Characterisation of Ti1-xSixNy nanocomposite films

Detalhes bibliográficos
Autor(a) principal: Vaz, F.
Data de Publicação: 2000
Outros Autores: Rebouta, L., Goudeau, P., Pacaud, J., Garem, H., Rivière, J. P., Cavaleiro, A., Alves, E.
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
Texto Completo: http://hdl.handle.net/10316/4298
Resumo: Ti1-xSixNy films were synthesised by RF reactive sputtering from Ti and Si elemental targets, in an Ar/N2 gas mixture. XRD results revealed the development of a two-phase system, composed of a nanocrystalline f.c.c. TiN (phase 1: B1 NaCl type) and a second one (phase 2), where Si atoms replaced some of the Ti ones, inducing a structure that we may call a solid solution. An amorphous phase, supposed to be of silicon nitride, within grain boundaries seems to be also present, especially for high Si contents. TEM experiments confirmed the f.c.c.-type structure for phase 2, which is the only phase that develops without ion bombardment. The higher lattice parameter of phase 1 (~0.429 nm compared to 0.424 nm for bulk TiN) may be explained by the residual stress effect on peak position. The Ti replacement by Si would explain the low value of the lattice parameter for phase 2 (~0.418 nm). All samples showed good results for hardness (Hv>=30 GPa), and Ti0.85Si0.15N1.03 at a deposition temperature of 300°C showed a value of approximately 47 Gpa, which is approximately double that of pure TiN. For higher deposition temperatures, an increase in hardness is observed, as demonstrated by this same sample, which at 400°C reveals a value of approximately 54 GPa. Similar behaviour was observed in adhesion, where this same sample revealed a critical load for adhesive failure of approximately 90 N. In terms of oxidation resistance, a significant increase has also been observed in comparison with TiN. At 600°C, the oxidation resistance of Ti0.70Si0.30N1.10 is already 100 times higher than that of TiN. For higher temperatures this behaviour tends to be even better when compared with other nitrides.
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spelling Characterisation of Ti1-xSixNy nanocomposite filmsTi-Si-NTitanium and silicon nitrideHardnessAdhesionOxidation resistanceTextureTi1-xSixNy films were synthesised by RF reactive sputtering from Ti and Si elemental targets, in an Ar/N2 gas mixture. XRD results revealed the development of a two-phase system, composed of a nanocrystalline f.c.c. TiN (phase 1: B1 NaCl type) and a second one (phase 2), where Si atoms replaced some of the Ti ones, inducing a structure that we may call a solid solution. An amorphous phase, supposed to be of silicon nitride, within grain boundaries seems to be also present, especially for high Si contents. TEM experiments confirmed the f.c.c.-type structure for phase 2, which is the only phase that develops without ion bombardment. The higher lattice parameter of phase 1 (~0.429 nm compared to 0.424 nm for bulk TiN) may be explained by the residual stress effect on peak position. The Ti replacement by Si would explain the low value of the lattice parameter for phase 2 (~0.418 nm). All samples showed good results for hardness (Hv>=30 GPa), and Ti0.85Si0.15N1.03 at a deposition temperature of 300°C showed a value of approximately 47 Gpa, which is approximately double that of pure TiN. For higher deposition temperatures, an increase in hardness is observed, as demonstrated by this same sample, which at 400°C reveals a value of approximately 54 GPa. Similar behaviour was observed in adhesion, where this same sample revealed a critical load for adhesive failure of approximately 90 N. In terms of oxidation resistance, a significant increase has also been observed in comparison with TiN. At 600°C, the oxidation resistance of Ti0.70Si0.30N1.10 is already 100 times higher than that of TiN. For higher temperatures this behaviour tends to be even better when compared with other nitrides.http://www.sciencedirect.com/science/article/B6TVV-41ST0WS-1P/1/67eb0cbade34941d6943bcdb43320cb32000info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articleaplication/PDFhttp://hdl.handle.net/10316/4298http://hdl.handle.net/10316/4298engSurface and Coatings Technology. 133-134:(2000) 307-313Vaz, F.Rebouta, L.Goudeau, P.Pacaud, J.Garem, H.Rivière, J. P.Cavaleiro, A.Alves, E.info:eu-repo/semantics/openAccessreponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãoinstacron:RCAAP2020-05-25T12:28:50Zoai:estudogeral.uc.pt:10316/4298Portal AgregadorONGhttps://www.rcaap.pt/oai/openaireopendoar:71602024-03-19T20:58:29.692353Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãofalse
dc.title.none.fl_str_mv Characterisation of Ti1-xSixNy nanocomposite films
title Characterisation of Ti1-xSixNy nanocomposite films
spellingShingle Characterisation of Ti1-xSixNy nanocomposite films
Vaz, F.
Ti-Si-N
Titanium and silicon nitride
Hardness
Adhesion
Oxidation resistance
Texture
title_short Characterisation of Ti1-xSixNy nanocomposite films
title_full Characterisation of Ti1-xSixNy nanocomposite films
title_fullStr Characterisation of Ti1-xSixNy nanocomposite films
title_full_unstemmed Characterisation of Ti1-xSixNy nanocomposite films
title_sort Characterisation of Ti1-xSixNy nanocomposite films
author Vaz, F.
author_facet Vaz, F.
Rebouta, L.
Goudeau, P.
Pacaud, J.
Garem, H.
Rivière, J. P.
Cavaleiro, A.
Alves, E.
author_role author
author2 Rebouta, L.
Goudeau, P.
Pacaud, J.
Garem, H.
Rivière, J. P.
Cavaleiro, A.
Alves, E.
author2_role author
author
author
author
author
author
author
dc.contributor.author.fl_str_mv Vaz, F.
Rebouta, L.
Goudeau, P.
Pacaud, J.
Garem, H.
Rivière, J. P.
Cavaleiro, A.
Alves, E.
dc.subject.por.fl_str_mv Ti-Si-N
Titanium and silicon nitride
Hardness
Adhesion
Oxidation resistance
Texture
topic Ti-Si-N
Titanium and silicon nitride
Hardness
Adhesion
Oxidation resistance
Texture
description Ti1-xSixNy films were synthesised by RF reactive sputtering from Ti and Si elemental targets, in an Ar/N2 gas mixture. XRD results revealed the development of a two-phase system, composed of a nanocrystalline f.c.c. TiN (phase 1: B1 NaCl type) and a second one (phase 2), where Si atoms replaced some of the Ti ones, inducing a structure that we may call a solid solution. An amorphous phase, supposed to be of silicon nitride, within grain boundaries seems to be also present, especially for high Si contents. TEM experiments confirmed the f.c.c.-type structure for phase 2, which is the only phase that develops without ion bombardment. The higher lattice parameter of phase 1 (~0.429 nm compared to 0.424 nm for bulk TiN) may be explained by the residual stress effect on peak position. The Ti replacement by Si would explain the low value of the lattice parameter for phase 2 (~0.418 nm). All samples showed good results for hardness (Hv>=30 GPa), and Ti0.85Si0.15N1.03 at a deposition temperature of 300°C showed a value of approximately 47 Gpa, which is approximately double that of pure TiN. For higher deposition temperatures, an increase in hardness is observed, as demonstrated by this same sample, which at 400°C reveals a value of approximately 54 GPa. Similar behaviour was observed in adhesion, where this same sample revealed a critical load for adhesive failure of approximately 90 N. In terms of oxidation resistance, a significant increase has also been observed in comparison with TiN. At 600°C, the oxidation resistance of Ti0.70Si0.30N1.10 is already 100 times higher than that of TiN. For higher temperatures this behaviour tends to be even better when compared with other nitrides.
publishDate 2000
dc.date.none.fl_str_mv 2000
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
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dc.identifier.uri.fl_str_mv http://hdl.handle.net/10316/4298
http://hdl.handle.net/10316/4298
url http://hdl.handle.net/10316/4298
dc.language.iso.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv Surface and Coatings Technology. 133-134:(2000) 307-313
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv aplication/PDF
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