Low-frequency and random telegraph noise performance of Ge-based and III-V devices on a Si platform
| Autor(a) principal: | |
|---|---|
| Data de Publicação: | 2017 |
| Outros Autores: | , , , , , , , , |
| Tipo de documento: | Artigo de conferência |
| Idioma: | eng |
| Título da fonte: | Repositório Institucional da UNESP |
| Texto Completo: | http://dx.doi.org/10.1109/ICSICT.2016.7998900 http://hdl.handle.net/11449/170089 |
Resumo: | This review demonstrates the potential of low frequency noise diagnostics for the characterization of Ge-based and III-V technologies processed on a Si platform. The analysis of traps in both gate dielectrics and semiconductor films is illustrated for state-of-the-art devices. |
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Low-frequency and random telegraph noise performance of Ge-based and III-V devices on a Si platformThis review demonstrates the potential of low frequency noise diagnostics for the characterization of Ge-based and III-V technologies processed on a Si platform. The analysis of traps in both gate dielectrics and semiconductor films is illustrated for state-of-the-art devices.ImecE.E. Dept. KU LeuvenUNESP Univ Estadual PaulistaLSI/PSI/USP University of Sao PauloMicrosystem and Terahertz Research CenterDept. Solid-State Physics Ghent UniversityUNESP Univ Estadual PaulistaImecKU LeuvenUniversidade Estadual Paulista (Unesp)Universidade de São Paulo (USP)Microsystem and Terahertz Research CenterGhent UniversityClaeys, CorAgopian, Paula [UNESP]Alian, AlirezzaArimura, HiroakiFang, WenMartino, JoaoMitard, JeromeNeves, FelipeOliviera, AlbertoSimoen, Eddy2018-12-11T16:49:13Z2018-12-11T16:49:13Z2017-07-31info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/conferenceObject288-293http://dx.doi.org/10.1109/ICSICT.2016.79989002016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2016 - Proceedings, p. 288-293.http://hdl.handle.net/11449/17008910.1109/ICSICT.2016.79989002-s2.0-8502868151604969095954656960000-0002-0886-7798Scopusreponame:Repositório Institucional da UNESPinstname:Universidade Estadual Paulista (UNESP)instacron:UNESPeng2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2016 - Proceedingsinfo:eu-repo/semantics/openAccess2021-10-23T21:46:59Zoai:repositorio.unesp.br:11449/170089Repositório InstitucionalPUBhttp://repositorio.unesp.br/oai/requestopendoar:29462024-08-05T16:16:01.901164Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)false |
| dc.title.none.fl_str_mv |
Low-frequency and random telegraph noise performance of Ge-based and III-V devices on a Si platform |
| title |
Low-frequency and random telegraph noise performance of Ge-based and III-V devices on a Si platform |
| spellingShingle |
Low-frequency and random telegraph noise performance of Ge-based and III-V devices on a Si platform Claeys, Cor |
| title_short |
Low-frequency and random telegraph noise performance of Ge-based and III-V devices on a Si platform |
| title_full |
Low-frequency and random telegraph noise performance of Ge-based and III-V devices on a Si platform |
| title_fullStr |
Low-frequency and random telegraph noise performance of Ge-based and III-V devices on a Si platform |
| title_full_unstemmed |
Low-frequency and random telegraph noise performance of Ge-based and III-V devices on a Si platform |
| title_sort |
Low-frequency and random telegraph noise performance of Ge-based and III-V devices on a Si platform |
| author |
Claeys, Cor |
| author_facet |
Claeys, Cor Agopian, Paula [UNESP] Alian, Alirezza Arimura, Hiroaki Fang, Wen Martino, Joao Mitard, Jerome Neves, Felipe Oliviera, Alberto Simoen, Eddy |
| author_role |
author |
| author2 |
Agopian, Paula [UNESP] Alian, Alirezza Arimura, Hiroaki Fang, Wen Martino, Joao Mitard, Jerome Neves, Felipe Oliviera, Alberto Simoen, Eddy |
| author2_role |
author author author author author author author author author |
| dc.contributor.none.fl_str_mv |
Imec KU Leuven Universidade Estadual Paulista (Unesp) Universidade de São Paulo (USP) Microsystem and Terahertz Research Center Ghent University |
| dc.contributor.author.fl_str_mv |
Claeys, Cor Agopian, Paula [UNESP] Alian, Alirezza Arimura, Hiroaki Fang, Wen Martino, Joao Mitard, Jerome Neves, Felipe Oliviera, Alberto Simoen, Eddy |
| description |
This review demonstrates the potential of low frequency noise diagnostics for the characterization of Ge-based and III-V technologies processed on a Si platform. The analysis of traps in both gate dielectrics and semiconductor films is illustrated for state-of-the-art devices. |
| publishDate |
2017 |
| dc.date.none.fl_str_mv |
2017-07-31 2018-12-11T16:49:13Z 2018-12-11T16:49:13Z |
| dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
| dc.type.driver.fl_str_mv |
info:eu-repo/semantics/conferenceObject |
| format |
conferenceObject |
| status_str |
publishedVersion |
| dc.identifier.uri.fl_str_mv |
http://dx.doi.org/10.1109/ICSICT.2016.7998900 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2016 - Proceedings, p. 288-293. http://hdl.handle.net/11449/170089 10.1109/ICSICT.2016.7998900 2-s2.0-85028681516 0496909595465696 0000-0002-0886-7798 |
| url |
http://dx.doi.org/10.1109/ICSICT.2016.7998900 http://hdl.handle.net/11449/170089 |
| identifier_str_mv |
2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2016 - Proceedings, p. 288-293. 10.1109/ICSICT.2016.7998900 2-s2.0-85028681516 0496909595465696 0000-0002-0886-7798 |
| dc.language.iso.fl_str_mv |
eng |
| language |
eng |
| dc.relation.none.fl_str_mv |
2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2016 - Proceedings |
| dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
| eu_rights_str_mv |
openAccess |
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288-293 |
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Scopus reponame:Repositório Institucional da UNESP instname:Universidade Estadual Paulista (UNESP) instacron:UNESP |
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Universidade Estadual Paulista (UNESP) |
| instacron_str |
UNESP |
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UNESP |
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Repositório Institucional da UNESP |
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Repositório Institucional da UNESP |
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Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP) |
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1808128626799935488 |