Retention Characteristics of CBTi144 Thin Films Explained by Means of X-Ray Photoemission Spectroscopy
Autor(a) principal: | |
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Data de Publicação: | 2010 |
Outros Autores: | , , , , |
Tipo de documento: | Artigo |
Idioma: | eng |
Título da fonte: | Repositório Institucional da UNESP |
Texto Completo: | http://dx.doi.org/10.1155/2010/710269 http://hdl.handle.net/11449/25674 |
Resumo: | CaBi(4)Ti(4)O(15) (CBTi144) thin films were grown on Pt/Ti/SiO(2)/Si substrates using a soft chemical solution and spin-coating method. Structure and morphology of the films were characterized by the X-ray Diffraction (XRD), Fourier-transform infrared spectroscopy (FT-IR), Raman analysis, X-ray photoemission spectroscopy (XPS), and transmission electron microscopy (TEM). The films present a single phase of layered-structured perovskite with polar axis orient. The a/b-axis orientation of the ferroelectric film is considered to be associated with the preferred orientation of the Pt bottom electrode. XPS measurements were employed to understand the nature of defects on the retention behavior of CBTi144 films. We have observed that the main source of retention-free characteristic of the capacitors is the oxygen environment in the CBTi144 lattice. |
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Repositório Institucional da UNESP |
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Retention Characteristics of CBTi144 Thin Films Explained by Means of X-Ray Photoemission SpectroscopyCaBi(4)Ti(4)O(15) (CBTi144) thin films were grown on Pt/Ti/SiO(2)/Si substrates using a soft chemical solution and spin-coating method. Structure and morphology of the films were characterized by the X-ray Diffraction (XRD), Fourier-transform infrared spectroscopy (FT-IR), Raman analysis, X-ray photoemission spectroscopy (XPS), and transmission electron microscopy (TEM). The films present a single phase of layered-structured perovskite with polar axis orient. The a/b-axis orientation of the ferroelectric film is considered to be associated with the preferred orientation of the Pt bottom electrode. XPS measurements were employed to understand the nature of defects on the retention behavior of CBTi144 films. We have observed that the main source of retention-free characteristic of the capacitors is the oxygen environment in the CBTi144 lattice.Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)Univ Fed Itajuba Unifei, BR-35900373 Bairro Amazonas Itabira, MG, BrazilUniv Estadual Paulista, Inst Quim, Dept Quim Fis, Lab Interdisciplinar Ceram, BR-14801970 Araraquara, SP, BrazilUniv Estadual Paulista, Inst Quim, Dept Quim Fis, Lab Interdisciplinar Ceram, BR-14801970 Araraquara, SP, BrazilHindawi Publishing CorporationUniversidade Federal de Itajubá (UNIFEI)Universidade Estadual Paulista (Unesp)Biasotto, G. [UNESP]Simões, Alexandre Zirpoli [UNESP]Riccardi, C. S. [UNESP]Zaghete, M. A. [UNESP]Longo, Elson [UNESP]Varela, José Arana [UNESP]2014-05-20T14:18:48Z2014-05-20T14:18:48Z2010-01-01info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/article7application/pdfhttp://dx.doi.org/10.1155/2010/710269Advances In Materials Science and Engineering. New York: Hindawi Publishing Corporation, p. 7, 2010.1687-6822http://hdl.handle.net/11449/2567410.1155/2010/710269WOS:000289369900001WOS000289369900001.pdfWeb of Sciencereponame:Repositório Institucional da UNESPinstname:Universidade Estadual Paulista (UNESP)instacron:UNESPengAdvances In Materials Science and Engineeringinfo:eu-repo/semantics/openAccess2023-11-03T06:06:35Zoai:repositorio.unesp.br:11449/25674Repositório InstitucionalPUBhttp://repositorio.unesp.br/oai/requestopendoar:29462023-11-03T06:06:35Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)false |
dc.title.none.fl_str_mv |
Retention Characteristics of CBTi144 Thin Films Explained by Means of X-Ray Photoemission Spectroscopy |
title |
Retention Characteristics of CBTi144 Thin Films Explained by Means of X-Ray Photoemission Spectroscopy |
spellingShingle |
Retention Characteristics of CBTi144 Thin Films Explained by Means of X-Ray Photoemission Spectroscopy Biasotto, G. [UNESP] |
title_short |
Retention Characteristics of CBTi144 Thin Films Explained by Means of X-Ray Photoemission Spectroscopy |
title_full |
Retention Characteristics of CBTi144 Thin Films Explained by Means of X-Ray Photoemission Spectroscopy |
title_fullStr |
Retention Characteristics of CBTi144 Thin Films Explained by Means of X-Ray Photoemission Spectroscopy |
title_full_unstemmed |
Retention Characteristics of CBTi144 Thin Films Explained by Means of X-Ray Photoemission Spectroscopy |
title_sort |
Retention Characteristics of CBTi144 Thin Films Explained by Means of X-Ray Photoemission Spectroscopy |
author |
Biasotto, G. [UNESP] |
author_facet |
Biasotto, G. [UNESP] Simões, Alexandre Zirpoli [UNESP] Riccardi, C. S. [UNESP] Zaghete, M. A. [UNESP] Longo, Elson [UNESP] Varela, José Arana [UNESP] |
author_role |
author |
author2 |
Simões, Alexandre Zirpoli [UNESP] Riccardi, C. S. [UNESP] Zaghete, M. A. [UNESP] Longo, Elson [UNESP] Varela, José Arana [UNESP] |
author2_role |
author author author author author |
dc.contributor.none.fl_str_mv |
Universidade Federal de Itajubá (UNIFEI) Universidade Estadual Paulista (Unesp) |
dc.contributor.author.fl_str_mv |
Biasotto, G. [UNESP] Simões, Alexandre Zirpoli [UNESP] Riccardi, C. S. [UNESP] Zaghete, M. A. [UNESP] Longo, Elson [UNESP] Varela, José Arana [UNESP] |
description |
CaBi(4)Ti(4)O(15) (CBTi144) thin films were grown on Pt/Ti/SiO(2)/Si substrates using a soft chemical solution and spin-coating method. Structure and morphology of the films were characterized by the X-ray Diffraction (XRD), Fourier-transform infrared spectroscopy (FT-IR), Raman analysis, X-ray photoemission spectroscopy (XPS), and transmission electron microscopy (TEM). The films present a single phase of layered-structured perovskite with polar axis orient. The a/b-axis orientation of the ferroelectric film is considered to be associated with the preferred orientation of the Pt bottom electrode. XPS measurements were employed to understand the nature of defects on the retention behavior of CBTi144 films. We have observed that the main source of retention-free characteristic of the capacitors is the oxygen environment in the CBTi144 lattice. |
publishDate |
2010 |
dc.date.none.fl_str_mv |
2010-01-01 2014-05-20T14:18:48Z 2014-05-20T14:18:48Z |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/article |
format |
article |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://dx.doi.org/10.1155/2010/710269 Advances In Materials Science and Engineering. New York: Hindawi Publishing Corporation, p. 7, 2010. 1687-6822 http://hdl.handle.net/11449/25674 10.1155/2010/710269 WOS:000289369900001 WOS000289369900001.pdf |
url |
http://dx.doi.org/10.1155/2010/710269 http://hdl.handle.net/11449/25674 |
identifier_str_mv |
Advances In Materials Science and Engineering. New York: Hindawi Publishing Corporation, p. 7, 2010. 1687-6822 10.1155/2010/710269 WOS:000289369900001 WOS000289369900001.pdf |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
Advances In Materials Science and Engineering |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
7 application/pdf |
dc.publisher.none.fl_str_mv |
Hindawi Publishing Corporation |
publisher.none.fl_str_mv |
Hindawi Publishing Corporation |
dc.source.none.fl_str_mv |
Web of Science reponame:Repositório Institucional da UNESP instname:Universidade Estadual Paulista (UNESP) instacron:UNESP |
instname_str |
Universidade Estadual Paulista (UNESP) |
instacron_str |
UNESP |
institution |
UNESP |
reponame_str |
Repositório Institucional da UNESP |
collection |
Repositório Institucional da UNESP |
repository.name.fl_str_mv |
Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP) |
repository.mail.fl_str_mv |
|
_version_ |
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