Preventing Chaotic Motion in Tapping-Mode Atomic Force Microscope

Detalhes bibliográficos
Autor(a) principal: Rodrigues, Kleber dos Santos
Data de Publicação: 2014
Outros Autores: Balthazar, José Manoel [UNESP], Tusset, Angelo Marcelo, de Pontes, Bento Rodrigues [UNESP], Bueno, Átila Madureira [UNESP]
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Repositório Institucional da UNESP
Texto Completo: http://dx.doi.org/10.1007/s40313-014-0144-4
http://hdl.handle.net/11449/171745
Resumo: During the last 30 years the Atomic Force Microscopy became the most powerful tool for surface probing in atomic scale. The Tapping-Mode Atomic Force Microscope is used to generate high quality accurate images of the samples surface. However, in this mode of operation the microcantilever frequently presents chaotic motion due to the nonlinear characteristics of the tip-sample forces interactions, degrading the image quality. This kind of irregular motion must be avoided by the control system. In this work, the tip-sample interaction is modelled considering the Lennard-Jones potentials and the two-term Galerkin aproximation. Additionally, the State Dependent Ricatti Equation and Time-Delayed Feedback Control techniques are used in order to force the Tapping-Mode Atomic Force Microscope system motion to a periodic orbit, preventing the microcantilever chaotic motion.
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spelling Preventing Chaotic Motion in Tapping-Mode Atomic Force MicroscopeAtomic Force MicroscopyChaosNonlinear control systemsState Dependent Ricatti EquationTime-Delayed FeedbackDuring the last 30 years the Atomic Force Microscopy became the most powerful tool for surface probing in atomic scale. The Tapping-Mode Atomic Force Microscope is used to generate high quality accurate images of the samples surface. However, in this mode of operation the microcantilever frequently presents chaotic motion due to the nonlinear characteristics of the tip-sample forces interactions, degrading the image quality. This kind of irregular motion must be avoided by the control system. In this work, the tip-sample interaction is modelled considering the Lennard-Jones potentials and the two-term Galerkin aproximation. Additionally, the State Dependent Ricatti Equation and Time-Delayed Feedback Control techniques are used in order to force the Tapping-Mode Atomic Force Microscope system motion to a periodic orbit, preventing the microcantilever chaotic motion.Departamento de Engenharia Mecânica, Escola de Engenharia de São Carlos - EESC, Universidade de São Paulo - USPDepartamento de Estatística, Matemática Aplicada e Computação - DEMAC, Universidade Estadual Paulista - UNESPDepartamento Academico de Engenharia Eletrônica - DAELE, Campus de Ponta Grossa, Universidade Tecnológica Federal do Paraná - UTFPRDepartamento de Engenharia Mecânica, Faculdade de Engenharia de Bauru - FEB, Universidade Estadual Paulista - UNESPDepartamento de Engenharia de Controle e Automação - ECA, Campus de Sorocaba, Universidade Estadual Paulista - UNESPDepartamento de Estatística, Matemática Aplicada e Computação - DEMAC, Universidade Estadual Paulista - UNESPDepartamento de Engenharia Mecânica, Faculdade de Engenharia de Bauru - FEB, Universidade Estadual Paulista - UNESPDepartamento de Engenharia de Controle e Automação - ECA, Campus de Sorocaba, Universidade Estadual Paulista - UNESPUniversidade de São Paulo (USP)Universidade Estadual Paulista (Unesp)Rodrigues, Kleber dos SantosBalthazar, José Manoel [UNESP]Tusset, Angelo Marcelode Pontes, Bento Rodrigues [UNESP]Bueno, Átila Madureira [UNESP]2018-12-11T16:56:52Z2018-12-11T16:56:52Z2014-01-01info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/article732-740application/pdfhttp://dx.doi.org/10.1007/s40313-014-0144-4Journal of Control, Automation and Electrical Systems, v. 25, n. 6, p. 732-740, 2014.2195-38992195-3880http://hdl.handle.net/11449/17174510.1007/s40313-014-0144-42-s2.0-849199134102-s2.0-84919913410.pdfScopusreponame:Repositório Institucional da UNESPinstname:Universidade Estadual Paulista (UNESP)instacron:UNESPengJournal of Control, Automation and Electrical Systems0,2740,274info:eu-repo/semantics/openAccess2024-06-28T13:54:49Zoai:repositorio.unesp.br:11449/171745Repositório InstitucionalPUBhttp://repositorio.unesp.br/oai/requestopendoar:29462024-06-28T13:54:49Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)false
dc.title.none.fl_str_mv Preventing Chaotic Motion in Tapping-Mode Atomic Force Microscope
title Preventing Chaotic Motion in Tapping-Mode Atomic Force Microscope
spellingShingle Preventing Chaotic Motion in Tapping-Mode Atomic Force Microscope
Rodrigues, Kleber dos Santos
Atomic Force Microscopy
Chaos
Nonlinear control systems
State Dependent Ricatti Equation
Time-Delayed Feedback
title_short Preventing Chaotic Motion in Tapping-Mode Atomic Force Microscope
title_full Preventing Chaotic Motion in Tapping-Mode Atomic Force Microscope
title_fullStr Preventing Chaotic Motion in Tapping-Mode Atomic Force Microscope
title_full_unstemmed Preventing Chaotic Motion in Tapping-Mode Atomic Force Microscope
title_sort Preventing Chaotic Motion in Tapping-Mode Atomic Force Microscope
author Rodrigues, Kleber dos Santos
author_facet Rodrigues, Kleber dos Santos
Balthazar, José Manoel [UNESP]
Tusset, Angelo Marcelo
de Pontes, Bento Rodrigues [UNESP]
Bueno, Átila Madureira [UNESP]
author_role author
author2 Balthazar, José Manoel [UNESP]
Tusset, Angelo Marcelo
de Pontes, Bento Rodrigues [UNESP]
Bueno, Átila Madureira [UNESP]
author2_role author
author
author
author
dc.contributor.none.fl_str_mv Universidade de São Paulo (USP)
Universidade Estadual Paulista (Unesp)
dc.contributor.author.fl_str_mv Rodrigues, Kleber dos Santos
Balthazar, José Manoel [UNESP]
Tusset, Angelo Marcelo
de Pontes, Bento Rodrigues [UNESP]
Bueno, Átila Madureira [UNESP]
dc.subject.por.fl_str_mv Atomic Force Microscopy
Chaos
Nonlinear control systems
State Dependent Ricatti Equation
Time-Delayed Feedback
topic Atomic Force Microscopy
Chaos
Nonlinear control systems
State Dependent Ricatti Equation
Time-Delayed Feedback
description During the last 30 years the Atomic Force Microscopy became the most powerful tool for surface probing in atomic scale. The Tapping-Mode Atomic Force Microscope is used to generate high quality accurate images of the samples surface. However, in this mode of operation the microcantilever frequently presents chaotic motion due to the nonlinear characteristics of the tip-sample forces interactions, degrading the image quality. This kind of irregular motion must be avoided by the control system. In this work, the tip-sample interaction is modelled considering the Lennard-Jones potentials and the two-term Galerkin aproximation. Additionally, the State Dependent Ricatti Equation and Time-Delayed Feedback Control techniques are used in order to force the Tapping-Mode Atomic Force Microscope system motion to a periodic orbit, preventing the microcantilever chaotic motion.
publishDate 2014
dc.date.none.fl_str_mv 2014-01-01
2018-12-11T16:56:52Z
2018-12-11T16:56:52Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/article
format article
status_str publishedVersion
dc.identifier.uri.fl_str_mv http://dx.doi.org/10.1007/s40313-014-0144-4
Journal of Control, Automation and Electrical Systems, v. 25, n. 6, p. 732-740, 2014.
2195-3899
2195-3880
http://hdl.handle.net/11449/171745
10.1007/s40313-014-0144-4
2-s2.0-84919913410
2-s2.0-84919913410.pdf
url http://dx.doi.org/10.1007/s40313-014-0144-4
http://hdl.handle.net/11449/171745
identifier_str_mv Journal of Control, Automation and Electrical Systems, v. 25, n. 6, p. 732-740, 2014.
2195-3899
2195-3880
10.1007/s40313-014-0144-4
2-s2.0-84919913410
2-s2.0-84919913410.pdf
dc.language.iso.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv Journal of Control, Automation and Electrical Systems
0,274
0,274
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv 732-740
application/pdf
dc.source.none.fl_str_mv Scopus
reponame:Repositório Institucional da UNESP
instname:Universidade Estadual Paulista (UNESP)
instacron:UNESP
instname_str Universidade Estadual Paulista (UNESP)
instacron_str UNESP
institution UNESP
reponame_str Repositório Institucional da UNESP
collection Repositório Institucional da UNESP
repository.name.fl_str_mv Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)
repository.mail.fl_str_mv
_version_ 1803649653586001920

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