Signal to noise ratio in nanoscale bioFETs

Detalhes bibliográficos
Autor(a) principal: Mori, Carlos Augusto Bergfeld
Data de Publicação: 2022
Outros Autores: Martens, Koen, Simoen, Eddy, Van Dorpe, Pol, Agopian, Paula Ghedini Der [UNESP], Martino, João Antonio
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Repositório Institucional da UNESP
Texto Completo: http://dx.doi.org/10.1016/j.sse.2022.108358
http://hdl.handle.net/11449/240006
Resumo: We experimentally demonstrate the use of electrolytically gated SOI pFinFETs employed as bioFETs for the detection of single-stranded DNA and evaluate their low-frequency noise in the range between 1 Hz and 100 Hz. Both channel length and overdrive voltage dependencies are analyzed, showing the best (i.e., highest) signal to noise ratio for the devices with their gates biased around the threshold voltage, with little to no dependence on the channel length.
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spelling Signal to noise ratio in nanoscale bioFETs1/f noiseBioFETFinFETISFETWe experimentally demonstrate the use of electrolytically gated SOI pFinFETs employed as bioFETs for the detection of single-stranded DNA and evaluate their low-frequency noise in the range between 1 Hz and 100 Hz. Both channel length and overdrive voltage dependencies are analyzed, showing the best (i.e., highest) signal to noise ratio for the devices with their gates biased around the threshold voltage, with little to no dependence on the channel length.LSI/PSI/USP University of Sao PauloimecKU LeuvenUNESP Sao Paulo State UniversityUNESP Sao Paulo State UniversityUniversidade de São Paulo (USP)imecKU LeuvenUniversidade Estadual Paulista (UNESP)Mori, Carlos Augusto BergfeldMartens, KoenSimoen, EddyVan Dorpe, PolAgopian, Paula Ghedini Der [UNESP]Martino, João Antonio2023-03-01T19:57:16Z2023-03-01T19:57:16Z2022-08-01info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articlehttp://dx.doi.org/10.1016/j.sse.2022.108358Solid-State Electronics, v. 194.0038-1101http://hdl.handle.net/11449/24000610.1016/j.sse.2022.1083582-s2.0-85129565421Scopusreponame:Repositório Institucional da UNESPinstname:Universidade Estadual Paulista (UNESP)instacron:UNESPengSolid-State Electronicsinfo:eu-repo/semantics/openAccess2023-03-01T19:57:16Zoai:repositorio.unesp.br:11449/240006Repositório InstitucionalPUBhttp://repositorio.unesp.br/oai/requestopendoar:29462023-03-01T19:57:16Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)false
dc.title.none.fl_str_mv Signal to noise ratio in nanoscale bioFETs
title Signal to noise ratio in nanoscale bioFETs
spellingShingle Signal to noise ratio in nanoscale bioFETs
Mori, Carlos Augusto Bergfeld
1/f noise
BioFET
FinFET
ISFET
title_short Signal to noise ratio in nanoscale bioFETs
title_full Signal to noise ratio in nanoscale bioFETs
title_fullStr Signal to noise ratio in nanoscale bioFETs
title_full_unstemmed Signal to noise ratio in nanoscale bioFETs
title_sort Signal to noise ratio in nanoscale bioFETs
author Mori, Carlos Augusto Bergfeld
author_facet Mori, Carlos Augusto Bergfeld
Martens, Koen
Simoen, Eddy
Van Dorpe, Pol
Agopian, Paula Ghedini Der [UNESP]
Martino, João Antonio
author_role author
author2 Martens, Koen
Simoen, Eddy
Van Dorpe, Pol
Agopian, Paula Ghedini Der [UNESP]
Martino, João Antonio
author2_role author
author
author
author
author
dc.contributor.none.fl_str_mv Universidade de São Paulo (USP)
imec
KU Leuven
Universidade Estadual Paulista (UNESP)
dc.contributor.author.fl_str_mv Mori, Carlos Augusto Bergfeld
Martens, Koen
Simoen, Eddy
Van Dorpe, Pol
Agopian, Paula Ghedini Der [UNESP]
Martino, João Antonio
dc.subject.por.fl_str_mv 1/f noise
BioFET
FinFET
ISFET
topic 1/f noise
BioFET
FinFET
ISFET
description We experimentally demonstrate the use of electrolytically gated SOI pFinFETs employed as bioFETs for the detection of single-stranded DNA and evaluate their low-frequency noise in the range between 1 Hz and 100 Hz. Both channel length and overdrive voltage dependencies are analyzed, showing the best (i.e., highest) signal to noise ratio for the devices with their gates biased around the threshold voltage, with little to no dependence on the channel length.
publishDate 2022
dc.date.none.fl_str_mv 2022-08-01
2023-03-01T19:57:16Z
2023-03-01T19:57:16Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/article
format article
status_str publishedVersion
dc.identifier.uri.fl_str_mv http://dx.doi.org/10.1016/j.sse.2022.108358
Solid-State Electronics, v. 194.
0038-1101
http://hdl.handle.net/11449/240006
10.1016/j.sse.2022.108358
2-s2.0-85129565421
url http://dx.doi.org/10.1016/j.sse.2022.108358
http://hdl.handle.net/11449/240006
identifier_str_mv Solid-State Electronics, v. 194.
0038-1101
10.1016/j.sse.2022.108358
2-s2.0-85129565421
dc.language.iso.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv Solid-State Electronics
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.source.none.fl_str_mv Scopus
reponame:Repositório Institucional da UNESP
instname:Universidade Estadual Paulista (UNESP)
instacron:UNESP
instname_str Universidade Estadual Paulista (UNESP)
instacron_str UNESP
institution UNESP
reponame_str Repositório Institucional da UNESP
collection Repositório Institucional da UNESP
repository.name.fl_str_mv Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)
repository.mail.fl_str_mv
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