A new adaptive analog test and diagnosis system
Autor(a) principal: | |
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Data de Publicação: | 2000 |
Outros Autores: | , , |
Tipo de documento: | Artigo |
Idioma: | eng |
Título da fonte: | Repositório Institucional da UFRGS |
Texto Completo: | http://hdl.handle.net/10183/27564 |
Resumo: | This paper presents a low-cost analog test system with diagnosis capabilities. The tester is able to detect faults in any linear circuit by learning a reference circuit behavior in a first step, and comparing this behavior against the output of the circuit under test in a second step. For a faulty circuit, a third step takes place to locate the fault. The diagnosis method consists on injecting probable faults in a mathematical model of the circuit, and later comparing its output with the output of the real faulty circuit. This system has been successfully applied to a case study, a biquad filter. Soft, large, and hard deviations on components, as well as faults in operational amplifiers, were considered. Experimental results have proven the feasibility and efficiency of the proposed test and diagnosis system. |
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Cota, Erika FernandesNegreiros, MarceloCarro, LuigiLubaszewski, Marcelo Soares2011-01-28T05:59:03Z20000018-9456http://hdl.handle.net/10183/27564000290325This paper presents a low-cost analog test system with diagnosis capabilities. The tester is able to detect faults in any linear circuit by learning a reference circuit behavior in a first step, and comparing this behavior against the output of the circuit under test in a second step. For a faulty circuit, a third step takes place to locate the fault. The diagnosis method consists on injecting probable faults in a mathematical model of the circuit, and later comparing its output with the output of the real faulty circuit. This system has been successfully applied to a case study, a biquad filter. Soft, large, and hard deviations on components, as well as faults in operational amplifiers, were considered. Experimental results have proven the feasibility and efficiency of the proposed test and diagnosis system.application/pdfengIEEE transactions on instrumentation and measurement. New York, N. Y. Vol. 49, no. 2, (apr. 2000), p.223-227Circuitos analógicosEnsaios (Engenharia)Adaptive filtersAdaptive systemsAnalog system fault diagnosisCircuit testingTestingA new adaptive analog test and diagnosis systemEstrangeiroinfo:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/openAccessreponame:Repositório Institucional da UFRGSinstname:Universidade Federal do Rio Grande do Sul (UFRGS)instacron:UFRGSORIGINAL000290325.pdf000290325.pdfTexto completo (inglês)application/pdf205226http://www.lume.ufrgs.br/bitstream/10183/27564/1/000290325.pdfda2f533f4a15a15ef1e1f7a80cfd9e62MD51TEXT000290325.pdf.txt000290325.pdf.txtExtracted Texttext/plain20079http://www.lume.ufrgs.br/bitstream/10183/27564/2/000290325.pdf.txt788248154c4548953bc787fa4493588eMD52THUMBNAIL000290325.pdf.jpg000290325.pdf.jpgGenerated Thumbnailimage/jpeg2140http://www.lume.ufrgs.br/bitstream/10183/27564/3/000290325.pdf.jpg72176e978efb47b1ac8cdb8819d72838MD5310183/275642021-06-26 04:37:57.891283oai:www.lume.ufrgs.br:10183/27564Repositório InstitucionalPUBhttps://lume.ufrgs.br/oai/requestlume@ufrgs.bropendoar:2021-06-26T07:37:57Repositório Institucional da UFRGS - Universidade Federal do Rio Grande do Sul (UFRGS)false |
dc.title.pt_BR.fl_str_mv |
A new adaptive analog test and diagnosis system |
title |
A new adaptive analog test and diagnosis system |
spellingShingle |
A new adaptive analog test and diagnosis system Cota, Erika Fernandes Circuitos analógicos Ensaios (Engenharia) Adaptive filters Adaptive systems Analog system fault diagnosis Circuit testing Testing |
title_short |
A new adaptive analog test and diagnosis system |
title_full |
A new adaptive analog test and diagnosis system |
title_fullStr |
A new adaptive analog test and diagnosis system |
title_full_unstemmed |
A new adaptive analog test and diagnosis system |
title_sort |
A new adaptive analog test and diagnosis system |
author |
Cota, Erika Fernandes |
author_facet |
Cota, Erika Fernandes Negreiros, Marcelo Carro, Luigi Lubaszewski, Marcelo Soares |
author_role |
author |
author2 |
Negreiros, Marcelo Carro, Luigi Lubaszewski, Marcelo Soares |
author2_role |
author author author |
dc.contributor.author.fl_str_mv |
Cota, Erika Fernandes Negreiros, Marcelo Carro, Luigi Lubaszewski, Marcelo Soares |
dc.subject.por.fl_str_mv |
Circuitos analógicos Ensaios (Engenharia) |
topic |
Circuitos analógicos Ensaios (Engenharia) Adaptive filters Adaptive systems Analog system fault diagnosis Circuit testing Testing |
dc.subject.eng.fl_str_mv |
Adaptive filters Adaptive systems Analog system fault diagnosis Circuit testing Testing |
description |
This paper presents a low-cost analog test system with diagnosis capabilities. The tester is able to detect faults in any linear circuit by learning a reference circuit behavior in a first step, and comparing this behavior against the output of the circuit under test in a second step. For a faulty circuit, a third step takes place to locate the fault. The diagnosis method consists on injecting probable faults in a mathematical model of the circuit, and later comparing its output with the output of the real faulty circuit. This system has been successfully applied to a case study, a biquad filter. Soft, large, and hard deviations on components, as well as faults in operational amplifiers, were considered. Experimental results have proven the feasibility and efficiency of the proposed test and diagnosis system. |
publishDate |
2000 |
dc.date.issued.fl_str_mv |
2000 |
dc.date.accessioned.fl_str_mv |
2011-01-28T05:59:03Z |
dc.type.driver.fl_str_mv |
Estrangeiro info:eu-repo/semantics/article |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
format |
article |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://hdl.handle.net/10183/27564 |
dc.identifier.issn.pt_BR.fl_str_mv |
0018-9456 |
dc.identifier.nrb.pt_BR.fl_str_mv |
000290325 |
identifier_str_mv |
0018-9456 000290325 |
url |
http://hdl.handle.net/10183/27564 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.ispartof.pt_BR.fl_str_mv |
IEEE transactions on instrumentation and measurement. New York, N. Y. Vol. 49, no. 2, (apr. 2000), p.223-227 |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
application/pdf |
dc.source.none.fl_str_mv |
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UFRGS |
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Repositório Institucional da UFRGS |
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Repositório Institucional da UFRGS |
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