Implementation of Active Inductors with Oxide Thin-Film Transistors and Integration into Oscillator Circuits
Autor(a) principal: | |
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Data de Publicação: | 2022 |
Tipo de documento: | Dissertação |
Idioma: | eng |
Título da fonte: | Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) |
Texto Completo: | http://hdl.handle.net/10362/138705 |
Resumo: | This work aims to investigate the replacement of passive inductors with active inductors (aLs) using amorphous indium-gallium-zinc oxide (a-IGZO) thin-film transistors (TFT). The goal of aL is to emulate the inductive behavior associated with passive inductors. The advantage of the former is the small die area, high quality-factor, inductance, and self-resonant frequency tunability. A simple grounded n-type aL was used to replace the inductor in an inductance-capacitance (LC) oscillator. The LC oscillator is constituted by a cross-couple pair and two aLs. The simple grounded aL configuration was used due to a-IGZO being an n-type semiconductor and also owing to its simplicity, being only built with two transistors and two current sources. These factors allied with the lack of a counterpart p- type amorphous oxide semiconductor make this aL a good fit for the proposed work. The oscillator was simulated using metal-oxide-semiconductor field-effect transistor (MOSFET) and TFTs. The former was simulated with a channel length of 1 μm and the latter was simulated with two channel-lengths 10 μm and 20 μm. The MOS technology simulations were used as a proof-of-concept since these have more accurate models. The oscillation frequency (fOSC) and output peak-to-peak voltage swing (Vpp) were analyzed for both technologies. Temperature sensibility, and phase noise were also examined for the MOS technology. The MOS oscillators with three different aLs presented an fOSC between 917 MHz and 2.08 GHz, power consumption from 21 mW to 80 mW, a Vpp of 613 mV up until 1.78 V with a power supply voltage (VDD) of 5V. The maximum phase noise was - 92.86 dBc/Hz at an offset of 1 MHz. A 10 μm a-IGZO TFTs oscillator produced an fOSC of 1.21 MHz and a Vpp of 3.83 V, dissipating 533 μW for a VDD of 10V. |
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Implementation of Active Inductors with Oxide Thin-Film Transistors and Integration into Oscillator Circuitsa-IGZO TFTActive inductor (aL)Simple grounded aLCross-couple pair LC-oscillatorDomínio/Área Científica::Engenharia e Tecnologia::NanotecnologiaThis work aims to investigate the replacement of passive inductors with active inductors (aLs) using amorphous indium-gallium-zinc oxide (a-IGZO) thin-film transistors (TFT). The goal of aL is to emulate the inductive behavior associated with passive inductors. The advantage of the former is the small die area, high quality-factor, inductance, and self-resonant frequency tunability. A simple grounded n-type aL was used to replace the inductor in an inductance-capacitance (LC) oscillator. The LC oscillator is constituted by a cross-couple pair and two aLs. The simple grounded aL configuration was used due to a-IGZO being an n-type semiconductor and also owing to its simplicity, being only built with two transistors and two current sources. These factors allied with the lack of a counterpart p- type amorphous oxide semiconductor make this aL a good fit for the proposed work. The oscillator was simulated using metal-oxide-semiconductor field-effect transistor (MOSFET) and TFTs. The former was simulated with a channel length of 1 μm and the latter was simulated with two channel-lengths 10 μm and 20 μm. The MOS technology simulations were used as a proof-of-concept since these have more accurate models. The oscillation frequency (fOSC) and output peak-to-peak voltage swing (Vpp) were analyzed for both technologies. Temperature sensibility, and phase noise were also examined for the MOS technology. The MOS oscillators with three different aLs presented an fOSC between 917 MHz and 2.08 GHz, power consumption from 21 mW to 80 mW, a Vpp of 613 mV up until 1.78 V with a power supply voltage (VDD) of 5V. The maximum phase noise was - 92.86 dBc/Hz at an offset of 1 MHz. A 10 μm a-IGZO TFTs oscillator produced an fOSC of 1.21 MHz and a Vpp of 3.83 V, dissipating 533 μW for a VDD of 10V.Este trabalho tem como objetivo investigar a substituição de indutores passivos por bobines ativas (aLs), utilizando transístores de filme fino (TFT) de óxido de índio-gálio-zinco amorfo (a-IGZO). O objetivo do aL é emular o comportamento associado aos indutores passivos. As vantagens dos aLs são: pequena área de implementação, alto fator de qualidade e indutância e frequência de ressonância ajustáveis. Um aL simples conectado à massa foi usado para substituir a bobine no oscilador de indutância- capacitância (oscilador LC). O oscilador LC é constituído por um par cruzado e dois aLs. A utilização da configuração do aL simples conectado à massa deve-se ao facto do a-IGZO ser um semiconductor tipo-n, e à sua simplicidade. Este é apenas constituído por dois transístores tipo-n e duas fontes de corrente. Estes fatores aliados à falta de um óxido semiconductor tipo-p de qualidade torna esta configuração apelativa. A simulação do oscilador foi realizada através das tecnologias de metal-óxido-semicondutor (MOS) e TFT. No caso da primeira, o comprimento de canal (LCH) foi de 1 μm e no caso da segunda, implementaram-se 2 LCH: 10 e 20 μm. As simulações da tecnologia MOS funcionaram com prova de conceito. Analisou-se a frequência de oscilação (fOSC) e tensão de pico-a-pico (Vpp) nos osciladores de ambas as tecnologias. Adicionalmente, a sensibilidade à temperatura e o ruído de fase foram analisados para a tecnologia MOS. Os osciladores LC implementados com três diferentes aLs utilizando transístores MOS apresentaram fOSC entre 917 MHz e 2.08 GHz, potência dissipada desde 21 mW até 80 mW e Vpp variando de 613 mV até 1.78 V, utilizando 5 V como fonte de alimentação (VDD). O ruído de fase máximo foi de -92.86 dBc/Hz a 1 MHz. O oscilador LC utilizando TFTs produziu uma fOSC = 1.21 MHz e Vpp = 3.83 V, dissipando 533 μW com VDD = 10 V.Barquinha, PedroBahubalindruni, PydiRUNViana, Hugo Filipe Matias2022-05-26T16:58:31Z2022-012022-01-01T00:00:00Zinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/masterThesisapplication/pdfhttp://hdl.handle.net/10362/138705enginfo:eu-repo/semantics/openAccessreponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãoinstacron:RCAAP2024-03-11T05:16:02Zoai:run.unl.pt:10362/138705Portal AgregadorONGhttps://www.rcaap.pt/oai/openaireopendoar:71602024-03-20T03:49:11.081705Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãofalse |
dc.title.none.fl_str_mv |
Implementation of Active Inductors with Oxide Thin-Film Transistors and Integration into Oscillator Circuits |
title |
Implementation of Active Inductors with Oxide Thin-Film Transistors and Integration into Oscillator Circuits |
spellingShingle |
Implementation of Active Inductors with Oxide Thin-Film Transistors and Integration into Oscillator Circuits Viana, Hugo Filipe Matias a-IGZO TFT Active inductor (aL) Simple grounded aL Cross-couple pair LC-oscillator Domínio/Área Científica::Engenharia e Tecnologia::Nanotecnologia |
title_short |
Implementation of Active Inductors with Oxide Thin-Film Transistors and Integration into Oscillator Circuits |
title_full |
Implementation of Active Inductors with Oxide Thin-Film Transistors and Integration into Oscillator Circuits |
title_fullStr |
Implementation of Active Inductors with Oxide Thin-Film Transistors and Integration into Oscillator Circuits |
title_full_unstemmed |
Implementation of Active Inductors with Oxide Thin-Film Transistors and Integration into Oscillator Circuits |
title_sort |
Implementation of Active Inductors with Oxide Thin-Film Transistors and Integration into Oscillator Circuits |
author |
Viana, Hugo Filipe Matias |
author_facet |
Viana, Hugo Filipe Matias |
author_role |
author |
dc.contributor.none.fl_str_mv |
Barquinha, Pedro Bahubalindruni, Pydi RUN |
dc.contributor.author.fl_str_mv |
Viana, Hugo Filipe Matias |
dc.subject.por.fl_str_mv |
a-IGZO TFT Active inductor (aL) Simple grounded aL Cross-couple pair LC-oscillator Domínio/Área Científica::Engenharia e Tecnologia::Nanotecnologia |
topic |
a-IGZO TFT Active inductor (aL) Simple grounded aL Cross-couple pair LC-oscillator Domínio/Área Científica::Engenharia e Tecnologia::Nanotecnologia |
description |
This work aims to investigate the replacement of passive inductors with active inductors (aLs) using amorphous indium-gallium-zinc oxide (a-IGZO) thin-film transistors (TFT). The goal of aL is to emulate the inductive behavior associated with passive inductors. The advantage of the former is the small die area, high quality-factor, inductance, and self-resonant frequency tunability. A simple grounded n-type aL was used to replace the inductor in an inductance-capacitance (LC) oscillator. The LC oscillator is constituted by a cross-couple pair and two aLs. The simple grounded aL configuration was used due to a-IGZO being an n-type semiconductor and also owing to its simplicity, being only built with two transistors and two current sources. These factors allied with the lack of a counterpart p- type amorphous oxide semiconductor make this aL a good fit for the proposed work. The oscillator was simulated using metal-oxide-semiconductor field-effect transistor (MOSFET) and TFTs. The former was simulated with a channel length of 1 μm and the latter was simulated with two channel-lengths 10 μm and 20 μm. The MOS technology simulations were used as a proof-of-concept since these have more accurate models. The oscillation frequency (fOSC) and output peak-to-peak voltage swing (Vpp) were analyzed for both technologies. Temperature sensibility, and phase noise were also examined for the MOS technology. The MOS oscillators with three different aLs presented an fOSC between 917 MHz and 2.08 GHz, power consumption from 21 mW to 80 mW, a Vpp of 613 mV up until 1.78 V with a power supply voltage (VDD) of 5V. The maximum phase noise was - 92.86 dBc/Hz at an offset of 1 MHz. A 10 μm a-IGZO TFTs oscillator produced an fOSC of 1.21 MHz and a Vpp of 3.83 V, dissipating 533 μW for a VDD of 10V. |
publishDate |
2022 |
dc.date.none.fl_str_mv |
2022-05-26T16:58:31Z 2022-01 2022-01-01T00:00:00Z |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/masterThesis |
format |
masterThesis |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://hdl.handle.net/10362/138705 |
url |
http://hdl.handle.net/10362/138705 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
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openAccess |
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application/pdf |
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Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação |
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RCAAP |
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RCAAP |
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Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) |
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Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) |
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Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação |
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