Angular dependence of the electronic energy loss of 800-keV He ions along the Si<100> direction

Detalhes bibliográficos
Autor(a) principal: Santos, Jose Henrique Rodrigues dos
Data de Publicação: 1997
Outros Autores: Grande, Pedro Luis, Behar, Moni, Boudinov, Henri Ivanov, Schiwietz, Gregor
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Repositório Institucional da UFRGS
Texto Completo: http://hdl.handle.net/10183/104224
Resumo: We present measurements of the stopping power of 800-keV 4He ions channeled along the Si(100) axis, as a function of the incidence angle. We compare the experimental results with theoretical calculations by using the impact-parameter-dependent energy loss obtained from the solution of the time-dependent Schro¨dinger equation through the coupled-channel method. This nonperturbative calculation provides reliable energy-loss results which are in good agreement with the experimental results.
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spelling Santos, Jose Henrique Rodrigues dosGrande, Pedro LuisBehar, MoniBoudinov, Henri IvanovSchiwietz, Gregor2014-10-07T02:11:24Z19970163-1829http://hdl.handle.net/10183/104224000192473We present measurements of the stopping power of 800-keV 4He ions channeled along the Si(100) axis, as a function of the incidence angle. We compare the experimental results with theoretical calculations by using the impact-parameter-dependent energy loss obtained from the solution of the time-dependent Schro¨dinger equation through the coupled-channel method. This nonperturbative calculation provides reliable energy-loss results which are in good agreement with the experimental results.application/pdfengPhysical review. B, Condensed matter. New York. Vol. 55, no. 7 (Feb. 1997), p. 4332-4342Física da matéria condensadaHélioRetroespalhamento rutherfordAngular dependence of the electronic energy loss of 800-keV He ions along the Si<100> directionEstrangeiroinfo:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/openAccessreponame:Repositório Institucional da UFRGSinstname:Universidade Federal do Rio Grande do Sul (UFRGS)instacron:UFRGSORIGINAL000192473.pdf000192473.pdfTexto completo (inglês)application/pdf267420http://www.lume.ufrgs.br/bitstream/10183/104224/1/000192473.pdfd790d93621a4ad8d1afb81794418cc08MD51TEXT000192473.pdf.txt000192473.pdf.txtExtracted Texttext/plain47629http://www.lume.ufrgs.br/bitstream/10183/104224/2/000192473.pdf.txtb4eab6a8e096080f7120550374751c63MD52THUMBNAIL000192473.pdf.jpg000192473.pdf.jpgGenerated Thumbnailimage/jpeg2128http://www.lume.ufrgs.br/bitstream/10183/104224/3/000192473.pdf.jpg87600f05b2e9bf291c3711016e6081d3MD5310183/1042242023-09-24 03:36:54.961881oai:www.lume.ufrgs.br:10183/104224Repositório de PublicaçõesPUBhttps://lume.ufrgs.br/oai/requestopendoar:2023-09-24T06:36:54Repositório Institucional da UFRGS - Universidade Federal do Rio Grande do Sul (UFRGS)false
dc.title.pt_BR.fl_str_mv Angular dependence of the electronic energy loss of 800-keV He ions along the Si<100> direction
title Angular dependence of the electronic energy loss of 800-keV He ions along the Si<100> direction
spellingShingle Angular dependence of the electronic energy loss of 800-keV He ions along the Si<100> direction
Santos, Jose Henrique Rodrigues dos
Física da matéria condensada
Hélio
Retroespalhamento rutherford
title_short Angular dependence of the electronic energy loss of 800-keV He ions along the Si<100> direction
title_full Angular dependence of the electronic energy loss of 800-keV He ions along the Si<100> direction
title_fullStr Angular dependence of the electronic energy loss of 800-keV He ions along the Si<100> direction
title_full_unstemmed Angular dependence of the electronic energy loss of 800-keV He ions along the Si<100> direction
title_sort Angular dependence of the electronic energy loss of 800-keV He ions along the Si<100> direction
author Santos, Jose Henrique Rodrigues dos
author_facet Santos, Jose Henrique Rodrigues dos
Grande, Pedro Luis
Behar, Moni
Boudinov, Henri Ivanov
Schiwietz, Gregor
author_role author
author2 Grande, Pedro Luis
Behar, Moni
Boudinov, Henri Ivanov
Schiwietz, Gregor
author2_role author
author
author
author
dc.contributor.author.fl_str_mv Santos, Jose Henrique Rodrigues dos
Grande, Pedro Luis
Behar, Moni
Boudinov, Henri Ivanov
Schiwietz, Gregor
dc.subject.por.fl_str_mv Física da matéria condensada
Hélio
Retroespalhamento rutherford
topic Física da matéria condensada
Hélio
Retroespalhamento rutherford
description We present measurements of the stopping power of 800-keV 4He ions channeled along the Si(100) axis, as a function of the incidence angle. We compare the experimental results with theoretical calculations by using the impact-parameter-dependent energy loss obtained from the solution of the time-dependent Schro¨dinger equation through the coupled-channel method. This nonperturbative calculation provides reliable energy-loss results which are in good agreement with the experimental results.
publishDate 1997
dc.date.issued.fl_str_mv 1997
dc.date.accessioned.fl_str_mv 2014-10-07T02:11:24Z
dc.type.driver.fl_str_mv Estrangeiro
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dc.identifier.uri.fl_str_mv http://hdl.handle.net/10183/104224
dc.identifier.issn.pt_BR.fl_str_mv 0163-1829
dc.identifier.nrb.pt_BR.fl_str_mv 000192473
identifier_str_mv 0163-1829
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url http://hdl.handle.net/10183/104224
dc.language.iso.fl_str_mv eng
language eng
dc.relation.ispartof.pt_BR.fl_str_mv Physical review. B, Condensed matter. New York. Vol. 55, no. 7 (Feb. 1997), p. 4332-4342
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