Dielectric Spectroscopy Analyses of SrBi4Ti4O15 Films Obtained from Soft Chemical Solution

Detalhes bibliográficos
Autor(a) principal: Simões, Alexandre Zirpoli [UNESP]
Data de Publicação: 2009
Outros Autores: Riccardi, C. S. [UNESP]
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Repositório Institucional da UNESP
Texto Completo: http://dx.doi.org/10.1155/2009/928545
http://hdl.handle.net/11449/25672
Resumo: SrBi4Ti4O15 (SBTi) thin films were deposited by the polymeric precursor method on Pt bottom electrodes. The obtained films were characterized by X-ray diffraction, scanning electron microscopy, Raman spectroscopy, and dielectric spectroscopy analyses. The capacitance-voltage (C-V) characteristics of perovskite thin film showed normal ferroelectric behavior. The remanent polarization and coercive fields were 5.4 mu C/cm(2) and 85 kV/cm, respectively. Dielectric spectroscopy was employed to examine the polycrystalline behavior of ferroelectric material and the mechanisms responsible for the dielectric performance of the thin film. Copyright (C) 2009 A. Z. Simoes and C. S. Riccardi.
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spelling Dielectric Spectroscopy Analyses of SrBi4Ti4O15 Films Obtained from Soft Chemical SolutionSrBi4Ti4O15 (SBTi) thin films were deposited by the polymeric precursor method on Pt bottom electrodes. The obtained films were characterized by X-ray diffraction, scanning electron microscopy, Raman spectroscopy, and dielectric spectroscopy analyses. The capacitance-voltage (C-V) characteristics of perovskite thin film showed normal ferroelectric behavior. The remanent polarization and coercive fields were 5.4 mu C/cm(2) and 85 kV/cm, respectively. Dielectric spectroscopy was employed to examine the polycrystalline behavior of ferroelectric material and the mechanisms responsible for the dielectric performance of the thin film. Copyright (C) 2009 A. Z. Simoes and C. S. Riccardi.Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)Univ Fed Itajuba Unifei, BR-3590037 Itabira, MG, BrazilUniv Estadual Paulista, Inst Quim, Dept Quim Fis, Lab Interdisciplinar Ceram, BR-14800900 Araraquara, SP, BrazilUniv Estadual Paulista, Inst Quim, Dept Quim Fis, Lab Interdisciplinar Ceram, BR-14800900 Araraquara, SP, BrazilHindawi Publishing CorporationUniversidade Federal de Itajubá (UNIFEI)Universidade Estadual Paulista (Unesp)Simões, Alexandre Zirpoli [UNESP]Riccardi, C. S. [UNESP]2014-05-20T14:18:47Z2014-05-20T14:18:47Z2009-01-01info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/article6application/pdfhttp://dx.doi.org/10.1155/2009/928545Advances In Materials Science and Engineering. New York: Hindawi Publishing Corporation, p. 6, 2009.1687-6822http://hdl.handle.net/11449/2567210.1155/2009/928545WOS:000207891900001WOS000207891900001.pdfWeb of Sciencereponame:Repositório Institucional da UNESPinstname:Universidade Estadual Paulista (UNESP)instacron:UNESPengAdvances In Materials Science and Engineeringinfo:eu-repo/semantics/openAccess2023-12-24T06:13:35Zoai:repositorio.unesp.br:11449/25672Repositório InstitucionalPUBhttp://repositorio.unesp.br/oai/requestopendoar:29462023-12-24T06:13:35Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)false
dc.title.none.fl_str_mv Dielectric Spectroscopy Analyses of SrBi4Ti4O15 Films Obtained from Soft Chemical Solution
title Dielectric Spectroscopy Analyses of SrBi4Ti4O15 Films Obtained from Soft Chemical Solution
spellingShingle Dielectric Spectroscopy Analyses of SrBi4Ti4O15 Films Obtained from Soft Chemical Solution
Simões, Alexandre Zirpoli [UNESP]
title_short Dielectric Spectroscopy Analyses of SrBi4Ti4O15 Films Obtained from Soft Chemical Solution
title_full Dielectric Spectroscopy Analyses of SrBi4Ti4O15 Films Obtained from Soft Chemical Solution
title_fullStr Dielectric Spectroscopy Analyses of SrBi4Ti4O15 Films Obtained from Soft Chemical Solution
title_full_unstemmed Dielectric Spectroscopy Analyses of SrBi4Ti4O15 Films Obtained from Soft Chemical Solution
title_sort Dielectric Spectroscopy Analyses of SrBi4Ti4O15 Films Obtained from Soft Chemical Solution
author Simões, Alexandre Zirpoli [UNESP]
author_facet Simões, Alexandre Zirpoli [UNESP]
Riccardi, C. S. [UNESP]
author_role author
author2 Riccardi, C. S. [UNESP]
author2_role author
dc.contributor.none.fl_str_mv Universidade Federal de Itajubá (UNIFEI)
Universidade Estadual Paulista (Unesp)
dc.contributor.author.fl_str_mv Simões, Alexandre Zirpoli [UNESP]
Riccardi, C. S. [UNESP]
description SrBi4Ti4O15 (SBTi) thin films were deposited by the polymeric precursor method on Pt bottom electrodes. The obtained films were characterized by X-ray diffraction, scanning electron microscopy, Raman spectroscopy, and dielectric spectroscopy analyses. The capacitance-voltage (C-V) characteristics of perovskite thin film showed normal ferroelectric behavior. The remanent polarization and coercive fields were 5.4 mu C/cm(2) and 85 kV/cm, respectively. Dielectric spectroscopy was employed to examine the polycrystalline behavior of ferroelectric material and the mechanisms responsible for the dielectric performance of the thin film. Copyright (C) 2009 A. Z. Simoes and C. S. Riccardi.
publishDate 2009
dc.date.none.fl_str_mv 2009-01-01
2014-05-20T14:18:47Z
2014-05-20T14:18:47Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/article
format article
status_str publishedVersion
dc.identifier.uri.fl_str_mv http://dx.doi.org/10.1155/2009/928545
Advances In Materials Science and Engineering. New York: Hindawi Publishing Corporation, p. 6, 2009.
1687-6822
http://hdl.handle.net/11449/25672
10.1155/2009/928545
WOS:000207891900001
WOS000207891900001.pdf
url http://dx.doi.org/10.1155/2009/928545
http://hdl.handle.net/11449/25672
identifier_str_mv Advances In Materials Science and Engineering. New York: Hindawi Publishing Corporation, p. 6, 2009.
1687-6822
10.1155/2009/928545
WOS:000207891900001
WOS000207891900001.pdf
dc.language.iso.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv Advances In Materials Science and Engineering
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv 6
application/pdf
dc.publisher.none.fl_str_mv Hindawi Publishing Corporation
publisher.none.fl_str_mv Hindawi Publishing Corporation
dc.source.none.fl_str_mv Web of Science
reponame:Repositório Institucional da UNESP
instname:Universidade Estadual Paulista (UNESP)
instacron:UNESP
instname_str Universidade Estadual Paulista (UNESP)
instacron_str UNESP
institution UNESP
reponame_str Repositório Institucional da UNESP
collection Repositório Institucional da UNESP
repository.name.fl_str_mv Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)
repository.mail.fl_str_mv
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