An alternative chemical route for synthesis of SrBi2Ta2O9 thin films
Autor(a) principal: | |
---|---|
Data de Publicação: | 2000 |
Outros Autores: | , , , , , |
Tipo de documento: | Artigo |
Idioma: | eng |
Título da fonte: | Repositório Institucional da UNESP |
Texto Completo: | http://dx.doi.org/10.1557/JMR.2000.0301 http://hdl.handle.net/11449/231697 |
Resumo: | SrBi2Ta2O9 was synthesized by the modified polymeric precursor method using precursor reagents such as carbonate, nitrate, or oxide. The films were deposited onto Pt/Ti/SiO2/Si(100) substrates by spin coating and crystallized at temperatures ranging from 700 to 800 °C in air. Microstructural and phase evaluation were followed by grazing incidence x-ray diffraction, scanning electron microscopy, and atomic force microscopy. The films displayed rounded grain structures with a superficial roughness of approximately 10 nm. The dielectric constant values were 362 and 617 for films treated at 700 and 800 °C, respectively. The remanent polarization and coercive field were 12.3 μC/cm2 and 61 kV/cm and 18.48 μC/cm2 and 47 kV/cm for the film treated at 700 and 800 °C, respectively. This method generally allows for the use of readily available reagents such as oxides, carbonates, or nitrate as cation sources, with the added advantage that it requires no special apparatus or atmosphere control. © 2000 Materials Research Society. |
id |
UNSP_27859ca0416bf63536bdcec14893845d |
---|---|
oai_identifier_str |
oai:repositorio.unesp.br:11449/231697 |
network_acronym_str |
UNSP |
network_name_str |
Repositório Institucional da UNESP |
repository_id_str |
2946 |
spelling |
An alternative chemical route for synthesis of SrBi2Ta2O9 thin filmsSrBi2Ta2O9 was synthesized by the modified polymeric precursor method using precursor reagents such as carbonate, nitrate, or oxide. The films were deposited onto Pt/Ti/SiO2/Si(100) substrates by spin coating and crystallized at temperatures ranging from 700 to 800 °C in air. Microstructural and phase evaluation were followed by grazing incidence x-ray diffraction, scanning electron microscopy, and atomic force microscopy. The films displayed rounded grain structures with a superficial roughness of approximately 10 nm. The dielectric constant values were 362 and 617 for films treated at 700 and 800 °C, respectively. The remanent polarization and coercive field were 12.3 μC/cm2 and 61 kV/cm and 18.48 μC/cm2 and 47 kV/cm for the film treated at 700 and 800 °C, respectively. This method generally allows for the use of readily available reagents such as oxides, carbonates, or nitrate as cation sources, with the added advantage that it requires no special apparatus or atmosphere control. © 2000 Materials Research Society.Departamento de Quí;mica Universidade Federal de São Carlos, P.O. Box 676, 13560-905 São Carlos, SPDepartamento de Física Universidade Federal de São Carlos, P.O. Box 676, 13560-905 São Carlos, SPDepartamento de Química Universidade Estadual de São Paulo, P.O. Box 676, 14801-970 Araraquara, SPDepartamento de Química Universidade Estadual de São Paulo, P.O. Box 676, 14801-970 Araraquara, SPUniversidade Federal de São Carlos (UFSCar)Universidade Estadual Paulista (UNESP)Zanetti, S. M.Leite, E. R.Longo, E.Araújo, E. B.Chiquito, A. J.Eiras, J. A.Varela, J. A. [UNESP]2022-04-29T08:46:57Z2022-04-29T08:46:57Z2000-01-01info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/article2091-2095http://dx.doi.org/10.1557/JMR.2000.0301Journal of Materials Research, v. 15, n. 10, p. 2091-2095, 2000.0884-2914http://hdl.handle.net/11449/23169710.1557/JMR.2000.03012-s2.0-0034308487Scopusreponame:Repositório Institucional da UNESPinstname:Universidade Estadual Paulista (UNESP)instacron:UNESPengJournal of Materials Researchinfo:eu-repo/semantics/openAccess2022-04-29T08:46:57Zoai:repositorio.unesp.br:11449/231697Repositório InstitucionalPUBhttp://repositorio.unesp.br/oai/requestopendoar:29462022-04-29T08:46:57Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)false |
dc.title.none.fl_str_mv |
An alternative chemical route for synthesis of SrBi2Ta2O9 thin films |
title |
An alternative chemical route for synthesis of SrBi2Ta2O9 thin films |
spellingShingle |
An alternative chemical route for synthesis of SrBi2Ta2O9 thin films Zanetti, S. M. |
title_short |
An alternative chemical route for synthesis of SrBi2Ta2O9 thin films |
title_full |
An alternative chemical route for synthesis of SrBi2Ta2O9 thin films |
title_fullStr |
An alternative chemical route for synthesis of SrBi2Ta2O9 thin films |
title_full_unstemmed |
An alternative chemical route for synthesis of SrBi2Ta2O9 thin films |
title_sort |
An alternative chemical route for synthesis of SrBi2Ta2O9 thin films |
author |
Zanetti, S. M. |
author_facet |
Zanetti, S. M. Leite, E. R. Longo, E. Araújo, E. B. Chiquito, A. J. Eiras, J. A. Varela, J. A. [UNESP] |
author_role |
author |
author2 |
Leite, E. R. Longo, E. Araújo, E. B. Chiquito, A. J. Eiras, J. A. Varela, J. A. [UNESP] |
author2_role |
author author author author author author |
dc.contributor.none.fl_str_mv |
Universidade Federal de São Carlos (UFSCar) Universidade Estadual Paulista (UNESP) |
dc.contributor.author.fl_str_mv |
Zanetti, S. M. Leite, E. R. Longo, E. Araújo, E. B. Chiquito, A. J. Eiras, J. A. Varela, J. A. [UNESP] |
description |
SrBi2Ta2O9 was synthesized by the modified polymeric precursor method using precursor reagents such as carbonate, nitrate, or oxide. The films were deposited onto Pt/Ti/SiO2/Si(100) substrates by spin coating and crystallized at temperatures ranging from 700 to 800 °C in air. Microstructural and phase evaluation were followed by grazing incidence x-ray diffraction, scanning electron microscopy, and atomic force microscopy. The films displayed rounded grain structures with a superficial roughness of approximately 10 nm. The dielectric constant values were 362 and 617 for films treated at 700 and 800 °C, respectively. The remanent polarization and coercive field were 12.3 μC/cm2 and 61 kV/cm and 18.48 μC/cm2 and 47 kV/cm for the film treated at 700 and 800 °C, respectively. This method generally allows for the use of readily available reagents such as oxides, carbonates, or nitrate as cation sources, with the added advantage that it requires no special apparatus or atmosphere control. © 2000 Materials Research Society. |
publishDate |
2000 |
dc.date.none.fl_str_mv |
2000-01-01 2022-04-29T08:46:57Z 2022-04-29T08:46:57Z |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/article |
format |
article |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://dx.doi.org/10.1557/JMR.2000.0301 Journal of Materials Research, v. 15, n. 10, p. 2091-2095, 2000. 0884-2914 http://hdl.handle.net/11449/231697 10.1557/JMR.2000.0301 2-s2.0-0034308487 |
url |
http://dx.doi.org/10.1557/JMR.2000.0301 http://hdl.handle.net/11449/231697 |
identifier_str_mv |
Journal of Materials Research, v. 15, n. 10, p. 2091-2095, 2000. 0884-2914 10.1557/JMR.2000.0301 2-s2.0-0034308487 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
Journal of Materials Research |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
2091-2095 |
dc.source.none.fl_str_mv |
Scopus reponame:Repositório Institucional da UNESP instname:Universidade Estadual Paulista (UNESP) instacron:UNESP |
instname_str |
Universidade Estadual Paulista (UNESP) |
instacron_str |
UNESP |
institution |
UNESP |
reponame_str |
Repositório Institucional da UNESP |
collection |
Repositório Institucional da UNESP |
repository.name.fl_str_mv |
Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP) |
repository.mail.fl_str_mv |
|
_version_ |
1797790217295364096 |