In situ electrical resistivity of thin-film beta-nial under ar irradiation at 77 k

Detalhes bibliográficos
Autor(a) principal: Costa, Jose Antonio Trindade Borges da
Data de Publicação: 1992
Outros Autores: Vasconcellos, Marcos Antonio Zen, Teixeira, Sergio Ribeiro, Scherer, Claudio, Baibich, Mario Norberto
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Repositório Institucional da UFRGS
Texto Completo: http://hdl.handle.net/10183/103619
Resumo: We report on the dose dependence of the in sítu electrical resistivity of a thin-film NiAl alloy under 120-keV-Ar-ion irradiation at 77 K. The results show two different behaviors. First, the values of resistivity increase, exhibiting a maximum, and then, for higher doses, the electrical resistivity decreases down to saturation. Our results are interpreted in terms of simple composite models that assume local transformation of the solid by successive ion impacts.
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spelling Costa, Jose Antonio Trindade Borges daVasconcellos, Marcos Antonio ZenTeixeira, Sergio RibeiroScherer, ClaudioBaibich, Mario Norberto2014-09-23T02:12:23Z19920163-1829http://hdl.handle.net/10183/103619000055738We report on the dose dependence of the in sítu electrical resistivity of a thin-film NiAl alloy under 120-keV-Ar-ion irradiation at 77 K. The results show two different behaviors. First, the values of resistivity increase, exhibiting a maximum, and then, for higher doses, the electrical resistivity decreases down to saturation. Our results are interpreted in terms of simple composite models that assume local transformation of the solid by successive ion impacts.application/pdfengPhysical review. B, Condensed matter. New York. Vol. 45, no. 17 (May 1992), p. 9626-9628Implantacao ionicaFilmes finosCondutividadeRadiacao ionicaIntermetalicosMistura por bombardeamento ionicoIn situ electrical resistivity of thin-film beta-nial under ar irradiation at 77 kEstrangeiroinfo:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/openAccessreponame:Repositório Institucional da UFRGSinstname:Universidade Federal do Rio Grande do Sul (UFRGS)instacron:UFRGSORIGINAL000055738.pdf000055738.pdfTexto completo (inglês)application/pdf425137http://www.lume.ufrgs.br/bitstream/10183/103619/1/000055738.pdf593c029db4988cfe6da0ae01c42f9e13MD51TEXT000055738.pdf.txt000055738.pdf.txtExtracted Texttext/plain14672http://www.lume.ufrgs.br/bitstream/10183/103619/2/000055738.pdf.txt7f0ce0cd5b03bb4dff702bff6d3e39c2MD52THUMBNAIL000055738.pdf.jpg000055738.pdf.jpgGenerated Thumbnailimage/jpeg2065http://www.lume.ufrgs.br/bitstream/10183/103619/3/000055738.pdf.jpg01b58e875b8d6f4f0dee9f2f2eaf306bMD5310183/1036192023-07-21 03:29:54.847703oai:www.lume.ufrgs.br:10183/103619Repositório de PublicaçõesPUBhttps://lume.ufrgs.br/oai/requestopendoar:2023-07-21T06:29:54Repositório Institucional da UFRGS - Universidade Federal do Rio Grande do Sul (UFRGS)false
dc.title.pt_BR.fl_str_mv In situ electrical resistivity of thin-film beta-nial under ar irradiation at 77 k
title In situ electrical resistivity of thin-film beta-nial under ar irradiation at 77 k
spellingShingle In situ electrical resistivity of thin-film beta-nial under ar irradiation at 77 k
Costa, Jose Antonio Trindade Borges da
Implantacao ionica
Filmes finos
Condutividade
Radiacao ionica
Intermetalicos
Mistura por bombardeamento ionico
title_short In situ electrical resistivity of thin-film beta-nial under ar irradiation at 77 k
title_full In situ electrical resistivity of thin-film beta-nial under ar irradiation at 77 k
title_fullStr In situ electrical resistivity of thin-film beta-nial under ar irradiation at 77 k
title_full_unstemmed In situ electrical resistivity of thin-film beta-nial under ar irradiation at 77 k
title_sort In situ electrical resistivity of thin-film beta-nial under ar irradiation at 77 k
author Costa, Jose Antonio Trindade Borges da
author_facet Costa, Jose Antonio Trindade Borges da
Vasconcellos, Marcos Antonio Zen
Teixeira, Sergio Ribeiro
Scherer, Claudio
Baibich, Mario Norberto
author_role author
author2 Vasconcellos, Marcos Antonio Zen
Teixeira, Sergio Ribeiro
Scherer, Claudio
Baibich, Mario Norberto
author2_role author
author
author
author
dc.contributor.author.fl_str_mv Costa, Jose Antonio Trindade Borges da
Vasconcellos, Marcos Antonio Zen
Teixeira, Sergio Ribeiro
Scherer, Claudio
Baibich, Mario Norberto
dc.subject.por.fl_str_mv Implantacao ionica
Filmes finos
Condutividade
Radiacao ionica
Intermetalicos
Mistura por bombardeamento ionico
topic Implantacao ionica
Filmes finos
Condutividade
Radiacao ionica
Intermetalicos
Mistura por bombardeamento ionico
description We report on the dose dependence of the in sítu electrical resistivity of a thin-film NiAl alloy under 120-keV-Ar-ion irradiation at 77 K. The results show two different behaviors. First, the values of resistivity increase, exhibiting a maximum, and then, for higher doses, the electrical resistivity decreases down to saturation. Our results are interpreted in terms of simple composite models that assume local transformation of the solid by successive ion impacts.
publishDate 1992
dc.date.issued.fl_str_mv 1992
dc.date.accessioned.fl_str_mv 2014-09-23T02:12:23Z
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dc.identifier.uri.fl_str_mv http://hdl.handle.net/10183/103619
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dc.language.iso.fl_str_mv eng
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dc.relation.ispartof.pt_BR.fl_str_mv Physical review. B, Condensed matter. New York. Vol. 45, no. 17 (May 1992), p. 9626-9628
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