Methods and metrics for reliability assessment

Detalhes bibliográficos
Autor(a) principal: Naviner, Lirida Alves de Barros
Data de Publicação: 2009
Outros Autores: Naviner, Jean-François, Franco, Denis Teixeira, Vasconcelos, Maï Correia de
Tipo de documento: Artigo de conferência
Idioma: eng
Título da fonte: Repositório Institucional da FURG (RI FURG)
Texto Completo: http://repositorio.furg.br/handle/1/1687
Resumo: This paper deals with digital VLSI design aspects related to reliability. The focus is on the problem of reliability evaluation in combinational logic circuits.We present some methods for this evaluation that can be easily integrated in a tradidional design flow. Also we describe suitable metrics for performance estimation of concurrent error detection schemes.
id FURG_aa0a42ef3e02a7c21441c600a712901d
oai_identifier_str oai:repositorio.furg.br:1/1687
network_acronym_str FURG
network_name_str Repositório Institucional da FURG (RI FURG)
repository_id_str
spelling Methods and metrics for reliability assessmentReliabilityFault toleranceCombinational logicThis paper deals with digital VLSI design aspects related to reliability. The focus is on the problem of reliability evaluation in combinational logic circuits.We present some methods for this evaluation that can be easily integrated in a tradidional design flow. Also we describe suitable metrics for performance estimation of concurrent error detection schemes.2012-01-04T13:17:06Z2012-01-04T13:17:06Z2009info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/conferenceObjectapplication/pdfNAVINER, Lirida Alves de Barros. et al. Methods and metrics for reliability assessment. In: Fault-Tolerant Distributed Algorithms on VLSI Chips, v.1, p. 1-14, 2009. Disponível em: <http://drops.dagstuhl.de/volltexte/2009/1925/pdf/08371.NavinerLirida.Paper.1925.pdf>. Acesso em: 13 dez. 2011.http://repositorio.furg.br/handle/1/1687engNaviner, Lirida Alves de BarrosNaviner, Jean-FrançoisFranco, Denis TeixeiraVasconcelos, Maï Correia deinfo:eu-repo/semantics/openAccessreponame:Repositório Institucional da FURG (RI FURG)instname:Universidade Federal do Rio Grande (FURG)instacron:FURG2012-01-04T13:17:06Zoai:repositorio.furg.br:1/1687Repositório InstitucionalPUBhttps://repositorio.furg.br/oai/request || http://200.19.254.174/oai/requestopendoar:2012-01-04T13:17:06Repositório Institucional da FURG (RI FURG) - Universidade Federal do Rio Grande (FURG)false
dc.title.none.fl_str_mv Methods and metrics for reliability assessment
title Methods and metrics for reliability assessment
spellingShingle Methods and metrics for reliability assessment
Naviner, Lirida Alves de Barros
Reliability
Fault tolerance
Combinational logic
title_short Methods and metrics for reliability assessment
title_full Methods and metrics for reliability assessment
title_fullStr Methods and metrics for reliability assessment
title_full_unstemmed Methods and metrics for reliability assessment
title_sort Methods and metrics for reliability assessment
author Naviner, Lirida Alves de Barros
author_facet Naviner, Lirida Alves de Barros
Naviner, Jean-François
Franco, Denis Teixeira
Vasconcelos, Maï Correia de
author_role author
author2 Naviner, Jean-François
Franco, Denis Teixeira
Vasconcelos, Maï Correia de
author2_role author
author
author
dc.contributor.author.fl_str_mv Naviner, Lirida Alves de Barros
Naviner, Jean-François
Franco, Denis Teixeira
Vasconcelos, Maï Correia de
dc.subject.por.fl_str_mv Reliability
Fault tolerance
Combinational logic
topic Reliability
Fault tolerance
Combinational logic
description This paper deals with digital VLSI design aspects related to reliability. The focus is on the problem of reliability evaluation in combinational logic circuits.We present some methods for this evaluation that can be easily integrated in a tradidional design flow. Also we describe suitable metrics for performance estimation of concurrent error detection schemes.
publishDate 2009
dc.date.none.fl_str_mv 2009
2012-01-04T13:17:06Z
2012-01-04T13:17:06Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/conferenceObject
format conferenceObject
status_str publishedVersion
dc.identifier.uri.fl_str_mv NAVINER, Lirida Alves de Barros. et al. Methods and metrics for reliability assessment. In: Fault-Tolerant Distributed Algorithms on VLSI Chips, v.1, p. 1-14, 2009. Disponível em: <http://drops.dagstuhl.de/volltexte/2009/1925/pdf/08371.NavinerLirida.Paper.1925.pdf>. Acesso em: 13 dez. 2011.
http://repositorio.furg.br/handle/1/1687
identifier_str_mv NAVINER, Lirida Alves de Barros. et al. Methods and metrics for reliability assessment. In: Fault-Tolerant Distributed Algorithms on VLSI Chips, v.1, p. 1-14, 2009. Disponível em: <http://drops.dagstuhl.de/volltexte/2009/1925/pdf/08371.NavinerLirida.Paper.1925.pdf>. Acesso em: 13 dez. 2011.
url http://repositorio.furg.br/handle/1/1687
dc.language.iso.fl_str_mv eng
language eng
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv application/pdf
dc.source.none.fl_str_mv reponame:Repositório Institucional da FURG (RI FURG)
instname:Universidade Federal do Rio Grande (FURG)
instacron:FURG
instname_str Universidade Federal do Rio Grande (FURG)
instacron_str FURG
institution FURG
reponame_str Repositório Institucional da FURG (RI FURG)
collection Repositório Institucional da FURG (RI FURG)
repository.name.fl_str_mv Repositório Institucional da FURG (RI FURG) - Universidade Federal do Rio Grande (FURG)
repository.mail.fl_str_mv
_version_ 1813187254243295232

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