A chromatic technique for structural damage detection under noise effects based on impedance measurements

Detalhes bibliográficos
Autor(a) principal: De Castro, Bruno Albuquerque [UNESP]
Data de Publicação: 2019
Outros Autores: Baptista, Fabrício Guimarães [UNESP], Ardila Rey, Jorge Alfredo, Ciampa, Francesco
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Repositório Institucional da UNESP
Texto Completo: http://dx.doi.org/10.1088/1361-6501/ab0fe2
http://hdl.handle.net/11449/187872
Resumo: Structural health monitoring (SHM) based on electromechanical impedance (EMI) measurements has been extensively studied in recent years and stands out as an effective damage detection approach. The EMI method commonly uses low-cost piezoelectric transducers and structural diagnosis can be accomplished by analyzing the changes in the impedance measurements from the transducers attached to the host structure. Although many studies have proved the effectiveness of the EMI method, one of the most reported problems is the variations in the impedance caused by external noise, which can alter the impedance measurements and limit the effectiveness of the detection and quantification of damage using conventional basic damage indices. Therefore, this paper proposes a new approach for structure feature extraction in noisy environments based on the chromatic signal processing technique associated with the Hinkley criterion, thus aiming to expand the applicability of the EMI method to real applications. Experimental tests were carried out on aluminum and carbon fiber composite plates subjected to various signal noise levels. The experimental results indicate that the proposed approach is more effective for damage detection compared to the basic indices commonly reported in the literature.
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spelling A chromatic technique for structural damage detection under noise effects based on impedance measurementschromaticEMIimpedancemeasurementsnoiseSHMsignal processingStructural health monitoring (SHM) based on electromechanical impedance (EMI) measurements has been extensively studied in recent years and stands out as an effective damage detection approach. The EMI method commonly uses low-cost piezoelectric transducers and structural diagnosis can be accomplished by analyzing the changes in the impedance measurements from the transducers attached to the host structure. Although many studies have proved the effectiveness of the EMI method, one of the most reported problems is the variations in the impedance caused by external noise, which can alter the impedance measurements and limit the effectiveness of the detection and quantification of damage using conventional basic damage indices. Therefore, this paper proposes a new approach for structure feature extraction in noisy environments based on the chromatic signal processing technique associated with the Hinkley criterion, thus aiming to expand the applicability of the EMI method to real applications. Experimental tests were carried out on aluminum and carbon fiber composite plates subjected to various signal noise levels. The experimental results indicate that the proposed approach is more effective for damage detection compared to the basic indices commonly reported in the literature.Department of Electrical Engineering Saõ Paulo State University (UNESP)Department of Electrical Engineering Universidad Técnica Federico Santa MariáDepartment of Mechanical Engineering Sciences University of SurreyDepartment of Electrical Engineering Saõ Paulo State University (UNESP)Universidade Estadual Paulista (Unesp)Universidad Técnica Federico Santa MariáUniversity of SurreyDe Castro, Bruno Albuquerque [UNESP]Baptista, Fabrício Guimarães [UNESP]Ardila Rey, Jorge AlfredoCiampa, Francesco2019-10-06T15:49:50Z2019-10-06T15:49:50Z2019-05-31info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articlehttp://dx.doi.org/10.1088/1361-6501/ab0fe2Measurement Science and Technology, v. 30, n. 7, 2019.1361-65010957-0233http://hdl.handle.net/11449/18787210.1088/1361-6501/ab0fe22-s2.0-85069001608Scopusreponame:Repositório Institucional da UNESPinstname:Universidade Estadual Paulista (UNESP)instacron:UNESPengMeasurement Science and Technologyinfo:eu-repo/semantics/openAccess2021-10-22T21:10:06Zoai:repositorio.unesp.br:11449/187872Repositório InstitucionalPUBhttp://repositorio.unesp.br/oai/requestopendoar:29462024-08-06T00:07:45.763806Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)false
dc.title.none.fl_str_mv A chromatic technique for structural damage detection under noise effects based on impedance measurements
title A chromatic technique for structural damage detection under noise effects based on impedance measurements
spellingShingle A chromatic technique for structural damage detection under noise effects based on impedance measurements
De Castro, Bruno Albuquerque [UNESP]
chromatic
EMI
impedance
measurements
noise
SHM
signal processing
title_short A chromatic technique for structural damage detection under noise effects based on impedance measurements
title_full A chromatic technique for structural damage detection under noise effects based on impedance measurements
title_fullStr A chromatic technique for structural damage detection under noise effects based on impedance measurements
title_full_unstemmed A chromatic technique for structural damage detection under noise effects based on impedance measurements
title_sort A chromatic technique for structural damage detection under noise effects based on impedance measurements
author De Castro, Bruno Albuquerque [UNESP]
author_facet De Castro, Bruno Albuquerque [UNESP]
Baptista, Fabrício Guimarães [UNESP]
Ardila Rey, Jorge Alfredo
Ciampa, Francesco
author_role author
author2 Baptista, Fabrício Guimarães [UNESP]
Ardila Rey, Jorge Alfredo
Ciampa, Francesco
author2_role author
author
author
dc.contributor.none.fl_str_mv Universidade Estadual Paulista (Unesp)
Universidad Técnica Federico Santa Mariá
University of Surrey
dc.contributor.author.fl_str_mv De Castro, Bruno Albuquerque [UNESP]
Baptista, Fabrício Guimarães [UNESP]
Ardila Rey, Jorge Alfredo
Ciampa, Francesco
dc.subject.por.fl_str_mv chromatic
EMI
impedance
measurements
noise
SHM
signal processing
topic chromatic
EMI
impedance
measurements
noise
SHM
signal processing
description Structural health monitoring (SHM) based on electromechanical impedance (EMI) measurements has been extensively studied in recent years and stands out as an effective damage detection approach. The EMI method commonly uses low-cost piezoelectric transducers and structural diagnosis can be accomplished by analyzing the changes in the impedance measurements from the transducers attached to the host structure. Although many studies have proved the effectiveness of the EMI method, one of the most reported problems is the variations in the impedance caused by external noise, which can alter the impedance measurements and limit the effectiveness of the detection and quantification of damage using conventional basic damage indices. Therefore, this paper proposes a new approach for structure feature extraction in noisy environments based on the chromatic signal processing technique associated with the Hinkley criterion, thus aiming to expand the applicability of the EMI method to real applications. Experimental tests were carried out on aluminum and carbon fiber composite plates subjected to various signal noise levels. The experimental results indicate that the proposed approach is more effective for damage detection compared to the basic indices commonly reported in the literature.
publishDate 2019
dc.date.none.fl_str_mv 2019-10-06T15:49:50Z
2019-10-06T15:49:50Z
2019-05-31
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/article
format article
status_str publishedVersion
dc.identifier.uri.fl_str_mv http://dx.doi.org/10.1088/1361-6501/ab0fe2
Measurement Science and Technology, v. 30, n. 7, 2019.
1361-6501
0957-0233
http://hdl.handle.net/11449/187872
10.1088/1361-6501/ab0fe2
2-s2.0-85069001608
url http://dx.doi.org/10.1088/1361-6501/ab0fe2
http://hdl.handle.net/11449/187872
identifier_str_mv Measurement Science and Technology, v. 30, n. 7, 2019.
1361-6501
0957-0233
10.1088/1361-6501/ab0fe2
2-s2.0-85069001608
dc.language.iso.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv Measurement Science and Technology
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.source.none.fl_str_mv Scopus
reponame:Repositório Institucional da UNESP
instname:Universidade Estadual Paulista (UNESP)
instacron:UNESP
instname_str Universidade Estadual Paulista (UNESP)
instacron_str UNESP
institution UNESP
reponame_str Repositório Institucional da UNESP
collection Repositório Institucional da UNESP
repository.name.fl_str_mv Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)
repository.mail.fl_str_mv
_version_ 1808129587916308480