Admissão e demissão: uma análise multivariada de curto e longo prazo sob a ótica do setor eletroeletrônico brasileiro

Detalhes bibliográficos
Autor(a) principal: Ueda, Renan Mitsuo
Data de Publicação: 2019
Tipo de documento: Dissertação
Idioma: por
Título da fonte: Biblioteca Digital de Teses e Dissertações do UFSM
Texto Completo: http://repositorio.ufsm.br/handle/1/20257
Resumo: The objective of this research was to verify if the Cluster analysis would be able to classify and select the macroeconomic variables related to the Brazilian electroelectronic sector in exogeneity terms, as well as to adjust a Vector Autoregressive Model (VAR) and a Vector Error Correction (VEC) which point out the short- and longterm relationship between the variables. The time series that were part of this study were: admission and dismissal in the Brazilian electronics industry, Gross Domestic Product, total Brazilian import and export, monthly average dollar quotation, national broad consumer index and settlement and custody system. The sample period comprised May of 2003 to February of 2017 for the first article, and May of 2003 to September of 2018 in the case of the second article. The variables of the sector were collected in the online platform of the Brazilian Association of the Electrical and Electroelectronic Industry (Abinee), and the others, Ministry of Labor and Employment, General Register, Central Bank of Brazil, Rotary Brazil; Ministry of Finance, and the Brazilian Institute of Geography and Statistics. At the end of the study Cluster analysis proved to be efficient in the classification and selection of variables considering exogeneity, being corroborated by the Granger / Block Exogeneity Causality Test. It was evident that there is a significant relationship between them, indicating that abrupt changes in the macroeconomic variables will result in fluctuations in the number of employees of the Brazilian electrical and electronic industry by at least two months.
id UFSM_0ee158e5210f959712f3c4defd13f29e
oai_identifier_str oai:repositorio.ufsm.br:1/20257
network_acronym_str UFSM
network_name_str Biblioteca Digital de Teses e Dissertações do UFSM
repository_id_str
spelling 2021-01-18T11:43:43Z2021-01-18T11:43:43Z2019-02-20http://repositorio.ufsm.br/handle/1/20257The objective of this research was to verify if the Cluster analysis would be able to classify and select the macroeconomic variables related to the Brazilian electroelectronic sector in exogeneity terms, as well as to adjust a Vector Autoregressive Model (VAR) and a Vector Error Correction (VEC) which point out the short- and longterm relationship between the variables. The time series that were part of this study were: admission and dismissal in the Brazilian electronics industry, Gross Domestic Product, total Brazilian import and export, monthly average dollar quotation, national broad consumer index and settlement and custody system. The sample period comprised May of 2003 to February of 2017 for the first article, and May of 2003 to September of 2018 in the case of the second article. The variables of the sector were collected in the online platform of the Brazilian Association of the Electrical and Electroelectronic Industry (Abinee), and the others, Ministry of Labor and Employment, General Register, Central Bank of Brazil, Rotary Brazil; Ministry of Finance, and the Brazilian Institute of Geography and Statistics. At the end of the study Cluster analysis proved to be efficient in the classification and selection of variables considering exogeneity, being corroborated by the Granger / Block Exogeneity Causality Test. It was evident that there is a significant relationship between them, indicating that abrupt changes in the macroeconomic variables will result in fluctuations in the number of employees of the Brazilian electrical and electronic industry by at least two months.O objetivo desta pesquisa foi verificar se a análise de Cluster seria capaz de classificar e selecionar as variáveis macroeconômicas relacionadas ao setor eletroeletrônico brasileiro em termos de exogeneidade, bem como ajustar um Modelo Autorregressivo Vetorial (VAR) e um vetor de correção de erros (VEC) que apontem a relação de curto e longo prazo entre as variáveis. As séries temporais que fizeram parte deste estudo foram: admissão e demissão no setor eletroeletrônico brasileiro, Produto Interno Bruto, total de importação e exportação brasileira, média mensal da cotação do dólar, índice nacional ao consumidor amplo e sistema de liquidação e custódia. O período amostral compreendeu o mês de maio de 2003 a fevereiro de 2017 para o primeiro artigo, e o mês de maio de 2003 a setembro de 2018 no caso do segundo artigo. As variáveis do setor foram coletadas na plataforma online da Associação Brasileira da Indústria Elétrica e Eletrônica (Abinee), e as demais, Ministério do Trabalho e Emprego, Cadastro Geral, Banco Central do Brasil, Rotary Brasil; Ministério da Fazenda, e Instituto Brasileiro de Geografia e Estatística. Ao final do estudo a análise de Cluster mostrou-se eficiente na classificação e seleção das variáveis considerando a exogeneidade, sendo corroborada pelo Granger/Block Exogeneity Causality Test. Ficou evidente que há uma relação significativa entre as mesmas, indicando que mudanças abruptas nas variáveis macroeconômicas resultará em flutuações no número de empregados da indústria eletroeletrônica brasileira por cerca de dois, no mínimo.Coordenação de Aperfeiçoamento de Pessoal de Nível Superior - CAPESporUniversidade Federal de Santa MariaCentro de TecnologiaPrograma de Pós-Graduação em Engenharia de ProduçãoUFSMBrasilEngenharia de ProduçãoAttribution-NonCommercial-NoDerivatives 4.0 Internationalhttp://creativecommons.org/licenses/by-nc-nd/4.0/info:eu-repo/semantics/openAccessAnálise de clusterModelos autorregressivos vetoriaisVetor de correção de errosSetor eletroeletrônicoMacroeconomiaCluster analysisVector autoregressive modelsVector error correctionElectro-electronic sectorMacroeconomicsCNPQ::ENGENHARIAS::ENGENHARIA DE PRODUCAOAdmissão e demissão: uma análise multivariada de curto e longo prazo sob a ótica do setor eletroeletrônico brasileiroAdmission and dismissal: a multivariate short-term and longterm analysis under the optics of the brazilian electroelectronic sectorinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/masterThesisSouza, Adriano Mendonçahttp://lattes.cnpq.br/5271075797851198Silva, Wesley Vieira dahttp://lattes.cnpq.br/1710286275396858Silva, Marcio Rogério dahttp://lattes.cnpq.br/1136612613285395http://lattes.cnpq.br/9567570471364145Ueda, Renan Mitsuo30080000000560060a97352-41f4-4228-b7b7-9bf285c97d9c39a9fee3-6e4d-4b72-b0ff-467ee5604c34647cd861-7fdf-41de-9f85-8411bc3de1a96466ebc4-2726-4750-8db6-c921b97314a9reponame:Biblioteca Digital de Teses e Dissertações do UFSMinstname:Universidade Federal de Santa Maria (UFSM)instacron:UFSMORIGINALDIS_PPGEP_2019_UEDA_RENAN.pdfDIS_PPGEP_2019_UEDA_RENAN.pdfDissertação de Mestradoapplication/pdf2346498http://repositorio.ufsm.br/bitstream/1/20257/1/DIS_PPGEP_2019_UEDA_RENAN.pdf7e038e509ba0d420993ced35e7319e76MD51CC-LICENSElicense_rdflicense_rdfapplication/rdf+xml; charset=utf-8805http://repositorio.ufsm.br/bitstream/1/20257/2/license_rdf4460e5956bc1d1639be9ae6146a50347MD52LICENSElicense.txtlicense.txttext/plain; charset=utf-81956http://repositorio.ufsm.br/bitstream/1/20257/3/license.txt2f0571ecee68693bd5cd3f17c1e075dfMD53TEXTDIS_PPGEP_2019_UEDA_RENAN.pdf.txtDIS_PPGEP_2019_UEDA_RENAN.pdf.txtExtracted texttext/plain208058http://repositorio.ufsm.br/bitstream/1/20257/4/DIS_PPGEP_2019_UEDA_RENAN.pdf.txt7a9b26c1c783873832eb093fe6d53c54MD54THUMBNAILDIS_PPGEP_2019_UEDA_RENAN.pdf.jpgDIS_PPGEP_2019_UEDA_RENAN.pdf.jpgIM Thumbnailimage/jpeg4439http://repositorio.ufsm.br/bitstream/1/20257/5/DIS_PPGEP_2019_UEDA_RENAN.pdf.jpgaacdbb2e172aaa54780aec95577666a4MD551/202572022-05-10 08:29:20.113oai:repositorio.ufsm.br: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 Digital de Teses e Dissertaçõeshttps://repositorio.ufsm.br/ONGhttps://repositorio.ufsm.br/oai/requestatendimento.sib@ufsm.br||tedebc@gmail.comopendoar:2022-05-10T11:29:20Biblioteca Digital de Teses e Dissertações do UFSM - Universidade Federal de Santa Maria (UFSM)false
dc.title.por.fl_str_mv Admissão e demissão: uma análise multivariada de curto e longo prazo sob a ótica do setor eletroeletrônico brasileiro
dc.title.alternative.eng.fl_str_mv Admission and dismissal: a multivariate short-term and longterm analysis under the optics of the brazilian electroelectronic sector
title Admissão e demissão: uma análise multivariada de curto e longo prazo sob a ótica do setor eletroeletrônico brasileiro
spellingShingle Admissão e demissão: uma análise multivariada de curto e longo prazo sob a ótica do setor eletroeletrônico brasileiro
Ueda, Renan Mitsuo
Análise de cluster
Modelos autorregressivos vetoriais
Vetor de correção de erros
Setor eletroeletrônico
Macroeconomia
Cluster analysis
Vector autoregressive models
Vector error correction
Electro-electronic sector
Macroeconomics
CNPQ::ENGENHARIAS::ENGENHARIA DE PRODUCAO
title_short Admissão e demissão: uma análise multivariada de curto e longo prazo sob a ótica do setor eletroeletrônico brasileiro
title_full Admissão e demissão: uma análise multivariada de curto e longo prazo sob a ótica do setor eletroeletrônico brasileiro
title_fullStr Admissão e demissão: uma análise multivariada de curto e longo prazo sob a ótica do setor eletroeletrônico brasileiro
title_full_unstemmed Admissão e demissão: uma análise multivariada de curto e longo prazo sob a ótica do setor eletroeletrônico brasileiro
title_sort Admissão e demissão: uma análise multivariada de curto e longo prazo sob a ótica do setor eletroeletrônico brasileiro
author Ueda, Renan Mitsuo
author_facet Ueda, Renan Mitsuo
author_role author
dc.contributor.advisor1.fl_str_mv Souza, Adriano Mendonça
dc.contributor.advisor1Lattes.fl_str_mv http://lattes.cnpq.br/5271075797851198
dc.contributor.referee1.fl_str_mv Silva, Wesley Vieira da
dc.contributor.referee1Lattes.fl_str_mv http://lattes.cnpq.br/1710286275396858
dc.contributor.referee2.fl_str_mv Silva, Marcio Rogério da
dc.contributor.referee2Lattes.fl_str_mv http://lattes.cnpq.br/1136612613285395
dc.contributor.authorLattes.fl_str_mv http://lattes.cnpq.br/9567570471364145
dc.contributor.author.fl_str_mv Ueda, Renan Mitsuo
contributor_str_mv Souza, Adriano Mendonça
Silva, Wesley Vieira da
Silva, Marcio Rogério da
dc.subject.por.fl_str_mv Análise de cluster
Modelos autorregressivos vetoriais
Vetor de correção de erros
Setor eletroeletrônico
Macroeconomia
topic Análise de cluster
Modelos autorregressivos vetoriais
Vetor de correção de erros
Setor eletroeletrônico
Macroeconomia
Cluster analysis
Vector autoregressive models
Vector error correction
Electro-electronic sector
Macroeconomics
CNPQ::ENGENHARIAS::ENGENHARIA DE PRODUCAO
dc.subject.eng.fl_str_mv Cluster analysis
Vector autoregressive models
Vector error correction
Electro-electronic sector
Macroeconomics
dc.subject.cnpq.fl_str_mv CNPQ::ENGENHARIAS::ENGENHARIA DE PRODUCAO
description The objective of this research was to verify if the Cluster analysis would be able to classify and select the macroeconomic variables related to the Brazilian electroelectronic sector in exogeneity terms, as well as to adjust a Vector Autoregressive Model (VAR) and a Vector Error Correction (VEC) which point out the short- and longterm relationship between the variables. The time series that were part of this study were: admission and dismissal in the Brazilian electronics industry, Gross Domestic Product, total Brazilian import and export, monthly average dollar quotation, national broad consumer index and settlement and custody system. The sample period comprised May of 2003 to February of 2017 for the first article, and May of 2003 to September of 2018 in the case of the second article. The variables of the sector were collected in the online platform of the Brazilian Association of the Electrical and Electroelectronic Industry (Abinee), and the others, Ministry of Labor and Employment, General Register, Central Bank of Brazil, Rotary Brazil; Ministry of Finance, and the Brazilian Institute of Geography and Statistics. At the end of the study Cluster analysis proved to be efficient in the classification and selection of variables considering exogeneity, being corroborated by the Granger / Block Exogeneity Causality Test. It was evident that there is a significant relationship between them, indicating that abrupt changes in the macroeconomic variables will result in fluctuations in the number of employees of the Brazilian electrical and electronic industry by at least two months.
publishDate 2019
dc.date.issued.fl_str_mv 2019-02-20
dc.date.accessioned.fl_str_mv 2021-01-18T11:43:43Z
dc.date.available.fl_str_mv 2021-01-18T11:43:43Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/masterThesis
format masterThesis
status_str publishedVersion
dc.identifier.uri.fl_str_mv http://repositorio.ufsm.br/handle/1/20257
url http://repositorio.ufsm.br/handle/1/20257
dc.language.iso.fl_str_mv por
language por
dc.relation.cnpq.fl_str_mv 300800000005
dc.relation.confidence.fl_str_mv 600
dc.relation.authority.fl_str_mv 60a97352-41f4-4228-b7b7-9bf285c97d9c
39a9fee3-6e4d-4b72-b0ff-467ee5604c34
647cd861-7fdf-41de-9f85-8411bc3de1a9
6466ebc4-2726-4750-8db6-c921b97314a9
dc.rights.driver.fl_str_mv Attribution-NonCommercial-NoDerivatives 4.0 International
http://creativecommons.org/licenses/by-nc-nd/4.0/
info:eu-repo/semantics/openAccess
rights_invalid_str_mv Attribution-NonCommercial-NoDerivatives 4.0 International
http://creativecommons.org/licenses/by-nc-nd/4.0/
eu_rights_str_mv openAccess
dc.publisher.none.fl_str_mv Universidade Federal de Santa Maria
Centro de Tecnologia
dc.publisher.program.fl_str_mv Programa de Pós-Graduação em Engenharia de Produção
dc.publisher.initials.fl_str_mv UFSM
dc.publisher.country.fl_str_mv Brasil
dc.publisher.department.fl_str_mv Engenharia de Produção
publisher.none.fl_str_mv Universidade Federal de Santa Maria
Centro de Tecnologia
dc.source.none.fl_str_mv reponame:Biblioteca Digital de Teses e Dissertações do UFSM
instname:Universidade Federal de Santa Maria (UFSM)
instacron:UFSM
instname_str Universidade Federal de Santa Maria (UFSM)
instacron_str UFSM
institution UFSM
reponame_str Biblioteca Digital de Teses e Dissertações do UFSM
collection Biblioteca Digital de Teses e Dissertações do UFSM
bitstream.url.fl_str_mv http://repositorio.ufsm.br/bitstream/1/20257/1/DIS_PPGEP_2019_UEDA_RENAN.pdf
http://repositorio.ufsm.br/bitstream/1/20257/2/license_rdf
http://repositorio.ufsm.br/bitstream/1/20257/3/license.txt
http://repositorio.ufsm.br/bitstream/1/20257/4/DIS_PPGEP_2019_UEDA_RENAN.pdf.txt
http://repositorio.ufsm.br/bitstream/1/20257/5/DIS_PPGEP_2019_UEDA_RENAN.pdf.jpg
bitstream.checksum.fl_str_mv 7e038e509ba0d420993ced35e7319e76
4460e5956bc1d1639be9ae6146a50347
2f0571ecee68693bd5cd3f17c1e075df
7a9b26c1c783873832eb093fe6d53c54
aacdbb2e172aaa54780aec95577666a4
bitstream.checksumAlgorithm.fl_str_mv MD5
MD5
MD5
MD5
MD5
repository.name.fl_str_mv Biblioteca Digital de Teses e Dissertações do UFSM - Universidade Federal de Santa Maria (UFSM)
repository.mail.fl_str_mv atendimento.sib@ufsm.br||tedebc@gmail.com
_version_ 1801485362580684800