Characterization of thin carbon films produced by the magnetron sputtering technique
Autor(a) principal: | |
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Data de Publicação: | 2016 |
Outros Autores: | , , , , |
Tipo de documento: | Artigo |
Idioma: | eng |
Título da fonte: | Repositório Institucional da UNESP |
Texto Completo: | http://dx.doi.org/10.1590/1980-5373-MR-2015-0058 http://hdl.handle.net/11449/168687 |
Resumo: | Thin carbon films containing both amorphous and crystalline structures were produced by RF magnetron sputtering. The depositions of the carbon films were performed on Co buffer layers previously deposited on c-plane (0001) sapphire substrates. The thin carbon films were characterized by high-resolution transmission electron microscopy (HRTEM), X-ray diffraction (XRD), Raman spectroscopy, energy dispersive X-ray spectroscopy (EDS), and field emission scanning electron microscope (FEG-SEM). The Raman spectra confirmed the presence of amorphous and crystalline structures by the existence of an intense D band separated from the G band, indicating early stages of crystallization. The interplanar distance corresponding to the graphite structures was determined by using HRTEM micrographs. |
id |
UNSP_f40425504551f53323693870367f85dc |
---|---|
oai_identifier_str |
oai:repositorio.unesp.br:11449/168687 |
network_acronym_str |
UNSP |
network_name_str |
Repositório Institucional da UNESP |
repository_id_str |
2946 |
spelling |
Characterization of thin carbon films produced by the magnetron sputtering techniqueCarbon filmsGrapheneGraphiteSputtered carbonThin carbon films containing both amorphous and crystalline structures were produced by RF magnetron sputtering. The depositions of the carbon films were performed on Co buffer layers previously deposited on c-plane (0001) sapphire substrates. The thin carbon films were characterized by high-resolution transmission electron microscopy (HRTEM), X-ray diffraction (XRD), Raman spectroscopy, energy dispersive X-ray spectroscopy (EDS), and field emission scanning electron microscope (FEG-SEM). The Raman spectra confirmed the presence of amorphous and crystalline structures by the existence of an intense D band separated from the G band, indicating early stages of crystallization. The interplanar distance corresponding to the graphite structures was determined by using HRTEM micrographs.Nuclear and Energy Research InstituteFaculty of Technology of São Paulo FATEC-SPInstitute of Physics University of São Paulo- USPInstitute of Chemistry São Paulo State University- UNESPInstitute of Chemistry São Paulo State University- UNESPNuclear and Energy Research InstituteFATEC-SPUniversidade de São Paulo (USP)Universidade Estadual Paulista (Unesp)Costa E Silva, Danilo LopesPires Kassab, Luciana ReyesMartinelli, Jose RobertoDos Santos, Antonio DominguesLima Ribeiro, Sidney José [UNESP]Dos Santos, Moliria Vieira [UNESP]2018-12-11T16:42:32Z2018-12-11T16:42:32Z2016-05-01info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/article669-672application/pdfhttp://dx.doi.org/10.1590/1980-5373-MR-2015-0058Materials Research, v. 19, n. 3, p. 669-672, 2016.1516-1439http://hdl.handle.net/11449/16868710.1590/1980-5373-MR-2015-0058S1516-143920160003006692-s2.0-84970946818S1516-14392016000300669.pdfScopusreponame:Repositório Institucional da UNESPinstname:Universidade Estadual Paulista (UNESP)instacron:UNESPengMaterials Research0,398info:eu-repo/semantics/openAccess2023-10-07T06:09:27Zoai:repositorio.unesp.br:11449/168687Repositório InstitucionalPUBhttp://repositorio.unesp.br/oai/requestopendoar:29462024-08-05T14:17:12.063460Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)false |
dc.title.none.fl_str_mv |
Characterization of thin carbon films produced by the magnetron sputtering technique |
title |
Characterization of thin carbon films produced by the magnetron sputtering technique |
spellingShingle |
Characterization of thin carbon films produced by the magnetron sputtering technique Costa E Silva, Danilo Lopes Carbon films Graphene Graphite Sputtered carbon |
title_short |
Characterization of thin carbon films produced by the magnetron sputtering technique |
title_full |
Characterization of thin carbon films produced by the magnetron sputtering technique |
title_fullStr |
Characterization of thin carbon films produced by the magnetron sputtering technique |
title_full_unstemmed |
Characterization of thin carbon films produced by the magnetron sputtering technique |
title_sort |
Characterization of thin carbon films produced by the magnetron sputtering technique |
author |
Costa E Silva, Danilo Lopes |
author_facet |
Costa E Silva, Danilo Lopes Pires Kassab, Luciana Reyes Martinelli, Jose Roberto Dos Santos, Antonio Domingues Lima Ribeiro, Sidney José [UNESP] Dos Santos, Moliria Vieira [UNESP] |
author_role |
author |
author2 |
Pires Kassab, Luciana Reyes Martinelli, Jose Roberto Dos Santos, Antonio Domingues Lima Ribeiro, Sidney José [UNESP] Dos Santos, Moliria Vieira [UNESP] |
author2_role |
author author author author author |
dc.contributor.none.fl_str_mv |
Nuclear and Energy Research Institute FATEC-SP Universidade de São Paulo (USP) Universidade Estadual Paulista (Unesp) |
dc.contributor.author.fl_str_mv |
Costa E Silva, Danilo Lopes Pires Kassab, Luciana Reyes Martinelli, Jose Roberto Dos Santos, Antonio Domingues Lima Ribeiro, Sidney José [UNESP] Dos Santos, Moliria Vieira [UNESP] |
dc.subject.por.fl_str_mv |
Carbon films Graphene Graphite Sputtered carbon |
topic |
Carbon films Graphene Graphite Sputtered carbon |
description |
Thin carbon films containing both amorphous and crystalline structures were produced by RF magnetron sputtering. The depositions of the carbon films were performed on Co buffer layers previously deposited on c-plane (0001) sapphire substrates. The thin carbon films were characterized by high-resolution transmission electron microscopy (HRTEM), X-ray diffraction (XRD), Raman spectroscopy, energy dispersive X-ray spectroscopy (EDS), and field emission scanning electron microscope (FEG-SEM). The Raman spectra confirmed the presence of amorphous and crystalline structures by the existence of an intense D band separated from the G band, indicating early stages of crystallization. The interplanar distance corresponding to the graphite structures was determined by using HRTEM micrographs. |
publishDate |
2016 |
dc.date.none.fl_str_mv |
2016-05-01 2018-12-11T16:42:32Z 2018-12-11T16:42:32Z |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/article |
format |
article |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://dx.doi.org/10.1590/1980-5373-MR-2015-0058 Materials Research, v. 19, n. 3, p. 669-672, 2016. 1516-1439 http://hdl.handle.net/11449/168687 10.1590/1980-5373-MR-2015-0058 S1516-14392016000300669 2-s2.0-84970946818 S1516-14392016000300669.pdf |
url |
http://dx.doi.org/10.1590/1980-5373-MR-2015-0058 http://hdl.handle.net/11449/168687 |
identifier_str_mv |
Materials Research, v. 19, n. 3, p. 669-672, 2016. 1516-1439 10.1590/1980-5373-MR-2015-0058 S1516-14392016000300669 2-s2.0-84970946818 S1516-14392016000300669.pdf |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
Materials Research 0,398 |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
669-672 application/pdf |
dc.source.none.fl_str_mv |
Scopus reponame:Repositório Institucional da UNESP instname:Universidade Estadual Paulista (UNESP) instacron:UNESP |
instname_str |
Universidade Estadual Paulista (UNESP) |
instacron_str |
UNESP |
institution |
UNESP |
reponame_str |
Repositório Institucional da UNESP |
collection |
Repositório Institucional da UNESP |
repository.name.fl_str_mv |
Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP) |
repository.mail.fl_str_mv |
|
_version_ |
1808128219050672128 |