In situ electrical resistivity of thin-film beta-nial under ar irradiation at 77 k
Autor(a) principal: | |
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Data de Publicação: | 1992 |
Outros Autores: | , , , |
Tipo de documento: | Artigo |
Idioma: | eng |
Título da fonte: | Repositório Institucional da UFRGS |
Texto Completo: | http://hdl.handle.net/10183/103619 |
Resumo: | We report on the dose dependence of the in sítu electrical resistivity of a thin-film NiAl alloy under 120-keV-Ar-ion irradiation at 77 K. The results show two different behaviors. First, the values of resistivity increase, exhibiting a maximum, and then, for higher doses, the electrical resistivity decreases down to saturation. Our results are interpreted in terms of simple composite models that assume local transformation of the solid by successive ion impacts. |
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Costa, Jose Antonio Trindade Borges daVasconcellos, Marcos Antonio ZenTeixeira, Sergio RibeiroScherer, ClaudioBaibich, Mario Norberto2014-09-23T02:12:23Z19920163-1829http://hdl.handle.net/10183/103619000055738We report on the dose dependence of the in sítu electrical resistivity of a thin-film NiAl alloy under 120-keV-Ar-ion irradiation at 77 K. The results show two different behaviors. First, the values of resistivity increase, exhibiting a maximum, and then, for higher doses, the electrical resistivity decreases down to saturation. Our results are interpreted in terms of simple composite models that assume local transformation of the solid by successive ion impacts.application/pdfengPhysical review. B, Condensed matter. New York. Vol. 45, no. 17 (May 1992), p. 9626-9628Implantacao ionicaFilmes finosCondutividadeRadiacao ionicaIntermetalicosMistura por bombardeamento ionicoIn situ electrical resistivity of thin-film beta-nial under ar irradiation at 77 kEstrangeiroinfo:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/openAccessreponame:Repositório Institucional da UFRGSinstname:Universidade Federal do Rio Grande do Sul (UFRGS)instacron:UFRGSORIGINAL000055738.pdf000055738.pdfTexto completo (inglês)application/pdf425137http://www.lume.ufrgs.br/bitstream/10183/103619/1/000055738.pdf593c029db4988cfe6da0ae01c42f9e13MD51TEXT000055738.pdf.txt000055738.pdf.txtExtracted Texttext/plain14672http://www.lume.ufrgs.br/bitstream/10183/103619/2/000055738.pdf.txt7f0ce0cd5b03bb4dff702bff6d3e39c2MD52THUMBNAIL000055738.pdf.jpg000055738.pdf.jpgGenerated Thumbnailimage/jpeg2065http://www.lume.ufrgs.br/bitstream/10183/103619/3/000055738.pdf.jpg01b58e875b8d6f4f0dee9f2f2eaf306bMD5310183/1036192023-07-21 03:29:54.847703oai:www.lume.ufrgs.br:10183/103619Repositório de PublicaçõesPUBhttps://lume.ufrgs.br/oai/requestopendoar:2023-07-21T06:29:54Repositório Institucional da UFRGS - Universidade Federal do Rio Grande do Sul (UFRGS)false |
dc.title.pt_BR.fl_str_mv |
In situ electrical resistivity of thin-film beta-nial under ar irradiation at 77 k |
title |
In situ electrical resistivity of thin-film beta-nial under ar irradiation at 77 k |
spellingShingle |
In situ electrical resistivity of thin-film beta-nial under ar irradiation at 77 k Costa, Jose Antonio Trindade Borges da Implantacao ionica Filmes finos Condutividade Radiacao ionica Intermetalicos Mistura por bombardeamento ionico |
title_short |
In situ electrical resistivity of thin-film beta-nial under ar irradiation at 77 k |
title_full |
In situ electrical resistivity of thin-film beta-nial under ar irradiation at 77 k |
title_fullStr |
In situ electrical resistivity of thin-film beta-nial under ar irradiation at 77 k |
title_full_unstemmed |
In situ electrical resistivity of thin-film beta-nial under ar irradiation at 77 k |
title_sort |
In situ electrical resistivity of thin-film beta-nial under ar irradiation at 77 k |
author |
Costa, Jose Antonio Trindade Borges da |
author_facet |
Costa, Jose Antonio Trindade Borges da Vasconcellos, Marcos Antonio Zen Teixeira, Sergio Ribeiro Scherer, Claudio Baibich, Mario Norberto |
author_role |
author |
author2 |
Vasconcellos, Marcos Antonio Zen Teixeira, Sergio Ribeiro Scherer, Claudio Baibich, Mario Norberto |
author2_role |
author author author author |
dc.contributor.author.fl_str_mv |
Costa, Jose Antonio Trindade Borges da Vasconcellos, Marcos Antonio Zen Teixeira, Sergio Ribeiro Scherer, Claudio Baibich, Mario Norberto |
dc.subject.por.fl_str_mv |
Implantacao ionica Filmes finos Condutividade Radiacao ionica Intermetalicos Mistura por bombardeamento ionico |
topic |
Implantacao ionica Filmes finos Condutividade Radiacao ionica Intermetalicos Mistura por bombardeamento ionico |
description |
We report on the dose dependence of the in sítu electrical resistivity of a thin-film NiAl alloy under 120-keV-Ar-ion irradiation at 77 K. The results show two different behaviors. First, the values of resistivity increase, exhibiting a maximum, and then, for higher doses, the electrical resistivity decreases down to saturation. Our results are interpreted in terms of simple composite models that assume local transformation of the solid by successive ion impacts. |
publishDate |
1992 |
dc.date.issued.fl_str_mv |
1992 |
dc.date.accessioned.fl_str_mv |
2014-09-23T02:12:23Z |
dc.type.driver.fl_str_mv |
Estrangeiro info:eu-repo/semantics/article |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
format |
article |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://hdl.handle.net/10183/103619 |
dc.identifier.issn.pt_BR.fl_str_mv |
0163-1829 |
dc.identifier.nrb.pt_BR.fl_str_mv |
000055738 |
identifier_str_mv |
0163-1829 000055738 |
url |
http://hdl.handle.net/10183/103619 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.ispartof.pt_BR.fl_str_mv |
Physical review. B, Condensed matter. New York. Vol. 45, no. 17 (May 1992), p. 9626-9628 |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
application/pdf |
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