Single event transients in logic circuits - load and propagation induced pulse broadening
Autor(a) principal: | |
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Data de Publicação: | 2008 |
Outros Autores: | , |
Tipo de documento: | Artigo |
Idioma: | eng |
Título da fonte: | Repositório Institucional da UFRGS |
Texto Completo: | http://hdl.handle.net/10183/27617 |
Resumo: | The generation and propagation of single event transients (SET) in logic gate chains is studied and modeled. Regarding SET generation, we investigate the dependence of the generated SET pulse width on the struck node capacitance. Rising node capacitance may lead to amplified pulse width, indicating that increasing load capacitance alone is not an option for radiation hardening. SET propagation in logic chains is also studied, and it is shown that significant broadening or attenuation of the propagated transient pulse width may be observed. It is shown that the chain design (propagation delay of high to low and low to high transitions) has a major impact on broadening or attenuation of the propagated transient pulse. For the first time a suitable model for SET broadening is provided. |
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Wirth, Gilson InacioKastensmidt, Fernanda Gusmão de LimaRibeiro, Ivandro da Silva2011-01-29T06:00:42Z20080018-9499http://hdl.handle.net/10183/27617000684895The generation and propagation of single event transients (SET) in logic gate chains is studied and modeled. Regarding SET generation, we investigate the dependence of the generated SET pulse width on the struck node capacitance. Rising node capacitance may lead to amplified pulse width, indicating that increasing load capacitance alone is not an option for radiation hardening. SET propagation in logic chains is also studied, and it is shown that significant broadening or attenuation of the propagated transient pulse width may be observed. It is shown that the chain design (propagation delay of high to low and low to high transitions) has a major impact on broadening or attenuation of the propagated transient pulse. For the first time a suitable model for SET broadening is provided.application/pdfengIEEE transactions on nuclear science. New York. vol. 55, no. 6, part 1 (Dec. 2008), p. 2928-2935MicroeletrônicaDigital single event transientsLoad-induced pulse broadening effectPropagation-induced pulse broadening effectSET generationSET propagationSingle event transients in logic circuits - load and propagation induced pulse broadeningEstrangeiroinfo:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/openAccessreponame:Repositório Institucional da UFRGSinstname:Universidade Federal do Rio Grande do Sul (UFRGS)instacron:UFRGSTEXT000684895.pdf.txt000684895.pdf.txtExtracted Texttext/plain37558http://www.lume.ufrgs.br/bitstream/10183/27617/2/000684895.pdf.txt4a9c39a843f81218975e7154f9462aebMD52ORIGINAL000684895.pdf000684895.pdfTexto completo (inglês)application/pdf297524http://www.lume.ufrgs.br/bitstream/10183/27617/1/000684895.pdf05d3c15e38f178101f756598d2e2d25cMD51THUMBNAIL000684895.pdf.jpg000684895.pdf.jpgGenerated Thumbnailimage/jpeg2333http://www.lume.ufrgs.br/bitstream/10183/27617/3/000684895.pdf.jpg43e7adf6397b6d868094702928eebb3eMD5310183/276172021-06-12 04:52:42.521628oai:www.lume.ufrgs.br:10183/27617Repositório de PublicaçõesPUBhttps://lume.ufrgs.br/oai/requestopendoar:2021-06-12T07:52:42Repositório Institucional da UFRGS - Universidade Federal do Rio Grande do Sul (UFRGS)false |
dc.title.pt_BR.fl_str_mv |
Single event transients in logic circuits - load and propagation induced pulse broadening |
title |
Single event transients in logic circuits - load and propagation induced pulse broadening |
spellingShingle |
Single event transients in logic circuits - load and propagation induced pulse broadening Wirth, Gilson Inacio Microeletrônica Digital single event transients Load-induced pulse broadening effect Propagation-induced pulse broadening effect SET generation SET propagation |
title_short |
Single event transients in logic circuits - load and propagation induced pulse broadening |
title_full |
Single event transients in logic circuits - load and propagation induced pulse broadening |
title_fullStr |
Single event transients in logic circuits - load and propagation induced pulse broadening |
title_full_unstemmed |
Single event transients in logic circuits - load and propagation induced pulse broadening |
title_sort |
Single event transients in logic circuits - load and propagation induced pulse broadening |
author |
Wirth, Gilson Inacio |
author_facet |
Wirth, Gilson Inacio Kastensmidt, Fernanda Gusmão de Lima Ribeiro, Ivandro da Silva |
author_role |
author |
author2 |
Kastensmidt, Fernanda Gusmão de Lima Ribeiro, Ivandro da Silva |
author2_role |
author author |
dc.contributor.author.fl_str_mv |
Wirth, Gilson Inacio Kastensmidt, Fernanda Gusmão de Lima Ribeiro, Ivandro da Silva |
dc.subject.por.fl_str_mv |
Microeletrônica |
topic |
Microeletrônica Digital single event transients Load-induced pulse broadening effect Propagation-induced pulse broadening effect SET generation SET propagation |
dc.subject.eng.fl_str_mv |
Digital single event transients Load-induced pulse broadening effect Propagation-induced pulse broadening effect SET generation SET propagation |
description |
The generation and propagation of single event transients (SET) in logic gate chains is studied and modeled. Regarding SET generation, we investigate the dependence of the generated SET pulse width on the struck node capacitance. Rising node capacitance may lead to amplified pulse width, indicating that increasing load capacitance alone is not an option for radiation hardening. SET propagation in logic chains is also studied, and it is shown that significant broadening or attenuation of the propagated transient pulse width may be observed. It is shown that the chain design (propagation delay of high to low and low to high transitions) has a major impact on broadening or attenuation of the propagated transient pulse. For the first time a suitable model for SET broadening is provided. |
publishDate |
2008 |
dc.date.issued.fl_str_mv |
2008 |
dc.date.accessioned.fl_str_mv |
2011-01-29T06:00:42Z |
dc.type.driver.fl_str_mv |
Estrangeiro info:eu-repo/semantics/article |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
format |
article |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://hdl.handle.net/10183/27617 |
dc.identifier.issn.pt_BR.fl_str_mv |
0018-9499 |
dc.identifier.nrb.pt_BR.fl_str_mv |
000684895 |
identifier_str_mv |
0018-9499 000684895 |
url |
http://hdl.handle.net/10183/27617 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.ispartof.pt_BR.fl_str_mv |
IEEE transactions on nuclear science. New York. vol. 55, no. 6, part 1 (Dec. 2008), p. 2928-2935 |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
application/pdf |
dc.source.none.fl_str_mv |
reponame:Repositório Institucional da UFRGS instname:Universidade Federal do Rio Grande do Sul (UFRGS) instacron:UFRGS |
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UFRGS |
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UFRGS |
reponame_str |
Repositório Institucional da UFRGS |
collection |
Repositório Institucional da UFRGS |
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