Experimental and analytical study of xeon phi reliability

Detalhes bibliográficos
Autor(a) principal: Oliveira, Daniel Alfonso Gonçalves de
Data de Publicação: 2017
Outros Autores: Pilla, Laercio Lima, DeBardeleben, Nathan, Blanchard, Sean, Quinn, Heather, Koren, Israel, Navaux, Philippe Olivier Alexandre, Rech, Paolo
Tipo de documento: Artigo de conferência
Idioma: eng
Título da fonte: Repositório Institucional da UFRGS
Texto Completo: http://hdl.handle.net/10183/171994
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spelling Oliveira, Daniel Alfonso Gonçalves dePilla, Laercio LimaDeBardeleben, NathanBlanchard, SeanQuinn, HeatherKoren, IsraelNavaux, Philippe Olivier AlexandreRech, Paolo2018-01-13T02:24:44Z2017http://hdl.handle.net/10183/171994001058179application/pdfengACM International Conference for High Performance Computing, Networking, Storage and Analysis, SUPERCOMPUTING ( 2017 Nov. 12-17 : Denver, Colorado). Proceedings. New York : ACM, c2017Tolerancia : FalhasProcessamento paraleloRadiation experimentsFault injectionParallel architecturesFault toleranceReliabilityExperimental and analytical study of xeon phi reliabilityEstrangeiroinfo:eu-repo/semantics/conferenceObjectinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/openAccessreponame:Repositório Institucional da UFRGSinstname:Universidade Federal do Rio Grande do Sul (UFRGS)instacron:UFRGSORIGINAL001058179.pdf001058179.pdfTexto completo (inglês)application/pdf277421http://www.lume.ufrgs.br/bitstream/10183/171994/1/001058179.pdf720f8cd54582b5e4750212d35a660826MD51TEXT001058179.pdf.txt001058179.pdf.txtExtracted Texttext/plain70561http://www.lume.ufrgs.br/bitstream/10183/171994/2/001058179.pdf.txt989272e7092ec35168e630241b7edd8eMD52THUMBNAIL001058179.pdf.jpg001058179.pdf.jpgGenerated Thumbnailimage/jpeg1850http://www.lume.ufrgs.br/bitstream/10183/171994/3/001058179.pdf.jpg9d04deb7da40a8edaf74ecc65314e219MD5310183/1719942021-05-07 05:16:46.20855oai:www.lume.ufrgs.br:10183/171994Repositório de PublicaçõesPUBhttps://lume.ufrgs.br/oai/requestopendoar:2021-05-07T08:16:46Repositório Institucional da UFRGS - Universidade Federal do Rio Grande do Sul (UFRGS)false
dc.title.pt_BR.fl_str_mv Experimental and analytical study of xeon phi reliability
title Experimental and analytical study of xeon phi reliability
spellingShingle Experimental and analytical study of xeon phi reliability
Oliveira, Daniel Alfonso Gonçalves de
Tolerancia : Falhas
Processamento paralelo
Radiation experiments
Fault injection
Parallel architectures
Fault tolerance
Reliability
title_short Experimental and analytical study of xeon phi reliability
title_full Experimental and analytical study of xeon phi reliability
title_fullStr Experimental and analytical study of xeon phi reliability
title_full_unstemmed Experimental and analytical study of xeon phi reliability
title_sort Experimental and analytical study of xeon phi reliability
author Oliveira, Daniel Alfonso Gonçalves de
author_facet Oliveira, Daniel Alfonso Gonçalves de
Pilla, Laercio Lima
DeBardeleben, Nathan
Blanchard, Sean
Quinn, Heather
Koren, Israel
Navaux, Philippe Olivier Alexandre
Rech, Paolo
author_role author
author2 Pilla, Laercio Lima
DeBardeleben, Nathan
Blanchard, Sean
Quinn, Heather
Koren, Israel
Navaux, Philippe Olivier Alexandre
Rech, Paolo
author2_role author
author
author
author
author
author
author
dc.contributor.author.fl_str_mv Oliveira, Daniel Alfonso Gonçalves de
Pilla, Laercio Lima
DeBardeleben, Nathan
Blanchard, Sean
Quinn, Heather
Koren, Israel
Navaux, Philippe Olivier Alexandre
Rech, Paolo
dc.subject.por.fl_str_mv Tolerancia : Falhas
Processamento paralelo
topic Tolerancia : Falhas
Processamento paralelo
Radiation experiments
Fault injection
Parallel architectures
Fault tolerance
Reliability
dc.subject.eng.fl_str_mv Radiation experiments
Fault injection
Parallel architectures
Fault tolerance
Reliability
publishDate 2017
dc.date.issued.fl_str_mv 2017
dc.date.accessioned.fl_str_mv 2018-01-13T02:24:44Z
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dc.language.iso.fl_str_mv eng
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dc.relation.ispartof.pt_BR.fl_str_mv ACM International Conference for High Performance Computing, Networking, Storage and Analysis, SUPERCOMPUTING ( 2017 Nov. 12-17 : Denver, Colorado). Proceedings. New York : ACM, c2017
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