Plasma deposition of amorphous carbon films from CH4 atmospheres highly diluted in Ar

Detalhes bibliográficos
Autor(a) principal: Jacobsohn, L. G.
Data de Publicação: 2002
Outros Autores: Capote, G., Cruz, N. C., Zanatta, A. R., Freire, Jr.
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Repositório Institucional da UNESP
Texto Completo: http://dx.doi.org/10.1016/S0040-6090(02)00756-3
http://hdl.handle.net/11449/230926
Resumo: The deposition, structure and mechanical properties of hydrogenated amorphous carbon films grown in highly Ar-diluted CH4 atmospheres were investigated for a total pressure of 13 Pa. Films were investigated as a function of the self-bias voltage between -50 and -500 V for two extreme CH4 partial pressures, 2 and 100%. For the self-bias voltage that optimizes the diamond-like properties of the films, -350 V, we carried out an investigation as a function of the Ar partial pressure, which ranged from 0 to 99%. The deposition rate and the hydrogen content decreased with progressive Ar dilution. The density and the compressive internal stress are nearly constant. The hardness decreased for Ar-rich precursor atmospheres. The surface roughness was independent of the CH4 partial pressure. © 2002 Elsevier Science B.V. All rights reserved.
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spelling Plasma deposition of amorphous carbon films from CH4 atmospheres highly diluted in ArAmorphous hydrogenated carbonMethaneNoble gasesPlasma enhanced CVDThe deposition, structure and mechanical properties of hydrogenated amorphous carbon films grown in highly Ar-diluted CH4 atmospheres were investigated for a total pressure of 13 Pa. Films were investigated as a function of the self-bias voltage between -50 and -500 V for two extreme CH4 partial pressures, 2 and 100%. For the self-bias voltage that optimizes the diamond-like properties of the films, -350 V, we carried out an investigation as a function of the Ar partial pressure, which ranged from 0 to 99%. The deposition rate and the hydrogen content decreased with progressive Ar dilution. The density and the compressive internal stress are nearly constant. The hardness decreased for Ar-rich precursor atmospheres. The surface roughness was independent of the CH4 partial pressure. © 2002 Elsevier Science B.V. All rights reserved.Departamento De Física Pontificia Universidade Católica Do Rio De Janeiro, R. Marques de Sao Vicente, 225-Gavea, 22452-970 Rio de Janeiro, RJDepartamento De Física E Química Faculdade De Engenharia De Guaratinguetá, 12516-410 Guaratingueta, SPInstituto De Física De São Carlos Universidade De São Paulo, Caixa Postal 369, 13560-250 Sao Carlos, SPPontificia Universidade Católica Do Rio De JaneiroFaculdade De Engenharia De GuaratinguetáUniversidade de São Paulo (USP)Jacobsohn, L. G.Capote, G.Cruz, N. C.Zanatta, A. R.Freire, Jr.2022-04-29T08:42:47Z2022-04-29T08:42:47Z2002-11-01info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/article46-53http://dx.doi.org/10.1016/S0040-6090(02)00756-3Thin Solid Films, v. 419, n. 1-2, p. 46-53, 2002.0040-6090http://hdl.handle.net/11449/23092610.1016/S0040-6090(02)00756-32-s2.0-0036849858Scopusreponame:Repositório Institucional da UNESPinstname:Universidade Estadual Paulista (UNESP)instacron:UNESPengThin Solid Filmsinfo:eu-repo/semantics/openAccess2024-07-01T20:52:08Zoai:repositorio.unesp.br:11449/230926Repositório InstitucionalPUBhttp://repositorio.unesp.br/oai/requestopendoar:29462024-08-05T16:26:04.135782Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)false
dc.title.none.fl_str_mv Plasma deposition of amorphous carbon films from CH4 atmospheres highly diluted in Ar
title Plasma deposition of amorphous carbon films from CH4 atmospheres highly diluted in Ar
spellingShingle Plasma deposition of amorphous carbon films from CH4 atmospheres highly diluted in Ar
Jacobsohn, L. G.
Amorphous hydrogenated carbon
Methane
Noble gases
Plasma enhanced CVD
title_short Plasma deposition of amorphous carbon films from CH4 atmospheres highly diluted in Ar
title_full Plasma deposition of amorphous carbon films from CH4 atmospheres highly diluted in Ar
title_fullStr Plasma deposition of amorphous carbon films from CH4 atmospheres highly diluted in Ar
title_full_unstemmed Plasma deposition of amorphous carbon films from CH4 atmospheres highly diluted in Ar
title_sort Plasma deposition of amorphous carbon films from CH4 atmospheres highly diluted in Ar
author Jacobsohn, L. G.
author_facet Jacobsohn, L. G.
Capote, G.
Cruz, N. C.
Zanatta, A. R.
Freire, Jr.
author_role author
author2 Capote, G.
Cruz, N. C.
Zanatta, A. R.
Freire, Jr.
author2_role author
author
author
author
dc.contributor.none.fl_str_mv Pontificia Universidade Católica Do Rio De Janeiro
Faculdade De Engenharia De Guaratinguetá
Universidade de São Paulo (USP)
dc.contributor.author.fl_str_mv Jacobsohn, L. G.
Capote, G.
Cruz, N. C.
Zanatta, A. R.
Freire, Jr.
dc.subject.por.fl_str_mv Amorphous hydrogenated carbon
Methane
Noble gases
Plasma enhanced CVD
topic Amorphous hydrogenated carbon
Methane
Noble gases
Plasma enhanced CVD
description The deposition, structure and mechanical properties of hydrogenated amorphous carbon films grown in highly Ar-diluted CH4 atmospheres were investigated for a total pressure of 13 Pa. Films were investigated as a function of the self-bias voltage between -50 and -500 V for two extreme CH4 partial pressures, 2 and 100%. For the self-bias voltage that optimizes the diamond-like properties of the films, -350 V, we carried out an investigation as a function of the Ar partial pressure, which ranged from 0 to 99%. The deposition rate and the hydrogen content decreased with progressive Ar dilution. The density and the compressive internal stress are nearly constant. The hardness decreased for Ar-rich precursor atmospheres. The surface roughness was independent of the CH4 partial pressure. © 2002 Elsevier Science B.V. All rights reserved.
publishDate 2002
dc.date.none.fl_str_mv 2002-11-01
2022-04-29T08:42:47Z
2022-04-29T08:42:47Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/article
format article
status_str publishedVersion
dc.identifier.uri.fl_str_mv http://dx.doi.org/10.1016/S0040-6090(02)00756-3
Thin Solid Films, v. 419, n. 1-2, p. 46-53, 2002.
0040-6090
http://hdl.handle.net/11449/230926
10.1016/S0040-6090(02)00756-3
2-s2.0-0036849858
url http://dx.doi.org/10.1016/S0040-6090(02)00756-3
http://hdl.handle.net/11449/230926
identifier_str_mv Thin Solid Films, v. 419, n. 1-2, p. 46-53, 2002.
0040-6090
10.1016/S0040-6090(02)00756-3
2-s2.0-0036849858
dc.language.iso.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv Thin Solid Films
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv 46-53
dc.source.none.fl_str_mv Scopus
reponame:Repositório Institucional da UNESP
instname:Universidade Estadual Paulista (UNESP)
instacron:UNESP
instname_str Universidade Estadual Paulista (UNESP)
instacron_str UNESP
institution UNESP
reponame_str Repositório Institucional da UNESP
collection Repositório Institucional da UNESP
repository.name.fl_str_mv Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)
repository.mail.fl_str_mv
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