New imaging algorithm for material damage localisation based on impedance measurements under noise influence
Autor(a) principal: | |
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Data de Publicação: | 2020 |
Outros Autores: | , |
Tipo de documento: | Artigo |
Idioma: | eng |
Título da fonte: | Repositório Institucional da UNESP |
Texto Completo: | http://dx.doi.org/10.1016/j.measurement.2020.107953 http://hdl.handle.net/11449/200504 |
Resumo: | The electro-mechanical impedance (EMI) measurements have been extensively studied in recent years to provide a reliable diagnosis of aerospace infrastructures. Existing imaging algorithms for EMI-based damage localisation have been proposed for controlled inspection environments or under the sole influence of temperature variations. However, the presence of signal noise may alter impedance signals and limit the use of the EMI method in real operating scenarios. Based on this issue, this short communication proposes a novel EMI probabilistic imaging algorithm for damage localisation under noisy inspections. Furthermore, as another advantage compared to traditional techniques, which do not perform a noise compensation, the proposed application does not require high computational cost since it does not require licensed software or the calculation of acoustic parameters. Experimental results on an aluminium plate-like structure revealed that the new algorithm proved to be adequate to image the location of damage under noise influence as opposed to traditional approaches. |
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Repositório Institucional da UNESP |
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2946 |
spelling |
New imaging algorithm for material damage localisation based on impedance measurements under noise influenceCCSDDamage localisationImaging algorithmImpedance measurementsProbabilistic imageSHMSignal processingThe electro-mechanical impedance (EMI) measurements have been extensively studied in recent years to provide a reliable diagnosis of aerospace infrastructures. Existing imaging algorithms for EMI-based damage localisation have been proposed for controlled inspection environments or under the sole influence of temperature variations. However, the presence of signal noise may alter impedance signals and limit the use of the EMI method in real operating scenarios. Based on this issue, this short communication proposes a novel EMI probabilistic imaging algorithm for damage localisation under noisy inspections. Furthermore, as another advantage compared to traditional techniques, which do not perform a noise compensation, the proposed application does not require high computational cost since it does not require licensed software or the calculation of acoustic parameters. Experimental results on an aluminium plate-like structure revealed that the new algorithm proved to be adequate to image the location of damage under noise influence as opposed to traditional approaches.Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)São Paulo State University (UNESP) School of Engineering Bauru Department of Electrical EngineeringUniversity of Surrey Department of Mechanical Engineering SciencesSão Paulo State University (UNESP) School of Engineering Bauru Department of Electrical EngineeringFAPESP: 2015/24903-5FAPESP: 2018/23737-2Universidade Estadual Paulista (Unesp)University of Surreyde Castro, Bruno Albuquerque [UNESP]Baptista, Fabricio Guimarães [UNESP]Ciampa, Francesco2020-12-12T02:08:23Z2020-12-12T02:08:23Z2020-10-15info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articlehttp://dx.doi.org/10.1016/j.measurement.2020.107953Measurement: Journal of the International Measurement Confederation, v. 163.0263-2241http://hdl.handle.net/11449/20050410.1016/j.measurement.2020.1079532-s2.0-8508525709324263302049198140000-0002-1200-4354Scopusreponame:Repositório Institucional da UNESPinstname:Universidade Estadual Paulista (UNESP)instacron:UNESPengMeasurement: Journal of the International Measurement Confederationinfo:eu-repo/semantics/openAccess2024-06-28T13:34:24Zoai:repositorio.unesp.br:11449/200504Repositório InstitucionalPUBhttp://repositorio.unesp.br/oai/requestopendoar:29462024-08-05T21:25:30.251255Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)false |
dc.title.none.fl_str_mv |
New imaging algorithm for material damage localisation based on impedance measurements under noise influence |
title |
New imaging algorithm for material damage localisation based on impedance measurements under noise influence |
spellingShingle |
New imaging algorithm for material damage localisation based on impedance measurements under noise influence de Castro, Bruno Albuquerque [UNESP] CCSD Damage localisation Imaging algorithm Impedance measurements Probabilistic image SHM Signal processing |
title_short |
New imaging algorithm for material damage localisation based on impedance measurements under noise influence |
title_full |
New imaging algorithm for material damage localisation based on impedance measurements under noise influence |
title_fullStr |
New imaging algorithm for material damage localisation based on impedance measurements under noise influence |
title_full_unstemmed |
New imaging algorithm for material damage localisation based on impedance measurements under noise influence |
title_sort |
New imaging algorithm for material damage localisation based on impedance measurements under noise influence |
author |
de Castro, Bruno Albuquerque [UNESP] |
author_facet |
de Castro, Bruno Albuquerque [UNESP] Baptista, Fabricio Guimarães [UNESP] Ciampa, Francesco |
author_role |
author |
author2 |
Baptista, Fabricio Guimarães [UNESP] Ciampa, Francesco |
author2_role |
author author |
dc.contributor.none.fl_str_mv |
Universidade Estadual Paulista (Unesp) University of Surrey |
dc.contributor.author.fl_str_mv |
de Castro, Bruno Albuquerque [UNESP] Baptista, Fabricio Guimarães [UNESP] Ciampa, Francesco |
dc.subject.por.fl_str_mv |
CCSD Damage localisation Imaging algorithm Impedance measurements Probabilistic image SHM Signal processing |
topic |
CCSD Damage localisation Imaging algorithm Impedance measurements Probabilistic image SHM Signal processing |
description |
The electro-mechanical impedance (EMI) measurements have been extensively studied in recent years to provide a reliable diagnosis of aerospace infrastructures. Existing imaging algorithms for EMI-based damage localisation have been proposed for controlled inspection environments or under the sole influence of temperature variations. However, the presence of signal noise may alter impedance signals and limit the use of the EMI method in real operating scenarios. Based on this issue, this short communication proposes a novel EMI probabilistic imaging algorithm for damage localisation under noisy inspections. Furthermore, as another advantage compared to traditional techniques, which do not perform a noise compensation, the proposed application does not require high computational cost since it does not require licensed software or the calculation of acoustic parameters. Experimental results on an aluminium plate-like structure revealed that the new algorithm proved to be adequate to image the location of damage under noise influence as opposed to traditional approaches. |
publishDate |
2020 |
dc.date.none.fl_str_mv |
2020-12-12T02:08:23Z 2020-12-12T02:08:23Z 2020-10-15 |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/article |
format |
article |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://dx.doi.org/10.1016/j.measurement.2020.107953 Measurement: Journal of the International Measurement Confederation, v. 163. 0263-2241 http://hdl.handle.net/11449/200504 10.1016/j.measurement.2020.107953 2-s2.0-85085257093 2426330204919814 0000-0002-1200-4354 |
url |
http://dx.doi.org/10.1016/j.measurement.2020.107953 http://hdl.handle.net/11449/200504 |
identifier_str_mv |
Measurement: Journal of the International Measurement Confederation, v. 163. 0263-2241 10.1016/j.measurement.2020.107953 2-s2.0-85085257093 2426330204919814 0000-0002-1200-4354 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
Measurement: Journal of the International Measurement Confederation |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.source.none.fl_str_mv |
Scopus reponame:Repositório Institucional da UNESP instname:Universidade Estadual Paulista (UNESP) instacron:UNESP |
instname_str |
Universidade Estadual Paulista (UNESP) |
instacron_str |
UNESP |
institution |
UNESP |
reponame_str |
Repositório Institucional da UNESP |
collection |
Repositório Institucional da UNESP |
repository.name.fl_str_mv |
Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP) |
repository.mail.fl_str_mv |
|
_version_ |
1808129318328467456 |