Imprint effect in PZT thin films at compositions around the morphotropic phase boundary

Detalhes bibliográficos
Autor(a) principal: Araujo, E. B. [UNESP]
Data de Publicação: 2016
Outros Autores: Lima, E. C., Bdikin, I. K., Kholkin, A. L.
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Repositório Institucional da UNESP
DOI: 10.1080/00150193.2016.1166421
Texto Completo: http://dx.doi.org/10.1080/00150193.2016.1166421
http://hdl.handle.net/11449/173097
Resumo: Piezoeresponse force microscopy (PFM) and local piezoresponse hysteresis loops were used to study the imprint effect in PbZr1-xTixO3 thin films at compositions around the morphotropic phase boundary (MPB). Schottky barriers and mechanical coupling between film-substrate were excluded as origin for the imprint in these films. Comparing the composition dependence of the effective d33 before poling with some reports in the literature, the existence of point defects such as complex vacancies (Vpb .., VO .. and Vpb ..-VO ..) and Ti3+ centers is discussed as probable origin for the imprint effect observed here.
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spelling Imprint effect in PZT thin films at compositions around the morphotropic phase boundaryImprintPZTthin filmsPiezoeresponse force microscopy (PFM) and local piezoresponse hysteresis loops were used to study the imprint effect in PbZr1-xTixO3 thin films at compositions around the morphotropic phase boundary (MPB). Schottky barriers and mechanical coupling between film-substrate were excluded as origin for the imprint in these films. Comparing the composition dependence of the effective d33 before poling with some reports in the literature, the existence of point defects such as complex vacancies (Vpb .., VO .. and Vpb ..-VO ..) and Ti3+ centers is discussed as probable origin for the imprint effect observed here.Faculdade de Engenharia de Ilha Solteira UNESP - Univ Estadual Paulista Departamento de Física e QuímicaUniversidade Federal do TocantinsDepartment of Mechanical Engineering & TEMA University of AveiroDepartment of Materials and Ceramic Engineering & CICECO University of AveiroInstitute of Natural Sciences Ural Federal UniversityFaculdade de Engenharia de Ilha Solteira UNESP - Univ Estadual Paulista Departamento de Física e QuímicaUniversidade Estadual Paulista (Unesp)Universidade Federal do TocantinsUniversity of AveiroUral Federal UniversityAraujo, E. B. [UNESP]Lima, E. C.Bdikin, I. K.Kholkin, A. L.2018-12-11T17:03:37Z2018-12-11T17:03:37Z2016-08-31info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/article18-26application/pdfhttp://dx.doi.org/10.1080/00150193.2016.1166421Ferroelectrics, v. 498, n. 1, p. 18-26, 2016.1563-51120015-0193http://hdl.handle.net/11449/17309710.1080/00150193.2016.11664212-s2.0-849751433272-s2.0-84975143327.pdfScopusreponame:Repositório Institucional da UNESPinstname:Universidade Estadual Paulista (UNESP)instacron:UNESPengFerroelectrics0,260info:eu-repo/semantics/openAccess2024-07-10T14:07:38Zoai:repositorio.unesp.br:11449/173097Repositório InstitucionalPUBhttp://repositorio.unesp.br/oai/requestopendoar:29462024-08-05T17:24:13.741068Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)false
dc.title.none.fl_str_mv Imprint effect in PZT thin films at compositions around the morphotropic phase boundary
title Imprint effect in PZT thin films at compositions around the morphotropic phase boundary
spellingShingle Imprint effect in PZT thin films at compositions around the morphotropic phase boundary
Imprint effect in PZT thin films at compositions around the morphotropic phase boundary
Araujo, E. B. [UNESP]
Imprint
PZT
thin films
Araujo, E. B. [UNESP]
Imprint
PZT
thin films
title_short Imprint effect in PZT thin films at compositions around the morphotropic phase boundary
title_full Imprint effect in PZT thin films at compositions around the morphotropic phase boundary
title_fullStr Imprint effect in PZT thin films at compositions around the morphotropic phase boundary
Imprint effect in PZT thin films at compositions around the morphotropic phase boundary
title_full_unstemmed Imprint effect in PZT thin films at compositions around the morphotropic phase boundary
Imprint effect in PZT thin films at compositions around the morphotropic phase boundary
title_sort Imprint effect in PZT thin films at compositions around the morphotropic phase boundary
author Araujo, E. B. [UNESP]
author_facet Araujo, E. B. [UNESP]
Araujo, E. B. [UNESP]
Lima, E. C.
Bdikin, I. K.
Kholkin, A. L.
Lima, E. C.
Bdikin, I. K.
Kholkin, A. L.
author_role author
author2 Lima, E. C.
Bdikin, I. K.
Kholkin, A. L.
author2_role author
author
author
dc.contributor.none.fl_str_mv Universidade Estadual Paulista (Unesp)
Universidade Federal do Tocantins
University of Aveiro
Ural Federal University
dc.contributor.author.fl_str_mv Araujo, E. B. [UNESP]
Lima, E. C.
Bdikin, I. K.
Kholkin, A. L.
dc.subject.por.fl_str_mv Imprint
PZT
thin films
topic Imprint
PZT
thin films
description Piezoeresponse force microscopy (PFM) and local piezoresponse hysteresis loops were used to study the imprint effect in PbZr1-xTixO3 thin films at compositions around the morphotropic phase boundary (MPB). Schottky barriers and mechanical coupling between film-substrate were excluded as origin for the imprint in these films. Comparing the composition dependence of the effective d33 before poling with some reports in the literature, the existence of point defects such as complex vacancies (Vpb .., VO .. and Vpb ..-VO ..) and Ti3+ centers is discussed as probable origin for the imprint effect observed here.
publishDate 2016
dc.date.none.fl_str_mv 2016-08-31
2018-12-11T17:03:37Z
2018-12-11T17:03:37Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/article
format article
status_str publishedVersion
dc.identifier.uri.fl_str_mv http://dx.doi.org/10.1080/00150193.2016.1166421
Ferroelectrics, v. 498, n. 1, p. 18-26, 2016.
1563-5112
0015-0193
http://hdl.handle.net/11449/173097
10.1080/00150193.2016.1166421
2-s2.0-84975143327
2-s2.0-84975143327.pdf
url http://dx.doi.org/10.1080/00150193.2016.1166421
http://hdl.handle.net/11449/173097
identifier_str_mv Ferroelectrics, v. 498, n. 1, p. 18-26, 2016.
1563-5112
0015-0193
10.1080/00150193.2016.1166421
2-s2.0-84975143327
2-s2.0-84975143327.pdf
dc.language.iso.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv Ferroelectrics
0,260
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv 18-26
application/pdf
dc.source.none.fl_str_mv Scopus
reponame:Repositório Institucional da UNESP
instname:Universidade Estadual Paulista (UNESP)
instacron:UNESP
instname_str Universidade Estadual Paulista (UNESP)
instacron_str UNESP
institution UNESP
reponame_str Repositório Institucional da UNESP
collection Repositório Institucional da UNESP
repository.name.fl_str_mv Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)
repository.mail.fl_str_mv
_version_ 1822182411271667712
dc.identifier.doi.none.fl_str_mv 10.1080/00150193.2016.1166421

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