Characterization of thin carbon films produced by the magnetron sputtering technique

Detalhes bibliográficos
Autor(a) principal: Costa E Silva, Danilo Lopes
Data de Publicação: 2016
Outros Autores: Pires Kassab, Luciana Reyes, Martinelli, Jose Roberto, Dos Santos, Antonio Domingues, Lima Ribeiro, Sidney José [UNESP], Dos Santos, Moliria Vieira [UNESP]
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Repositório Institucional da UNESP
Texto Completo: http://dx.doi.org/10.1590/1980-5373-MR-2015-0058
http://hdl.handle.net/11449/168687
Resumo: Thin carbon films containing both amorphous and crystalline structures were produced by RF magnetron sputtering. The depositions of the carbon films were performed on Co buffer layers previously deposited on c-plane (0001) sapphire substrates. The thin carbon films were characterized by high-resolution transmission electron microscopy (HRTEM), X-ray diffraction (XRD), Raman spectroscopy, energy dispersive X-ray spectroscopy (EDS), and field emission scanning electron microscope (FEG-SEM). The Raman spectra confirmed the presence of amorphous and crystalline structures by the existence of an intense D band separated from the G band, indicating early stages of crystallization. The interplanar distance corresponding to the graphite structures was determined by using HRTEM micrographs.
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spelling Characterization of thin carbon films produced by the magnetron sputtering techniqueCarbon filmsGrapheneGraphiteSputtered carbonThin carbon films containing both amorphous and crystalline structures were produced by RF magnetron sputtering. The depositions of the carbon films were performed on Co buffer layers previously deposited on c-plane (0001) sapphire substrates. The thin carbon films were characterized by high-resolution transmission electron microscopy (HRTEM), X-ray diffraction (XRD), Raman spectroscopy, energy dispersive X-ray spectroscopy (EDS), and field emission scanning electron microscope (FEG-SEM). The Raman spectra confirmed the presence of amorphous and crystalline structures by the existence of an intense D band separated from the G band, indicating early stages of crystallization. The interplanar distance corresponding to the graphite structures was determined by using HRTEM micrographs.Nuclear and Energy Research InstituteFaculty of Technology of São Paulo FATEC-SPInstitute of Physics University of São Paulo- USPInstitute of Chemistry São Paulo State University- UNESPInstitute of Chemistry São Paulo State University- UNESPNuclear and Energy Research InstituteFATEC-SPUniversidade de São Paulo (USP)Universidade Estadual Paulista (Unesp)Costa E Silva, Danilo LopesPires Kassab, Luciana ReyesMartinelli, Jose RobertoDos Santos, Antonio DominguesLima Ribeiro, Sidney José [UNESP]Dos Santos, Moliria Vieira [UNESP]2018-12-11T16:42:32Z2018-12-11T16:42:32Z2016-05-01info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/article669-672application/pdfhttp://dx.doi.org/10.1590/1980-5373-MR-2015-0058Materials Research, v. 19, n. 3, p. 669-672, 2016.1516-1439http://hdl.handle.net/11449/16868710.1590/1980-5373-MR-2015-0058S1516-143920160003006692-s2.0-84970946818S1516-14392016000300669.pdfScopusreponame:Repositório Institucional da UNESPinstname:Universidade Estadual Paulista (UNESP)instacron:UNESPengMaterials Research0,398info:eu-repo/semantics/openAccess2023-10-07T06:09:27Zoai:repositorio.unesp.br:11449/168687Repositório InstitucionalPUBhttp://repositorio.unesp.br/oai/requestopendoar:29462024-08-05T14:17:12.063460Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)false
dc.title.none.fl_str_mv Characterization of thin carbon films produced by the magnetron sputtering technique
title Characterization of thin carbon films produced by the magnetron sputtering technique
spellingShingle Characterization of thin carbon films produced by the magnetron sputtering technique
Costa E Silva, Danilo Lopes
Carbon films
Graphene
Graphite
Sputtered carbon
title_short Characterization of thin carbon films produced by the magnetron sputtering technique
title_full Characterization of thin carbon films produced by the magnetron sputtering technique
title_fullStr Characterization of thin carbon films produced by the magnetron sputtering technique
title_full_unstemmed Characterization of thin carbon films produced by the magnetron sputtering technique
title_sort Characterization of thin carbon films produced by the magnetron sputtering technique
author Costa E Silva, Danilo Lopes
author_facet Costa E Silva, Danilo Lopes
Pires Kassab, Luciana Reyes
Martinelli, Jose Roberto
Dos Santos, Antonio Domingues
Lima Ribeiro, Sidney José [UNESP]
Dos Santos, Moliria Vieira [UNESP]
author_role author
author2 Pires Kassab, Luciana Reyes
Martinelli, Jose Roberto
Dos Santos, Antonio Domingues
Lima Ribeiro, Sidney José [UNESP]
Dos Santos, Moliria Vieira [UNESP]
author2_role author
author
author
author
author
dc.contributor.none.fl_str_mv Nuclear and Energy Research Institute
FATEC-SP
Universidade de São Paulo (USP)
Universidade Estadual Paulista (Unesp)
dc.contributor.author.fl_str_mv Costa E Silva, Danilo Lopes
Pires Kassab, Luciana Reyes
Martinelli, Jose Roberto
Dos Santos, Antonio Domingues
Lima Ribeiro, Sidney José [UNESP]
Dos Santos, Moliria Vieira [UNESP]
dc.subject.por.fl_str_mv Carbon films
Graphene
Graphite
Sputtered carbon
topic Carbon films
Graphene
Graphite
Sputtered carbon
description Thin carbon films containing both amorphous and crystalline structures were produced by RF magnetron sputtering. The depositions of the carbon films were performed on Co buffer layers previously deposited on c-plane (0001) sapphire substrates. The thin carbon films were characterized by high-resolution transmission electron microscopy (HRTEM), X-ray diffraction (XRD), Raman spectroscopy, energy dispersive X-ray spectroscopy (EDS), and field emission scanning electron microscope (FEG-SEM). The Raman spectra confirmed the presence of amorphous and crystalline structures by the existence of an intense D band separated from the G band, indicating early stages of crystallization. The interplanar distance corresponding to the graphite structures was determined by using HRTEM micrographs.
publishDate 2016
dc.date.none.fl_str_mv 2016-05-01
2018-12-11T16:42:32Z
2018-12-11T16:42:32Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/article
format article
status_str publishedVersion
dc.identifier.uri.fl_str_mv http://dx.doi.org/10.1590/1980-5373-MR-2015-0058
Materials Research, v. 19, n. 3, p. 669-672, 2016.
1516-1439
http://hdl.handle.net/11449/168687
10.1590/1980-5373-MR-2015-0058
S1516-14392016000300669
2-s2.0-84970946818
S1516-14392016000300669.pdf
url http://dx.doi.org/10.1590/1980-5373-MR-2015-0058
http://hdl.handle.net/11449/168687
identifier_str_mv Materials Research, v. 19, n. 3, p. 669-672, 2016.
1516-1439
10.1590/1980-5373-MR-2015-0058
S1516-14392016000300669
2-s2.0-84970946818
S1516-14392016000300669.pdf
dc.language.iso.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv Materials Research
0,398
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv 669-672
application/pdf
dc.source.none.fl_str_mv Scopus
reponame:Repositório Institucional da UNESP
instname:Universidade Estadual Paulista (UNESP)
instacron:UNESP
instname_str Universidade Estadual Paulista (UNESP)
instacron_str UNESP
institution UNESP
reponame_str Repositório Institucional da UNESP
collection Repositório Institucional da UNESP
repository.name.fl_str_mv Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)
repository.mail.fl_str_mv
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