Charge transport and dielectric characteristics of Sm x Bi1−x FeO3 thin films from the perspective of grain and grain boundary properties

• Autor(a) principal: Minussi, F. B. [UNESP]
• Data de Publicação: 2023
• Outros Autores: Borges, F. V.A., Araújo, E. B. [UNESP]
• Tipo de documento: Artigo
• Idioma: eng
• Título da fonte: Repositório Institucional da UNESP
• Texto Completo: http://dx.doi.org/10.1088/1361-6463/acd791; http://hdl.handle.net/11449/247538
• topic: bismuth ferrite; brick layer model; electrical properties; ferroelectric; grains and grain boundaries; samarium; thin films

Samarium-substituted bismuth ferrite (Sm x Bi1−x FeO3) compositions comprise a system of important materials due to their combination of multiferroic properties. Several dielectric and charge transport reports in literature can be found in this system. However, as a typical polycrystalline electroceramic, their grains and grain boundaries (GBs) are expected to possess very different properties. To this date, these distinctions have not been determined for this system. In this work, through measurements via impedance spectroscopy on Sm x Bi1−x FeO3 thin films, we show that using a brick layer model allows the separation of the electrical properties of grains and GBs. Results indicate that grains have dielectric permittivity and electrical conductivity much higher than GBs. Their properties mostly control the characteristics observed in the studied thin films. The introduction of samarium reduces the electrical conductivity and increases the activation energies for charge transport in grains and GBs. In turn, dielectric permittivity is reduced in grains and subtly increased in GBs.