The S chart with variable charting statistic to control bi and trivariate processes
Autor(a) principal: | |
---|---|
Data de Publicação: | 2017 |
Outros Autores: | |
Tipo de documento: | Artigo |
Idioma: | eng |
Título da fonte: | Repositório Institucional da UNESP |
Texto Completo: | http://dx.doi.org/10.1016/j.cie.2017.09.001 http://hdl.handle.net/11449/175154 |
Resumo: | In this article, we propose the S chart with variable charting statistic to control the covariance matrix as an alternative to the use of the bivariate |S| chart and the trivariate VMAX chart. As usual, samples are regularly taken from the process, but only one of the two quality characteristics, X or Y, is measured and only one of the two statistics (Sx,Sy) is computed. The statistic in use and the position of the current sample point on the chart define the statistic for the next sample. If the current point is the standard deviation of the X values and it is in the central region (warning region), then the statistic for the next sample will be the standard deviation of the Y values (X values). If the current point is the standard deviation of the Y values and it is in the central region (warning region), then the statistic for the next sample will be the standard deviation of the X values (Y values). For the trivariate case, when the sample point falls in the central region, the charting statistic for the next sample changes from Sx to Sy, or from Sy to Sz, or yet, from Sz to Sx. The VCS chart is not only operationally simpler than the bivariate |S| and trivariate VMAX charts but also signals faster even with less measurements per sample. |
id |
UNSP_f677af1fea19f64d59d4f45a3fd08969 |
---|---|
oai_identifier_str |
oai:repositorio.unesp.br:11449/175154 |
network_acronym_str |
UNSP |
network_name_str |
Repositório Institucional da UNESP |
repository_id_str |
2946 |
spelling |
The S chart with variable charting statistic to control bi and trivariate processesBivariate processesS chartTrivariate processesVariable charting statisticVMAX chart|S| chartIn this article, we propose the S chart with variable charting statistic to control the covariance matrix as an alternative to the use of the bivariate |S| chart and the trivariate VMAX chart. As usual, samples are regularly taken from the process, but only one of the two quality characteristics, X or Y, is measured and only one of the two statistics (Sx,Sy) is computed. The statistic in use and the position of the current sample point on the chart define the statistic for the next sample. If the current point is the standard deviation of the X values and it is in the central region (warning region), then the statistic for the next sample will be the standard deviation of the Y values (X values). If the current point is the standard deviation of the Y values and it is in the central region (warning region), then the statistic for the next sample will be the standard deviation of the X values (Y values). For the trivariate case, when the sample point falls in the central region, the charting statistic for the next sample changes from Sx to Sy, or from Sy to Sz, or yet, from Sz to Sx. The VCS chart is not only operationally simpler than the bivariate |S| and trivariate VMAX charts but also signals faster even with less measurements per sample.Universidade Estadual Paulista (Unesp) Faculdade de Engenharia Câmpus de Guaratinguetá Departamento de ProduçãoUniversidade Estadual Paulista (Unesp) Faculdade de Engenharia Câmpus de Guaratinguetá Departamento de Engenharia ElétricaUniversidade Estadual Paulista (Unesp) Faculdade de Engenharia Câmpus de Guaratinguetá Departamento de ProduçãoUniversidade Estadual Paulista (Unesp) Faculdade de Engenharia Câmpus de Guaratinguetá Departamento de Engenharia ElétricaUniversidade Estadual Paulista (Unesp)Costa, Antonio Fernando Branco [UNESP]Neto, Antonio Faria [UNESP]2018-12-11T17:14:37Z2018-12-11T17:14:37Z2017-11-01info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/article27-34application/pdfhttp://dx.doi.org/10.1016/j.cie.2017.09.001Computers and Industrial Engineering, v. 113, p. 27-34.0360-8352http://hdl.handle.net/11449/17515410.1016/j.cie.2017.09.0012-s2.0-850291629742-s2.0-85029162974.pdfScopusreponame:Repositório Institucional da UNESPinstname:Universidade Estadual Paulista (UNESP)instacron:UNESPengComputers and Industrial Engineering1,463info:eu-repo/semantics/openAccess2024-07-02T17:37:07Zoai:repositorio.unesp.br:11449/175154Repositório InstitucionalPUBhttp://repositorio.unesp.br/oai/requestopendoar:29462024-08-05T18:09:02.044464Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)false |
dc.title.none.fl_str_mv |
The S chart with variable charting statistic to control bi and trivariate processes |
title |
The S chart with variable charting statistic to control bi and trivariate processes |
spellingShingle |
The S chart with variable charting statistic to control bi and trivariate processes Costa, Antonio Fernando Branco [UNESP] Bivariate processes S chart Trivariate processes Variable charting statistic VMAX chart |S| chart |
title_short |
The S chart with variable charting statistic to control bi and trivariate processes |
title_full |
The S chart with variable charting statistic to control bi and trivariate processes |
title_fullStr |
The S chart with variable charting statistic to control bi and trivariate processes |
title_full_unstemmed |
The S chart with variable charting statistic to control bi and trivariate processes |
title_sort |
The S chart with variable charting statistic to control bi and trivariate processes |
author |
Costa, Antonio Fernando Branco [UNESP] |
author_facet |
Costa, Antonio Fernando Branco [UNESP] Neto, Antonio Faria [UNESP] |
author_role |
author |
author2 |
Neto, Antonio Faria [UNESP] |
author2_role |
author |
dc.contributor.none.fl_str_mv |
Universidade Estadual Paulista (Unesp) |
dc.contributor.author.fl_str_mv |
Costa, Antonio Fernando Branco [UNESP] Neto, Antonio Faria [UNESP] |
dc.subject.por.fl_str_mv |
Bivariate processes S chart Trivariate processes Variable charting statistic VMAX chart |S| chart |
topic |
Bivariate processes S chart Trivariate processes Variable charting statistic VMAX chart |S| chart |
description |
In this article, we propose the S chart with variable charting statistic to control the covariance matrix as an alternative to the use of the bivariate |S| chart and the trivariate VMAX chart. As usual, samples are regularly taken from the process, but only one of the two quality characteristics, X or Y, is measured and only one of the two statistics (Sx,Sy) is computed. The statistic in use and the position of the current sample point on the chart define the statistic for the next sample. If the current point is the standard deviation of the X values and it is in the central region (warning region), then the statistic for the next sample will be the standard deviation of the Y values (X values). If the current point is the standard deviation of the Y values and it is in the central region (warning region), then the statistic for the next sample will be the standard deviation of the X values (Y values). For the trivariate case, when the sample point falls in the central region, the charting statistic for the next sample changes from Sx to Sy, or from Sy to Sz, or yet, from Sz to Sx. The VCS chart is not only operationally simpler than the bivariate |S| and trivariate VMAX charts but also signals faster even with less measurements per sample. |
publishDate |
2017 |
dc.date.none.fl_str_mv |
2017-11-01 2018-12-11T17:14:37Z 2018-12-11T17:14:37Z |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/article |
format |
article |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://dx.doi.org/10.1016/j.cie.2017.09.001 Computers and Industrial Engineering, v. 113, p. 27-34. 0360-8352 http://hdl.handle.net/11449/175154 10.1016/j.cie.2017.09.001 2-s2.0-85029162974 2-s2.0-85029162974.pdf |
url |
http://dx.doi.org/10.1016/j.cie.2017.09.001 http://hdl.handle.net/11449/175154 |
identifier_str_mv |
Computers and Industrial Engineering, v. 113, p. 27-34. 0360-8352 10.1016/j.cie.2017.09.001 2-s2.0-85029162974 2-s2.0-85029162974.pdf |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
Computers and Industrial Engineering 1,463 |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
27-34 application/pdf |
dc.source.none.fl_str_mv |
Scopus reponame:Repositório Institucional da UNESP instname:Universidade Estadual Paulista (UNESP) instacron:UNESP |
instname_str |
Universidade Estadual Paulista (UNESP) |
instacron_str |
UNESP |
institution |
UNESP |
reponame_str |
Repositório Institucional da UNESP |
collection |
Repositório Institucional da UNESP |
repository.name.fl_str_mv |
Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP) |
repository.mail.fl_str_mv |
|
_version_ |
1808128902528237568 |