Dynamic and static calibration of ultra-low-voltage, digital-based operational transconductance amplifiers

Detalhes bibliográficos
Autor(a) principal: Toledo, Pedro Filipe Leite Correia de
Data de Publicação: 2020
Outros Autores: Crovetti, Paolo Stefano, Klimach, Hamilton Duarte, Bampi, Sergio
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Repositório Institucional da UFRGS
Texto Completo: http://hdl.handle.net/10183/212747
Resumo: The calibration of the effects of process variations and device mismatch in Ultra Low Voltage (ULV) Digital-Based Operational Transconductance Amplifiers (DB-OTAs) is addressed in this paper. For this purpose, two dynamic calibration techniques, intended to dynamically vary the effective strength of critical gates by different modulation strategies, i.e., Digital Pulse Width Modulation (DPWM) and Dyadic Digital Pulse Modulation (DDPM), are explored and compared to classic static calibration. The effectiveness of the calibration approaches as a mean to recover acceptable performance in non-functional samples is verified by Monte-Carlo (MC) post-layout simulations performed on a 300 mV power supply, nW-power DB-OTA in 180 nm CMOS. Based on the same MC post-layout simulations, the impact of each calibration strategy on silicon area, power consumption, and OTA performance is discussed.
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spelling Toledo, Pedro Filipe Leite Correia deCrovetti, Paolo StefanoKlimach, Hamilton DuarteBampi, Sergio2020-08-08T03:46:09Z20202079-9292http://hdl.handle.net/10183/212747001115407The calibration of the effects of process variations and device mismatch in Ultra Low Voltage (ULV) Digital-Based Operational Transconductance Amplifiers (DB-OTAs) is addressed in this paper. For this purpose, two dynamic calibration techniques, intended to dynamically vary the effective strength of critical gates by different modulation strategies, i.e., Digital Pulse Width Modulation (DPWM) and Dyadic Digital Pulse Modulation (DDPM), are explored and compared to classic static calibration. The effectiveness of the calibration approaches as a mean to recover acceptable performance in non-functional samples is verified by Monte-Carlo (MC) post-layout simulations performed on a 300 mV power supply, nW-power DB-OTA in 180 nm CMOS. Based on the same MC post-layout simulations, the impact of each calibration strategy on silicon area, power consumption, and OTA performance is discussed.application/pdfengElectronics [recurso eletrônico]. Basel. Vol. 9, no. 6 (June 2020), Art. 983, 15 p.Tensão elétricaAmplificadores operacionaisCalibraçãoUltra-low-voltageOperational transconductance amplifier (OTA)Digital-based OTA (DB-OTA)Fully-digital designDynamic calibrationStatic calibrationDynamic and static calibration of ultra-low-voltage, digital-based operational transconductance amplifiersEstrangeiroinfo:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/openAccessreponame:Repositório Institucional da UFRGSinstname:Universidade Federal do Rio Grande do Sul (UFRGS)instacron:UFRGSTEXT001115407.pdf.txt001115407.pdf.txtExtracted Texttext/plain43937http://www.lume.ufrgs.br/bitstream/10183/212747/2/001115407.pdf.txt898d784075af6d33b9de7bcea84f1b18MD52ORIGINAL001115407.pdfTexto completo (inglês)application/pdf3603030http://www.lume.ufrgs.br/bitstream/10183/212747/1/001115407.pdf7fb7736bfe614757345ba71f400614f3MD5110183/2127472022-06-29 04:44:56.686518oai:www.lume.ufrgs.br:10183/212747Repositório de PublicaçõesPUBhttps://lume.ufrgs.br/oai/requestopendoar:2022-06-29T07:44:56Repositório Institucional da UFRGS - Universidade Federal do Rio Grande do Sul (UFRGS)false
dc.title.pt_BR.fl_str_mv Dynamic and static calibration of ultra-low-voltage, digital-based operational transconductance amplifiers
title Dynamic and static calibration of ultra-low-voltage, digital-based operational transconductance amplifiers
spellingShingle Dynamic and static calibration of ultra-low-voltage, digital-based operational transconductance amplifiers
Toledo, Pedro Filipe Leite Correia de
Tensão elétrica
Amplificadores operacionais
Calibração
Ultra-low-voltage
Operational transconductance amplifier (OTA)
Digital-based OTA (DB-OTA)
Fully-digital design
Dynamic calibration
Static calibration
title_short Dynamic and static calibration of ultra-low-voltage, digital-based operational transconductance amplifiers
title_full Dynamic and static calibration of ultra-low-voltage, digital-based operational transconductance amplifiers
title_fullStr Dynamic and static calibration of ultra-low-voltage, digital-based operational transconductance amplifiers
title_full_unstemmed Dynamic and static calibration of ultra-low-voltage, digital-based operational transconductance amplifiers
title_sort Dynamic and static calibration of ultra-low-voltage, digital-based operational transconductance amplifiers
author Toledo, Pedro Filipe Leite Correia de
author_facet Toledo, Pedro Filipe Leite Correia de
Crovetti, Paolo Stefano
Klimach, Hamilton Duarte
Bampi, Sergio
author_role author
author2 Crovetti, Paolo Stefano
Klimach, Hamilton Duarte
Bampi, Sergio
author2_role author
author
author
dc.contributor.author.fl_str_mv Toledo, Pedro Filipe Leite Correia de
Crovetti, Paolo Stefano
Klimach, Hamilton Duarte
Bampi, Sergio
dc.subject.por.fl_str_mv Tensão elétrica
Amplificadores operacionais
Calibração
topic Tensão elétrica
Amplificadores operacionais
Calibração
Ultra-low-voltage
Operational transconductance amplifier (OTA)
Digital-based OTA (DB-OTA)
Fully-digital design
Dynamic calibration
Static calibration
dc.subject.eng.fl_str_mv Ultra-low-voltage
Operational transconductance amplifier (OTA)
Digital-based OTA (DB-OTA)
Fully-digital design
Dynamic calibration
Static calibration
description The calibration of the effects of process variations and device mismatch in Ultra Low Voltage (ULV) Digital-Based Operational Transconductance Amplifiers (DB-OTAs) is addressed in this paper. For this purpose, two dynamic calibration techniques, intended to dynamically vary the effective strength of critical gates by different modulation strategies, i.e., Digital Pulse Width Modulation (DPWM) and Dyadic Digital Pulse Modulation (DDPM), are explored and compared to classic static calibration. The effectiveness of the calibration approaches as a mean to recover acceptable performance in non-functional samples is verified by Monte-Carlo (MC) post-layout simulations performed on a 300 mV power supply, nW-power DB-OTA in 180 nm CMOS. Based on the same MC post-layout simulations, the impact of each calibration strategy on silicon area, power consumption, and OTA performance is discussed.
publishDate 2020
dc.date.accessioned.fl_str_mv 2020-08-08T03:46:09Z
dc.date.issued.fl_str_mv 2020
dc.type.driver.fl_str_mv Estrangeiro
info:eu-repo/semantics/article
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
format article
status_str publishedVersion
dc.identifier.uri.fl_str_mv http://hdl.handle.net/10183/212747
dc.identifier.issn.pt_BR.fl_str_mv 2079-9292
dc.identifier.nrb.pt_BR.fl_str_mv 001115407
identifier_str_mv 2079-9292
001115407
url http://hdl.handle.net/10183/212747
dc.language.iso.fl_str_mv eng
language eng
dc.relation.ispartof.pt_BR.fl_str_mv Electronics [recurso eletrônico]. Basel. Vol. 9, no. 6 (June 2020), Art. 983, 15 p.
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv application/pdf
dc.source.none.fl_str_mv reponame:Repositório Institucional da UFRGS
instname:Universidade Federal do Rio Grande do Sul (UFRGS)
instacron:UFRGS
instname_str Universidade Federal do Rio Grande do Sul (UFRGS)
instacron_str UFRGS
institution UFRGS
reponame_str Repositório Institucional da UFRGS
collection Repositório Institucional da UFRGS
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