Growth kinetics of solid-state-reacted fe-zr multilayer films

Detalhes bibliográficos
Autor(a) principal: Paesano Junior, Andrea
Data de Publicação: 1991
Outros Autores: Teixeira, Sergio Ribeiro, Amaral, Livio
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Repositório Institucional da UFRGS
Texto Completo: http://hdl.handle.net/10183/95349
Resumo: Multilayers of Fee0.33Zr0.67, prepared by electron beam evaporation, have been characterized by conversion electron Mijssbauer spectroscopy, Rutherford backscattering spectroscopy, and x-ray diffraction. Two phases, one amorphous and another crystalline (FeZr3), occur by solid-state reaction. For temperatures of 350 and 500 °C and annealing times ranging from 10 min to 72 h the growth rates of both phases had been obtained. From these results we suggest a model to describe the phase growth kinetics of the amorphouscrystalline Fe0.33Zr0.67 multilayer thin film.
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spelling Paesano Junior, AndreaTeixeira, Sergio RibeiroAmaral, Livio2014-05-17T02:06:49Z19910021-8979http://hdl.handle.net/10183/95349000055570Multilayers of Fee0.33Zr0.67, prepared by electron beam evaporation, have been characterized by conversion electron Mijssbauer spectroscopy, Rutherford backscattering spectroscopy, and x-ray diffraction. Two phases, one amorphous and another crystalline (FeZr3), occur by solid-state reaction. For temperatures of 350 and 500 °C and annealing times ranging from 10 min to 72 h the growth rates of both phases had been obtained. From these results we suggest a model to describe the phase growth kinetics of the amorphouscrystalline Fe0.33Zr0.67 multilayer thin film.application/pdfengJournal of Applied Physics. Woodbury. Vol. 70, n. 9 (Nov. 1991), p. 4870-4876Implantação de íonsEfeito mossbauerRetroespalhamento rutherfordRaios XFilmes finosGrowth kinetics of solid-state-reacted fe-zr multilayer filmsEstrangeiroinfo:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/openAccessreponame:Repositório Institucional da UFRGSinstname:Universidade Federal do Rio Grande do Sul (UFRGS)instacron:UFRGSORIGINAL000055570.pdf000055570.pdfTexto completo (inglês)application/pdf933061http://www.lume.ufrgs.br/bitstream/10183/95349/1/000055570.pdf272ba005ad5bee62e4335d1c5b4bccafMD51TEXT000055570.pdf.txt000055570.pdf.txtExtracted Texttext/plain29544http://www.lume.ufrgs.br/bitstream/10183/95349/2/000055570.pdf.txt50b822dcf87a22c3227d2fd10855b5eaMD52THUMBNAIL000055570.pdf.jpg000055570.pdf.jpgGenerated Thumbnailimage/jpeg1567http://www.lume.ufrgs.br/bitstream/10183/95349/3/000055570.pdf.jpg7f74efcf3eb5b25d97d488f359e6dc68MD5310183/953492022-02-22 05:10:07.64133oai:www.lume.ufrgs.br:10183/95349Repositório de PublicaçõesPUBhttps://lume.ufrgs.br/oai/requestopendoar:2022-02-22T08:10:07Repositório Institucional da UFRGS - Universidade Federal do Rio Grande do Sul (UFRGS)false
dc.title.pt_BR.fl_str_mv Growth kinetics of solid-state-reacted fe-zr multilayer films
title Growth kinetics of solid-state-reacted fe-zr multilayer films
spellingShingle Growth kinetics of solid-state-reacted fe-zr multilayer films
Paesano Junior, Andrea
Implantação de íons
Efeito mossbauer
Retroespalhamento rutherford
Raios X
Filmes finos
title_short Growth kinetics of solid-state-reacted fe-zr multilayer films
title_full Growth kinetics of solid-state-reacted fe-zr multilayer films
title_fullStr Growth kinetics of solid-state-reacted fe-zr multilayer films
title_full_unstemmed Growth kinetics of solid-state-reacted fe-zr multilayer films
title_sort Growth kinetics of solid-state-reacted fe-zr multilayer films
author Paesano Junior, Andrea
author_facet Paesano Junior, Andrea
Teixeira, Sergio Ribeiro
Amaral, Livio
author_role author
author2 Teixeira, Sergio Ribeiro
Amaral, Livio
author2_role author
author
dc.contributor.author.fl_str_mv Paesano Junior, Andrea
Teixeira, Sergio Ribeiro
Amaral, Livio
dc.subject.por.fl_str_mv Implantação de íons
Efeito mossbauer
Retroespalhamento rutherford
Raios X
Filmes finos
topic Implantação de íons
Efeito mossbauer
Retroespalhamento rutherford
Raios X
Filmes finos
description Multilayers of Fee0.33Zr0.67, prepared by electron beam evaporation, have been characterized by conversion electron Mijssbauer spectroscopy, Rutherford backscattering spectroscopy, and x-ray diffraction. Two phases, one amorphous and another crystalline (FeZr3), occur by solid-state reaction. For temperatures of 350 and 500 °C and annealing times ranging from 10 min to 72 h the growth rates of both phases had been obtained. From these results we suggest a model to describe the phase growth kinetics of the amorphouscrystalline Fe0.33Zr0.67 multilayer thin film.
publishDate 1991
dc.date.issued.fl_str_mv 1991
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dc.relation.ispartof.pt_BR.fl_str_mv Journal of Applied Physics. Woodbury. Vol. 70, n. 9 (Nov. 1991), p. 4870-4876
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