Neutralization and wake effects on the Coulomb explosion of swift H2+ ions traversing thin films

• Autor(a) principal: Rosa, Lucio Flavio dos Santos
• Data de Publicação: 2015
• Outros Autores: Grande, Pedro Luis, Dias, Johnny Ferraz, Fadanelli Filho, Raul Carlos, Vos, Maarten
• Tipo de documento: Artigo
• Idioma: eng
• Título da fonte: Repositório Institucional da UFRGS
• Texto Completo: http://hdl.handle.net/10183/118051
• topic: Estado amorfo; Método de Monte Carlo; Potencial de ionização; Íons positivos; Filmes finos; Microscopia eletrônica de transmissão; Retroespalhamento rutherford; Compostos de titânio

The Coulomb explosion of small cluster beams can be used to measure the dwell time of fragments traversing amorphous films. Therefore, the thickness of thin films can be obtainedwith the so-called Coulomb depth profiling technique using relatively high cluster energies where the fragments are fully ionized after breakup. Here we demonstrate the applicability of Coulomb depth profiling technique at lower cluster energies where neutralization and wake effects come into play. To that end, we investigated 50–200 keV/u H2 + molecular ions impinging on a 10 nm TiO2 film and measured the energy of the backscattered H+ fragments with high-energy resolution. The effect of the neutralization of the H+ fragments along the incoming trajectory before the backscattering collision is clearly observed at lower energies through the decrease of the energy broadening due to the Coulomb explosion. The reduced values of the Coulomb explosion combined with full Monte Carlo simulations provide compatible results with those obtained at higher cluster energies where neutralization is less important. The results are corroborated by electron microscopy measurements.