Zero Temperature Coefficient behavior for advanced MOSFETs
Autor(a) principal: | |
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Data de Publicação: | 2017 |
Outros Autores: | , , , , , , |
Tipo de documento: | Artigo de conferência |
Idioma: | eng |
Título da fonte: | Repositório Institucional da UNESP |
Texto Completo: | http://dx.doi.org/10.1109/ICSICT.2016.7999041 http://hdl.handle.net/11449/170085 |
Resumo: | In this work the Zero Temperature Coefficient (ZTC) is investigated experimentally using state-of-the-art industrial technologies like Ultra-Thin Body and Buried Oxide (UTBB) and triple-gate FinFETs (irradiated and/or strained devices), both fabricated on Silicon On Insulator (SOI) wafers. A simple analytical model to analyze the behavior of the gate-source voltage at the Zero Temperature Coefficient point (VZTC) is validated for these advanced devices. Although simple, the model predictions have shown good agreement with the experimental results and can be useful for low-power low-voltage analog circuit designers, where biasing at/near the ZTC point should result in low thermal drift of the circuit operation. |
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Repositório Institucional da UNESP |
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Zero Temperature Coefficient behavior for advanced MOSFETsIn this work the Zero Temperature Coefficient (ZTC) is investigated experimentally using state-of-the-art industrial technologies like Ultra-Thin Body and Buried Oxide (UTBB) and triple-gate FinFETs (irradiated and/or strained devices), both fabricated on Silicon On Insulator (SOI) wafers. A simple analytical model to analyze the behavior of the gate-source voltage at the Zero Temperature Coefficient point (VZTC) is validated for these advanced devices. Although simple, the model predictions have shown good agreement with the experimental results and can be useful for low-power low-voltage analog circuit designers, where biasing at/near the ZTC point should result in low thermal drift of the circuit operation.LSI/PSI/USP University of Sao PauloUNESP Univ Estadual PaulistaImecEE Dept KULeuvenUNESP Univ Estadual PaulistaUniversidade de São Paulo (USP)Universidade Estadual Paulista (Unesp)ImecKULeuvenMartino, JoaoMesquita, ViniciusMacambira, ChristianItocazu, VitorAlmeida, LucianoAgopian, Paula [UNESP]Simoen, EddyClaeys, Cor2018-12-11T16:49:12Z2018-12-11T16:49:12Z2017-07-31info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/conferenceObject785-788http://dx.doi.org/10.1109/ICSICT.2016.79990412016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2016 - Proceedings, p. 785-788.http://hdl.handle.net/11449/17008510.1109/ICSICT.2016.79990412-s2.0-8502864314704969095954656960000-0002-0886-7798Scopusreponame:Repositório Institucional da UNESPinstname:Universidade Estadual Paulista (UNESP)instacron:UNESPeng2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2016 - Proceedingsinfo:eu-repo/semantics/openAccess2021-10-23T21:47:02Zoai:repositorio.unesp.br:11449/170085Repositório InstitucionalPUBhttp://repositorio.unesp.br/oai/requestopendoar:29462024-08-05T18:58:39.238383Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)false |
dc.title.none.fl_str_mv |
Zero Temperature Coefficient behavior for advanced MOSFETs |
title |
Zero Temperature Coefficient behavior for advanced MOSFETs |
spellingShingle |
Zero Temperature Coefficient behavior for advanced MOSFETs Martino, Joao |
title_short |
Zero Temperature Coefficient behavior for advanced MOSFETs |
title_full |
Zero Temperature Coefficient behavior for advanced MOSFETs |
title_fullStr |
Zero Temperature Coefficient behavior for advanced MOSFETs |
title_full_unstemmed |
Zero Temperature Coefficient behavior for advanced MOSFETs |
title_sort |
Zero Temperature Coefficient behavior for advanced MOSFETs |
author |
Martino, Joao |
author_facet |
Martino, Joao Mesquita, Vinicius Macambira, Christian Itocazu, Vitor Almeida, Luciano Agopian, Paula [UNESP] Simoen, Eddy Claeys, Cor |
author_role |
author |
author2 |
Mesquita, Vinicius Macambira, Christian Itocazu, Vitor Almeida, Luciano Agopian, Paula [UNESP] Simoen, Eddy Claeys, Cor |
author2_role |
author author author author author author author |
dc.contributor.none.fl_str_mv |
Universidade de São Paulo (USP) Universidade Estadual Paulista (Unesp) Imec KULeuven |
dc.contributor.author.fl_str_mv |
Martino, Joao Mesquita, Vinicius Macambira, Christian Itocazu, Vitor Almeida, Luciano Agopian, Paula [UNESP] Simoen, Eddy Claeys, Cor |
description |
In this work the Zero Temperature Coefficient (ZTC) is investigated experimentally using state-of-the-art industrial technologies like Ultra-Thin Body and Buried Oxide (UTBB) and triple-gate FinFETs (irradiated and/or strained devices), both fabricated on Silicon On Insulator (SOI) wafers. A simple analytical model to analyze the behavior of the gate-source voltage at the Zero Temperature Coefficient point (VZTC) is validated for these advanced devices. Although simple, the model predictions have shown good agreement with the experimental results and can be useful for low-power low-voltage analog circuit designers, where biasing at/near the ZTC point should result in low thermal drift of the circuit operation. |
publishDate |
2017 |
dc.date.none.fl_str_mv |
2017-07-31 2018-12-11T16:49:12Z 2018-12-11T16:49:12Z |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/conferenceObject |
format |
conferenceObject |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://dx.doi.org/10.1109/ICSICT.2016.7999041 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2016 - Proceedings, p. 785-788. http://hdl.handle.net/11449/170085 10.1109/ICSICT.2016.7999041 2-s2.0-85028643147 0496909595465696 0000-0002-0886-7798 |
url |
http://dx.doi.org/10.1109/ICSICT.2016.7999041 http://hdl.handle.net/11449/170085 |
identifier_str_mv |
2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2016 - Proceedings, p. 785-788. 10.1109/ICSICT.2016.7999041 2-s2.0-85028643147 0496909595465696 0000-0002-0886-7798 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2016 - Proceedings |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
785-788 |
dc.source.none.fl_str_mv |
Scopus reponame:Repositório Institucional da UNESP instname:Universidade Estadual Paulista (UNESP) instacron:UNESP |
instname_str |
Universidade Estadual Paulista (UNESP) |
instacron_str |
UNESP |
institution |
UNESP |
reponame_str |
Repositório Institucional da UNESP |
collection |
Repositório Institucional da UNESP |
repository.name.fl_str_mv |
Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP) |
repository.mail.fl_str_mv |
|
_version_ |
1808129006067777536 |