the grain boundary region, with the contribution of the grains being indicated by the formation of a second semicircle at high frequencies. The better sensing performance of the doctor bladed samples can be explained by their lower initial resistance values, bigger grain sizes and higher porosity. |
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Repositório Institucional da UNESP |
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Grain size effect on the electrical response of SnO2 thin and thick film gas sensorssemiconductorsimpedance spectroscopyelectrical propertiePorous nano and micro crystalline tin oxide films were deposited by RF Magnetron Sputtering and doctor blade techniques, respectively. Electrical resistance and impedance spectroscopy measurements, as a function of temperature and atmosphere, were performed in order to determine the influence of the microstructure and working conditions over the electrical response of the sensors. The conductivity of all samples increases with the temperature and decreases in oxygen, as expected for an n-type semiconducting material. The impedance plots indicated the existence of two time constants related to the grains and the grain boundaries. The Nyquist diagrams at low frequencies revealed the changes that took place in the grain boundary region, with the contribution of the grains being indicated by the formation of a second semicircle at high frequencies. The better sensing performance of the doctor bladed samples can be explained by their lower initial resistance values, bigger grain sizes and higher porosity.Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)UNESP Instituto de Química Laboratório Interdisciplinar de Eletroquímica e CerâmicaFacultad de Ingeniería INTEMAUNESP Instituto de Química Laboratório Interdisciplinar de Eletroquímica e CerâmicaABM, ABC, ABPolUniversidade Estadual Paulista (Unesp)Facultad de Ingeniería INTEMASavu, Raluca [UNESP]Ponce, Miguel AdolfoJoanni, Ednan [UNESP]Bueno, Paulo Roberto [UNESP]Castro, MiriamCilense, Mario [UNESP]Varela, José Arana [UNESP]Longo, Elson [UNESP]2014-05-20T15:17:44Z2014-05-20T15:17:44Z2009-03-01info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/article83-87application/pdfhttp://dx.doi.org/10.1590/S1516-14392009000100010Materials Research. ABM, ABC, ABPol, v. 12, n. 1, p. 83-87, 2009.1516-1439http://hdl.handle.net/11449/3058410.1590/S1516-14392009000100010S1516-14392009000100010WOS:000266278400010S1516-14392009000100010.pdf047704590673325491283531030833940000-0003-2827-0208SciELOreponame:Repositório Institucional da UNESPinstname:Universidade Estadual Paulista (UNESP)instacron:UNESPengMaterials Research1.1030,398info:eu-repo/semantics/openAccess2023-11-28T06:19:39Zoai:repositorio.unesp.br:11449/30584Repositório InstitucionalPUBhttp://repositorio.unesp.br/oai/requestopendoar:29462024-08-05T18:59:15.671613Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)false |
dc.title.none.fl_str_mv |
Grain size effect on the electrical response of SnO2 thin and thick film gas sensors |
title |
Grain size effect on the electrical response of SnO2 thin and thick film gas sensors |
spellingShingle |
Grain size effect on the electrical response of SnO2 thin and thick film gas sensors Savu, Raluca [UNESP] semiconductors impedance spectroscopy electrical propertie |
title_short |
Grain size effect on the electrical response of SnO2 thin and thick film gas sensors |
title_full |
Grain size effect on the electrical response of SnO2 thin and thick film gas sensors |
title_fullStr |
Grain size effect on the electrical response of SnO2 thin and thick film gas sensors |
title_full_unstemmed |
Grain size effect on the electrical response of SnO2 thin and thick film gas sensors |
title_sort |
Grain size effect on the electrical response of SnO2 thin and thick film gas sensors |
author |
Savu, Raluca [UNESP] |
author_facet |
Savu, Raluca [UNESP] Ponce, Miguel Adolfo Joanni, Ednan [UNESP] Bueno, Paulo Roberto [UNESP] Castro, Miriam Cilense, Mario [UNESP] Varela, José Arana [UNESP] Longo, Elson [UNESP] |
author_role |
author |
author2 |
Ponce, Miguel Adolfo Joanni, Ednan [UNESP] Bueno, Paulo Roberto [UNESP] Castro, Miriam Cilense, Mario [UNESP] Varela, José Arana [UNESP] Longo, Elson [UNESP] |
author2_role |
author author author author author author author |
dc.contributor.none.fl_str_mv |
Universidade Estadual Paulista (Unesp) Facultad de Ingeniería INTEMA |
dc.contributor.author.fl_str_mv |
Savu, Raluca [UNESP] Ponce, Miguel Adolfo Joanni, Ednan [UNESP] Bueno, Paulo Roberto [UNESP] Castro, Miriam Cilense, Mario [UNESP] Varela, José Arana [UNESP] Longo, Elson [UNESP] |
dc.subject.por.fl_str_mv |
semiconductors impedance spectroscopy electrical propertie |
topic |
semiconductors impedance spectroscopy electrical propertie |
description |
Porous nano and micro crystalline tin oxide films were deposited by RF Magnetron Sputtering and doctor blade techniques, respectively. Electrical resistance and impedance spectroscopy measurements, as a function of temperature and atmosphere, were performed in order to determine the influence of the microstructure and working conditions over the electrical response of the sensors. The conductivity of all samples increases with the temperature and decreases in oxygen, as expected for an n-type semiconducting material. The impedance plots indicated the existence of two time constants related to the grains and the grain boundaries. The Nyquist diagrams at low frequencies revealed the changes that took place in the grain boundary region, with the contribution of the grains being indicated by the formation of a second semicircle at high frequencies. The better sensing performance of the doctor bladed samples can be explained by their lower initial resistance values, bigger grain sizes and higher porosity. |
publishDate |
2009 |
dc.date.none.fl_str_mv |
2009-03-01 2014-05-20T15:17:44Z 2014-05-20T15:17:44Z |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/article |
format |
article |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://dx.doi.org/10.1590/S1516-14392009000100010 Materials Research. ABM, ABC, ABPol, v. 12, n. 1, p. 83-87, 2009. 1516-1439 http://hdl.handle.net/11449/30584 10.1590/S1516-14392009000100010 S1516-14392009000100010 WOS:000266278400010 S1516-14392009000100010.pdf 0477045906733254 9128353103083394 0000-0003-2827-0208 |
url |
http://dx.doi.org/10.1590/S1516-14392009000100010 http://hdl.handle.net/11449/30584 |
identifier_str_mv |
Materials Research. ABM, ABC, ABPol, v. 12, n. 1, p. 83-87, 2009. 1516-1439 10.1590/S1516-14392009000100010 S1516-14392009000100010 WOS:000266278400010 S1516-14392009000100010.pdf 0477045906733254 9128353103083394 0000-0003-2827-0208 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
Materials Research 1.103 0,398 |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
83-87 application/pdf |
dc.publisher.none.fl_str_mv |
ABM, ABC, ABPol |
publisher.none.fl_str_mv |
ABM, ABC, ABPol |
dc.source.none.fl_str_mv |
SciELO reponame:Repositório Institucional da UNESP instname:Universidade Estadual Paulista (UNESP) instacron:UNESP |
instname_str |
Universidade Estadual Paulista (UNESP) |
instacron_str |
UNESP |
institution |
UNESP |
reponame_str |
Repositório Institucional da UNESP |
collection |
Repositório Institucional da UNESP |
repository.name.fl_str_mv |
Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP) |
repository.mail.fl_str_mv |
|
_version_ |
1808129008877961216 |