Band gaps of wurtzite ScxGa1-xN alloys
Autor(a) principal: | |
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Data de Publicação: | 2015 |
Outros Autores: | , , , , , , , |
Tipo de documento: | Artigo |
Idioma: | eng |
Título da fonte: | Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) |
Texto Completo: | http://hdl.handle.net/10773/19813 |
Resumo: | Optical transmittance measurements on epitaxial, phase-pure, wurtzite-structure ScxGa1-xN films with 0 <= x <= 0.26 showed that their direct optical band gaps increased from 3.33 eV to 3.89 eV with increasing x, in agreement with theory. These films contained I-1- and I-2-type stacking faults. However, the direct optical band gaps decreased from 3.37 eV to 3.26 eV for ScxGa1-xN films, which additionally contained nanoscale lamellar inclusions of the zinc-blende phase, as revealed by aberration-corrected scanning transmission electron microscopy. Therefore, we conclude that the apparent reduction in ScxGa1-xN band gaps with increasing x is an artefact resulting from the presence of nanoscale zinc-blende inclusions. (C) 2015 AIP Publishing LLC. |
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Band gaps of wurtzite ScxGa1-xN alloysLIGHT-EMITTING-DIODESELECTRONIC-PROPERTIESCUBIC GANSCGANFILMSSCNMICROSTRUCTURESPECTRASCASOptical transmittance measurements on epitaxial, phase-pure, wurtzite-structure ScxGa1-xN films with 0 <= x <= 0.26 showed that their direct optical band gaps increased from 3.33 eV to 3.89 eV with increasing x, in agreement with theory. These films contained I-1- and I-2-type stacking faults. However, the direct optical band gaps decreased from 3.37 eV to 3.26 eV for ScxGa1-xN films, which additionally contained nanoscale lamellar inclusions of the zinc-blende phase, as revealed by aberration-corrected scanning transmission electron microscopy. Therefore, we conclude that the apparent reduction in ScxGa1-xN band gaps with increasing x is an artefact resulting from the presence of nanoscale zinc-blende inclusions. (C) 2015 AIP Publishing LLC.AMER INST PHYSICS2017-12-07T19:25:44Z2015-01-01T00:00:00Z2015info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articleapplication/pdfhttp://hdl.handle.net/10773/19813eng0003-695110.1063/1.4916679Tsui, H. C. L.Goff, L. E.Rhode, S. K.Pereira, S.Beere, H. E.Farrer, I.Nicoll, C. A.Ritchie, D. A.Moram, M. A.info:eu-repo/semantics/openAccessreponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãoinstacron:RCAAP2024-02-22T11:38:37Zoai:ria.ua.pt:10773/19813Portal AgregadorONGhttps://www.rcaap.pt/oai/openaireopendoar:71602024-03-20T02:54:33.039068Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãofalse |
dc.title.none.fl_str_mv |
Band gaps of wurtzite ScxGa1-xN alloys |
title |
Band gaps of wurtzite ScxGa1-xN alloys |
spellingShingle |
Band gaps of wurtzite ScxGa1-xN alloys Tsui, H. C. L. LIGHT-EMITTING-DIODES ELECTRONIC-PROPERTIES CUBIC GAN SCGAN FILMS SCN MICROSTRUCTURE SPECTRA SCAS |
title_short |
Band gaps of wurtzite ScxGa1-xN alloys |
title_full |
Band gaps of wurtzite ScxGa1-xN alloys |
title_fullStr |
Band gaps of wurtzite ScxGa1-xN alloys |
title_full_unstemmed |
Band gaps of wurtzite ScxGa1-xN alloys |
title_sort |
Band gaps of wurtzite ScxGa1-xN alloys |
author |
Tsui, H. C. L. |
author_facet |
Tsui, H. C. L. Goff, L. E. Rhode, S. K. Pereira, S. Beere, H. E. Farrer, I. Nicoll, C. A. Ritchie, D. A. Moram, M. A. |
author_role |
author |
author2 |
Goff, L. E. Rhode, S. K. Pereira, S. Beere, H. E. Farrer, I. Nicoll, C. A. Ritchie, D. A. Moram, M. A. |
author2_role |
author author author author author author author author |
dc.contributor.author.fl_str_mv |
Tsui, H. C. L. Goff, L. E. Rhode, S. K. Pereira, S. Beere, H. E. Farrer, I. Nicoll, C. A. Ritchie, D. A. Moram, M. A. |
dc.subject.por.fl_str_mv |
LIGHT-EMITTING-DIODES ELECTRONIC-PROPERTIES CUBIC GAN SCGAN FILMS SCN MICROSTRUCTURE SPECTRA SCAS |
topic |
LIGHT-EMITTING-DIODES ELECTRONIC-PROPERTIES CUBIC GAN SCGAN FILMS SCN MICROSTRUCTURE SPECTRA SCAS |
description |
Optical transmittance measurements on epitaxial, phase-pure, wurtzite-structure ScxGa1-xN films with 0 <= x <= 0.26 showed that their direct optical band gaps increased from 3.33 eV to 3.89 eV with increasing x, in agreement with theory. These films contained I-1- and I-2-type stacking faults. However, the direct optical band gaps decreased from 3.37 eV to 3.26 eV for ScxGa1-xN films, which additionally contained nanoscale lamellar inclusions of the zinc-blende phase, as revealed by aberration-corrected scanning transmission electron microscopy. Therefore, we conclude that the apparent reduction in ScxGa1-xN band gaps with increasing x is an artefact resulting from the presence of nanoscale zinc-blende inclusions. (C) 2015 AIP Publishing LLC. |
publishDate |
2015 |
dc.date.none.fl_str_mv |
2015-01-01T00:00:00Z 2015 2017-12-07T19:25:44Z |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/article |
format |
article |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://hdl.handle.net/10773/19813 |
url |
http://hdl.handle.net/10773/19813 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
0003-6951 10.1063/1.4916679 |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
application/pdf |
dc.publisher.none.fl_str_mv |
AMER INST PHYSICS |
publisher.none.fl_str_mv |
AMER INST PHYSICS |
dc.source.none.fl_str_mv |
reponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação instacron:RCAAP |
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Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação |
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RCAAP |
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RCAAP |
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Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) |
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Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) |
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Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação |
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1799137598639177728 |