A tool for test automation with support for remote tests

Detalhes bibliográficos
Autor(a) principal: Magalhães, G. R.
Data de Publicação: 1999
Outros Autores: Oliveira, Carlo Emmanoel Tolla de, Anido, Manuel Lois
Tipo de documento: Relatório
Idioma: eng
Título da fonte: Repositório Institucional da UFRJ
Texto Completo: http://hdl.handle.net/11422/2656
Resumo: This paper presents an interactive MS-Windows ®-based tool for high-level specification and analysis of tests on printed circuit boards, using the IEEE 1149.1 standard, and also on integrated circuits using scan design like the LSSD testing methodology. As novel contributions we provide an object-oriented tool for Boundary Scan and LSSD test automation with support for remote tests, including interfaces to circuit description, chip interconnection, test vector analysis and test vector generation. The system is a reasona'.Jly complete CAE test system that includes features like remote testing (using client- server technology), project management computer-aided learning support, menu-based command entry, user-defined configuration and a comprehensive set of commands. Thus, by using this system, a test engineer or a circuit designer are able to specify and verify tests for printed circuit boards or for integrated circuits, either ocally or remotely.
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spelling Magalhães, G. R.Oliveira, Carlo Emmanoel Tolla deAnido, Manuel Lois2017-08-15T14:03:43Z2023-11-30T03:00:27Z1999-12-31MAGALHÃES, G. R.; OLIVEIRA, C. E. T.; ANIDO, M. L. A tool for test automation with support for remote tests. Rio de Janeiro: NCE, UFRJ, 1999. 08 p. (Relatório Técnico, 19/99)http://hdl.handle.net/11422/2656This paper presents an interactive MS-Windows ®-based tool for high-level specification and analysis of tests on printed circuit boards, using the IEEE 1149.1 standard, and also on integrated circuits using scan design like the LSSD testing methodology. As novel contributions we provide an object-oriented tool for Boundary Scan and LSSD test automation with support for remote tests, including interfaces to circuit description, chip interconnection, test vector analysis and test vector generation. The system is a reasona'.Jly complete CAE test system that includes features like remote testing (using client- server technology), project management computer-aided learning support, menu-based command entry, user-defined configuration and a comprehensive set of commands. Thus, by using this system, a test engineer or a circuit designer are able to specify and verify tests for printed circuit boards or for integrated circuits, either ocally or remotely.Submitted by Elaine Almeida (elaine.almeida@nce.ufrj.br) on 2017-08-15T14:03:43Z No. of bitstreams: 1 19_99_000611306.pdf: 1515383 bytes, checksum: dc54e9ee3319c05cdab4a77565e1c627 (MD5)Made available in DSpace on 2017-08-15T14:03:43Z (GMT). No. of bitstreams: 1 19_99_000611306.pdf: 1515383 bytes, checksum: dc54e9ee3319c05cdab4a77565e1c627 (MD5) Previous issue date: 1999-12-31engRelatório Técnico NCECNPQ::CIENCIAS EXATAS E DA TERRA::CIENCIA DA COMPUTACAOCircuitos eletrônicos (testes)A tool for test automation with support for remote testsinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/report1999abertoBrasilInstituto Tércio Pacitti de Aplicações e Pesquisas Computacionaisinfo:eu-repo/semantics/openAccessreponame:Repositório Institucional da UFRJinstname:Universidade Federal do Rio de Janeiro (UFRJ)instacron:UFRJORIGINAL19_99_000611306.pdf19_99_000611306.pdfapplication/pdf951140http://pantheon.ufrj.br:80/bitstream/11422/2656/3/19_99_000611306.pdf2a865b4b3a50d41aa480deb300fc565aMD53LICENSElicense.txtlicense.txttext/plain; charset=utf-81853http://pantheon.ufrj.br:80/bitstream/11422/2656/2/license.txtdd32849f2bfb22da963c3aac6e26e255MD52TEXT19_99_000611306.pdf.txt19_99_000611306.pdf.txtExtracted texttext/plain24021http://pantheon.ufrj.br:80/bitstream/11422/2656/4/19_99_000611306.pdf.txt0c42c110e8e3714c584d6ffc770f872eMD5411422/26562023-11-30 00:00:27.049oai:pantheon.ufrj.br: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Repositório de PublicaçõesPUBhttp://www.pantheon.ufrj.br/oai/requestopendoar:2023-11-30T03:00:27Repositório Institucional da UFRJ - Universidade Federal do Rio de Janeiro (UFRJ)false
dc.title.en.fl_str_mv A tool for test automation with support for remote tests
title A tool for test automation with support for remote tests
spellingShingle A tool for test automation with support for remote tests
Magalhães, G. R.
CNPQ::CIENCIAS EXATAS E DA TERRA::CIENCIA DA COMPUTACAO
Circuitos eletrônicos (testes)
title_short A tool for test automation with support for remote tests
title_full A tool for test automation with support for remote tests
title_fullStr A tool for test automation with support for remote tests
title_full_unstemmed A tool for test automation with support for remote tests
title_sort A tool for test automation with support for remote tests
author Magalhães, G. R.
author_facet Magalhães, G. R.
Oliveira, Carlo Emmanoel Tolla de
Anido, Manuel Lois
author_role author
author2 Oliveira, Carlo Emmanoel Tolla de
Anido, Manuel Lois
author2_role author
author
dc.contributor.author.fl_str_mv Magalhães, G. R.
Oliveira, Carlo Emmanoel Tolla de
Anido, Manuel Lois
dc.subject.cnpq.fl_str_mv CNPQ::CIENCIAS EXATAS E DA TERRA::CIENCIA DA COMPUTACAO
topic CNPQ::CIENCIAS EXATAS E DA TERRA::CIENCIA DA COMPUTACAO
Circuitos eletrônicos (testes)
dc.subject.por.fl_str_mv Circuitos eletrônicos (testes)
description This paper presents an interactive MS-Windows ®-based tool for high-level specification and analysis of tests on printed circuit boards, using the IEEE 1149.1 standard, and also on integrated circuits using scan design like the LSSD testing methodology. As novel contributions we provide an object-oriented tool for Boundary Scan and LSSD test automation with support for remote tests, including interfaces to circuit description, chip interconnection, test vector analysis and test vector generation. The system is a reasona'.Jly complete CAE test system that includes features like remote testing (using client- server technology), project management computer-aided learning support, menu-based command entry, user-defined configuration and a comprehensive set of commands. Thus, by using this system, a test engineer or a circuit designer are able to specify and verify tests for printed circuit boards or for integrated circuits, either ocally or remotely.
publishDate 1999
dc.date.issued.fl_str_mv 1999-12-31
dc.date.accessioned.fl_str_mv 2017-08-15T14:03:43Z
dc.date.available.fl_str_mv 2023-11-30T03:00:27Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/report
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status_str publishedVersion
dc.identifier.citation.fl_str_mv MAGALHÃES, G. R.; OLIVEIRA, C. E. T.; ANIDO, M. L. A tool for test automation with support for remote tests. Rio de Janeiro: NCE, UFRJ, 1999. 08 p. (Relatório Técnico, 19/99)
dc.identifier.uri.fl_str_mv http://hdl.handle.net/11422/2656
identifier_str_mv MAGALHÃES, G. R.; OLIVEIRA, C. E. T.; ANIDO, M. L. A tool for test automation with support for remote tests. Rio de Janeiro: NCE, UFRJ, 1999. 08 p. (Relatório Técnico, 19/99)
url http://hdl.handle.net/11422/2656
dc.language.iso.fl_str_mv eng
language eng
dc.relation.ispartof.pt_BR.fl_str_mv Relatório Técnico NCE
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.publisher.country.fl_str_mv Brasil
dc.publisher.department.fl_str_mv Instituto Tércio Pacitti de Aplicações e Pesquisas Computacionais
dc.source.none.fl_str_mv reponame:Repositório Institucional da UFRJ
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reponame_str Repositório Institucional da UFRJ
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