Structural, dielectric and ferroelectric characterization of PZT thin films
Autor(a) principal: | |
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Data de Publicação: | 1999 |
Outros Autores: | |
Tipo de documento: | Artigo |
Idioma: | eng |
Título da fonte: | Cerâmica (São Paulo. Online) |
Texto Completo: | http://old.scielo.br/scielo.php?script=sci_arttext&pid=S0366-69131999000200010 |
Resumo: | In this work ferroelectric thin films of PZT were prepared by the oxide precursor method, deposited on Pt/Si substrate. Films of 0.5 mm average thickness were obtained. Electrical and ferroelectric characterization were carried out in these films. The measured value of the dielectric constant for films was 455. Ferroelectricity was confirmed by Capacitance-Voltage (C-V) characteristics and P-E hysteresis loops. Remanent polarization for films presented value around 5.0 µC/cm2 and a coercive field of 88.8 kV/cm. |
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USP-29 |
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Cerâmica (São Paulo. Online) |
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|
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Structural, dielectric and ferroelectric characterization of PZT thin filmsThin filmsPZTferroelectricsIn this work ferroelectric thin films of PZT were prepared by the oxide precursor method, deposited on Pt/Si substrate. Films of 0.5 mm average thickness were obtained. Electrical and ferroelectric characterization were carried out in these films. The measured value of the dielectric constant for films was 455. Ferroelectricity was confirmed by Capacitance-Voltage (C-V) characteristics and P-E hysteresis loops. Remanent polarization for films presented value around 5.0 µC/cm2 and a coercive field of 88.8 kV/cm.Associação Brasileira de Cerâmica1999-06-01info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersiontext/htmlhttp://old.scielo.br/scielo.php?script=sci_arttext&pid=S0366-69131999000200010Cerâmica v.45 n.292-293 1999reponame:Cerâmica (São Paulo. Online)instname:Universidade de São Paulo (USP)instacron:USP10.1590/S0366-69131999000200010info:eu-repo/semantics/openAccessAraújo,E.B.Eiras,J.A.eng2000-05-11T00:00:00Zoai:scielo:S0366-69131999000200010Revistahttps://www.scielo.br/j/ce/PUBhttps://old.scielo.br/oai/scielo-oai.phpceram.abc@gmail.com||ceram.abc@gmail.com1678-45530366-6913opendoar:2000-05-11T00:00Cerâmica (São Paulo. Online) - Universidade de São Paulo (USP)false |
dc.title.none.fl_str_mv |
Structural, dielectric and ferroelectric characterization of PZT thin films |
title |
Structural, dielectric and ferroelectric characterization of PZT thin films |
spellingShingle |
Structural, dielectric and ferroelectric characterization of PZT thin films Araújo,E.B. Thin films PZT ferroelectrics |
title_short |
Structural, dielectric and ferroelectric characterization of PZT thin films |
title_full |
Structural, dielectric and ferroelectric characterization of PZT thin films |
title_fullStr |
Structural, dielectric and ferroelectric characterization of PZT thin films |
title_full_unstemmed |
Structural, dielectric and ferroelectric characterization of PZT thin films |
title_sort |
Structural, dielectric and ferroelectric characterization of PZT thin films |
author |
Araújo,E.B. |
author_facet |
Araújo,E.B. Eiras,J.A. |
author_role |
author |
author2 |
Eiras,J.A. |
author2_role |
author |
dc.contributor.author.fl_str_mv |
Araújo,E.B. Eiras,J.A. |
dc.subject.por.fl_str_mv |
Thin films PZT ferroelectrics |
topic |
Thin films PZT ferroelectrics |
description |
In this work ferroelectric thin films of PZT were prepared by the oxide precursor method, deposited on Pt/Si substrate. Films of 0.5 mm average thickness were obtained. Electrical and ferroelectric characterization were carried out in these films. The measured value of the dielectric constant for films was 455. Ferroelectricity was confirmed by Capacitance-Voltage (C-V) characteristics and P-E hysteresis loops. Remanent polarization for films presented value around 5.0 µC/cm2 and a coercive field of 88.8 kV/cm. |
publishDate |
1999 |
dc.date.none.fl_str_mv |
1999-06-01 |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/article |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
format |
article |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://old.scielo.br/scielo.php?script=sci_arttext&pid=S0366-69131999000200010 |
url |
http://old.scielo.br/scielo.php?script=sci_arttext&pid=S0366-69131999000200010 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
10.1590/S0366-69131999000200010 |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
text/html |
dc.publisher.none.fl_str_mv |
Associação Brasileira de Cerâmica |
publisher.none.fl_str_mv |
Associação Brasileira de Cerâmica |
dc.source.none.fl_str_mv |
Cerâmica v.45 n.292-293 1999 reponame:Cerâmica (São Paulo. Online) instname:Universidade de São Paulo (USP) instacron:USP |
instname_str |
Universidade de São Paulo (USP) |
instacron_str |
USP |
institution |
USP |
reponame_str |
Cerâmica (São Paulo. Online) |
collection |
Cerâmica (São Paulo. Online) |
repository.name.fl_str_mv |
Cerâmica (São Paulo. Online) - Universidade de São Paulo (USP) |
repository.mail.fl_str_mv |
ceram.abc@gmail.com||ceram.abc@gmail.com |
_version_ |
1748936779433508864 |