Experimental and analytical study of xeon phi reliability
Autor(a) principal: | |
---|---|
Data de Publicação: | 2017 |
Outros Autores: | , , , , , , |
Tipo de documento: | Artigo de conferência |
Idioma: | eng |
Título da fonte: | Repositório Institucional da UFRGS |
Texto Completo: | http://hdl.handle.net/10183/171994 |
id |
UFRGS-2_296c4040e524fa045ad216713dc58003 |
---|---|
oai_identifier_str |
oai:www.lume.ufrgs.br:10183/171994 |
network_acronym_str |
UFRGS-2 |
network_name_str |
Repositório Institucional da UFRGS |
repository_id_str |
|
spelling |
Oliveira, Daniel Alfonso Gonçalves dePilla, Laercio LimaDeBardeleben, NathanBlanchard, SeanQuinn, HeatherKoren, IsraelNavaux, Philippe Olivier AlexandreRech, Paolo2018-01-13T02:24:44Z2017http://hdl.handle.net/10183/171994001058179application/pdfengACM International Conference for High Performance Computing, Networking, Storage and Analysis, SUPERCOMPUTING ( 2017 Nov. 12-17 : Denver, Colorado). Proceedings. New York : ACM, c2017Tolerancia : FalhasProcessamento paraleloRadiation experimentsFault injectionParallel architecturesFault toleranceReliabilityExperimental and analytical study of xeon phi reliabilityEstrangeiroinfo:eu-repo/semantics/conferenceObjectinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/openAccessreponame:Repositório Institucional da UFRGSinstname:Universidade Federal do Rio Grande do Sul (UFRGS)instacron:UFRGSORIGINAL001058179.pdf001058179.pdfTexto completo (inglês)application/pdf277421http://www.lume.ufrgs.br/bitstream/10183/171994/1/001058179.pdf720f8cd54582b5e4750212d35a660826MD51TEXT001058179.pdf.txt001058179.pdf.txtExtracted Texttext/plain70561http://www.lume.ufrgs.br/bitstream/10183/171994/2/001058179.pdf.txt989272e7092ec35168e630241b7edd8eMD52THUMBNAIL001058179.pdf.jpg001058179.pdf.jpgGenerated Thumbnailimage/jpeg1850http://www.lume.ufrgs.br/bitstream/10183/171994/3/001058179.pdf.jpg9d04deb7da40a8edaf74ecc65314e219MD5310183/1719942021-05-07 05:16:46.20855oai:www.lume.ufrgs.br:10183/171994Repositório de PublicaçõesPUBhttps://lume.ufrgs.br/oai/requestopendoar:2021-05-07T08:16:46Repositório Institucional da UFRGS - Universidade Federal do Rio Grande do Sul (UFRGS)false |
dc.title.pt_BR.fl_str_mv |
Experimental and analytical study of xeon phi reliability |
title |
Experimental and analytical study of xeon phi reliability |
spellingShingle |
Experimental and analytical study of xeon phi reliability Oliveira, Daniel Alfonso Gonçalves de Tolerancia : Falhas Processamento paralelo Radiation experiments Fault injection Parallel architectures Fault tolerance Reliability |
title_short |
Experimental and analytical study of xeon phi reliability |
title_full |
Experimental and analytical study of xeon phi reliability |
title_fullStr |
Experimental and analytical study of xeon phi reliability |
title_full_unstemmed |
Experimental and analytical study of xeon phi reliability |
title_sort |
Experimental and analytical study of xeon phi reliability |
author |
Oliveira, Daniel Alfonso Gonçalves de |
author_facet |
Oliveira, Daniel Alfonso Gonçalves de Pilla, Laercio Lima DeBardeleben, Nathan Blanchard, Sean Quinn, Heather Koren, Israel Navaux, Philippe Olivier Alexandre Rech, Paolo |
author_role |
author |
author2 |
Pilla, Laercio Lima DeBardeleben, Nathan Blanchard, Sean Quinn, Heather Koren, Israel Navaux, Philippe Olivier Alexandre Rech, Paolo |
author2_role |
author author author author author author author |
dc.contributor.author.fl_str_mv |
Oliveira, Daniel Alfonso Gonçalves de Pilla, Laercio Lima DeBardeleben, Nathan Blanchard, Sean Quinn, Heather Koren, Israel Navaux, Philippe Olivier Alexandre Rech, Paolo |
dc.subject.por.fl_str_mv |
Tolerancia : Falhas Processamento paralelo |
topic |
Tolerancia : Falhas Processamento paralelo Radiation experiments Fault injection Parallel architectures Fault tolerance Reliability |
dc.subject.eng.fl_str_mv |
Radiation experiments Fault injection Parallel architectures Fault tolerance Reliability |
publishDate |
2017 |
dc.date.issued.fl_str_mv |
2017 |
dc.date.accessioned.fl_str_mv |
2018-01-13T02:24:44Z |
dc.type.driver.fl_str_mv |
Estrangeiro info:eu-repo/semantics/conferenceObject |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
format |
conferenceObject |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://hdl.handle.net/10183/171994 |
dc.identifier.nrb.pt_BR.fl_str_mv |
001058179 |
url |
http://hdl.handle.net/10183/171994 |
identifier_str_mv |
001058179 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.ispartof.pt_BR.fl_str_mv |
ACM International Conference for High Performance Computing, Networking, Storage and Analysis, SUPERCOMPUTING ( 2017 Nov. 12-17 : Denver, Colorado). Proceedings. New York : ACM, c2017 |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
application/pdf |
dc.source.none.fl_str_mv |
reponame:Repositório Institucional da UFRGS instname:Universidade Federal do Rio Grande do Sul (UFRGS) instacron:UFRGS |
instname_str |
Universidade Federal do Rio Grande do Sul (UFRGS) |
instacron_str |
UFRGS |
institution |
UFRGS |
reponame_str |
Repositório Institucional da UFRGS |
collection |
Repositório Institucional da UFRGS |
bitstream.url.fl_str_mv |
http://www.lume.ufrgs.br/bitstream/10183/171994/1/001058179.pdf http://www.lume.ufrgs.br/bitstream/10183/171994/2/001058179.pdf.txt http://www.lume.ufrgs.br/bitstream/10183/171994/3/001058179.pdf.jpg |
bitstream.checksum.fl_str_mv |
720f8cd54582b5e4750212d35a660826 989272e7092ec35168e630241b7edd8e 9d04deb7da40a8edaf74ecc65314e219 |
bitstream.checksumAlgorithm.fl_str_mv |
MD5 MD5 MD5 |
repository.name.fl_str_mv |
Repositório Institucional da UFRGS - Universidade Federal do Rio Grande do Sul (UFRGS) |
repository.mail.fl_str_mv |
|
_version_ |
1801224936198504448 |