Spectroscopic Techniques for Characterization of Nanomaterials
Autor(a) principal: | |
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Data de Publicação: | 2017 |
Outros Autores: | , , , |
Tipo de documento: | Capítulo de livro |
Idioma: | eng |
Título da fonte: | Repositório Institucional da UNESP |
Texto Completo: | http://dx.doi.org/10.1016/B978-0-323-49778-7.00003-5 http://hdl.handle.net/11449/220997 |
Resumo: | This chapter discusses the characterization of nanomaterials, that is, nanoparticles and nanometer(s)-thick thin films. The focus is on the application of ultraviolet-visible (UV-vis) spectroscopy, infrared (IR) absorption spectroscopy, Raman scattering, and surface-enhanced Raman scattering (SERS) for nanomaterial characterization. This chapter will present literature studies that applied spectroscopic techniques to nanomaterial characterization, and these studies can be used by the reader to investigate his/her own nanostructured systems. The selected articles are discussed as case studies to provide information on the spectroscopic techniques. The theoretical foundations related to each technique and a discussion of their respective measurement systems (devices) are not included in this chapter. |
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Spectroscopic Techniques for Characterization of NanomaterialsInfraredMolecular organizationNanoparticlesNanostructuresRaman scatteringSERSSpectroscopySurface-enhanced Raman scatteringThin filmsUV-visThis chapter discusses the characterization of nanomaterials, that is, nanoparticles and nanometer(s)-thick thin films. The focus is on the application of ultraviolet-visible (UV-vis) spectroscopy, infrared (IR) absorption spectroscopy, Raman scattering, and surface-enhanced Raman scattering (SERS) for nanomaterial characterization. This chapter will present literature studies that applied spectroscopic techniques to nanomaterial characterization, and these studies can be used by the reader to investigate his/her own nanostructured systems. The selected articles are discussed as case studies to provide information on the spectroscopic techniques. The theoretical foundations related to each technique and a discussion of their respective measurement systems (devices) are not included in this chapter.State University of São PauloUniversidade de São Paulo (USP)Alessio, PriscilaAoki, Pedro H.B.Furini, Leonardo N.Aliaga, Alvaro E.Leopoldo Constantino, Carlos J.2022-04-28T19:07:15Z2022-04-28T19:07:15Z2017-03-23info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/bookPart65-98http://dx.doi.org/10.1016/B978-0-323-49778-7.00003-5Nanocharacterization Techniques, p. 65-98.http://hdl.handle.net/11449/22099710.1016/B978-0-323-49778-7.00003-52-s2.0-85040617398Scopusreponame:Repositório Institucional da UNESPinstname:Universidade Estadual Paulista (UNESP)instacron:UNESPengNanocharacterization Techniquesinfo:eu-repo/semantics/openAccess2022-04-28T19:07:15Zoai:repositorio.unesp.br:11449/220997Repositório InstitucionalPUBhttp://repositorio.unesp.br/oai/requestopendoar:29462024-08-05T19:38:41.511668Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)false |
dc.title.none.fl_str_mv |
Spectroscopic Techniques for Characterization of Nanomaterials |
title |
Spectroscopic Techniques for Characterization of Nanomaterials |
spellingShingle |
Spectroscopic Techniques for Characterization of Nanomaterials Alessio, Priscila Infrared Molecular organization Nanoparticles Nanostructures Raman scattering SERS Spectroscopy Surface-enhanced Raman scattering Thin films UV-vis |
title_short |
Spectroscopic Techniques for Characterization of Nanomaterials |
title_full |
Spectroscopic Techniques for Characterization of Nanomaterials |
title_fullStr |
Spectroscopic Techniques for Characterization of Nanomaterials |
title_full_unstemmed |
Spectroscopic Techniques for Characterization of Nanomaterials |
title_sort |
Spectroscopic Techniques for Characterization of Nanomaterials |
author |
Alessio, Priscila |
author_facet |
Alessio, Priscila Aoki, Pedro H.B. Furini, Leonardo N. Aliaga, Alvaro E. Leopoldo Constantino, Carlos J. |
author_role |
author |
author2 |
Aoki, Pedro H.B. Furini, Leonardo N. Aliaga, Alvaro E. Leopoldo Constantino, Carlos J. |
author2_role |
author author author author |
dc.contributor.none.fl_str_mv |
Universidade de São Paulo (USP) |
dc.contributor.author.fl_str_mv |
Alessio, Priscila Aoki, Pedro H.B. Furini, Leonardo N. Aliaga, Alvaro E. Leopoldo Constantino, Carlos J. |
dc.subject.por.fl_str_mv |
Infrared Molecular organization Nanoparticles Nanostructures Raman scattering SERS Spectroscopy Surface-enhanced Raman scattering Thin films UV-vis |
topic |
Infrared Molecular organization Nanoparticles Nanostructures Raman scattering SERS Spectroscopy Surface-enhanced Raman scattering Thin films UV-vis |
description |
This chapter discusses the characterization of nanomaterials, that is, nanoparticles and nanometer(s)-thick thin films. The focus is on the application of ultraviolet-visible (UV-vis) spectroscopy, infrared (IR) absorption spectroscopy, Raman scattering, and surface-enhanced Raman scattering (SERS) for nanomaterial characterization. This chapter will present literature studies that applied spectroscopic techniques to nanomaterial characterization, and these studies can be used by the reader to investigate his/her own nanostructured systems. The selected articles are discussed as case studies to provide information on the spectroscopic techniques. The theoretical foundations related to each technique and a discussion of their respective measurement systems (devices) are not included in this chapter. |
publishDate |
2017 |
dc.date.none.fl_str_mv |
2017-03-23 2022-04-28T19:07:15Z 2022-04-28T19:07:15Z |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/bookPart |
format |
bookPart |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://dx.doi.org/10.1016/B978-0-323-49778-7.00003-5 Nanocharacterization Techniques, p. 65-98. http://hdl.handle.net/11449/220997 10.1016/B978-0-323-49778-7.00003-5 2-s2.0-85040617398 |
url |
http://dx.doi.org/10.1016/B978-0-323-49778-7.00003-5 http://hdl.handle.net/11449/220997 |
identifier_str_mv |
Nanocharacterization Techniques, p. 65-98. 10.1016/B978-0-323-49778-7.00003-5 2-s2.0-85040617398 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
Nanocharacterization Techniques |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
65-98 |
dc.source.none.fl_str_mv |
Scopus reponame:Repositório Institucional da UNESP instname:Universidade Estadual Paulista (UNESP) instacron:UNESP |
instname_str |
Universidade Estadual Paulista (UNESP) |
instacron_str |
UNESP |
institution |
UNESP |
reponame_str |
Repositório Institucional da UNESP |
collection |
Repositório Institucional da UNESP |
repository.name.fl_str_mv |
Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP) |
repository.mail.fl_str_mv |
|
_version_ |
1808129100178522112 |