Interrelation between microstructure and optical properties of erbium-doped nanocrystalline thin films

Detalhes bibliográficos
Autor(a) principal: Losurdo, M.
Data de Publicação: 2003
Outros Autores: Cerqueira, M. F., Alves, E., Stepikhova, M., Giangregorio, M. M., Bruno, G.
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
Texto Completo: http://hdl.handle.net/1822/13983
Resumo: Nanocrystalline silicon thin films codoped with erbium, oxygen and hydrogen have been deposited by co-sputtering of Er and Si. Films with different crystallinity, crystallite size and oxygen content have been obtained in order to investigate the effect of the microstructure on the photoluminescence properties. The correlation between the optical properties and microstructural parameters of the films is investigated by spectroscopic ellipsometry. PL response of the discussed structures covers both the visible wavelength range (a crystallite size-dependent photoluminescence detected for 5–6 nm sized nanocrystals embedded in a SiO matrix) and near IR range at 1.54 microm (Er-related PL dominating in the films with 1–3 nm sized Si nanocrystals embedded in a-Si:H). It is demonstrated that the different PL properties can be also discriminated on the basis of ellipsometric spectra.
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spelling Interrelation between microstructure and optical properties of erbium-doped nanocrystalline thin filmsnc-SiErbium dopingSpectroscopic ellipsometryOptical propertiesFilmsScience & TechnologyNanocrystalline silicon thin films codoped with erbium, oxygen and hydrogen have been deposited by co-sputtering of Er and Si. Films with different crystallinity, crystallite size and oxygen content have been obtained in order to investigate the effect of the microstructure on the photoluminescence properties. The correlation between the optical properties and microstructural parameters of the films is investigated by spectroscopic ellipsometry. PL response of the discussed structures covers both the visible wavelength range (a crystallite size-dependent photoluminescence detected for 5–6 nm sized nanocrystals embedded in a SiO matrix) and near IR range at 1.54 microm (Er-related PL dominating in the films with 1–3 nm sized Si nanocrystals embedded in a-Si:H). It is demonstrated that the different PL properties can be also discriminated on the basis of ellipsometric spectra.ElsevierUniversidade do MinhoLosurdo, M.Cerqueira, M. F.Alves, E.Stepikhova, M.Giangregorio, M. M.Bruno, G.20032003-01-01T00:00:00Zinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articleapplication/pdfhttp://hdl.handle.net/1822/13983eng1386-947710.1016/S1386-9477(02)00617-3http://www.sciencedirect.com/science/article/pii/S1386947702006173info:eu-repo/semantics/openAccessreponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãoinstacron:RCAAP2023-07-21T12:17:44Zoai:repositorium.sdum.uminho.pt:1822/13983Portal AgregadorONGhttps://www.rcaap.pt/oai/openaireopendoar:71602024-03-19T19:10:23.961979Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãofalse
dc.title.none.fl_str_mv Interrelation between microstructure and optical properties of erbium-doped nanocrystalline thin films
title Interrelation between microstructure and optical properties of erbium-doped nanocrystalline thin films
spellingShingle Interrelation between microstructure and optical properties of erbium-doped nanocrystalline thin films
Losurdo, M.
nc-Si
Erbium doping
Spectroscopic ellipsometry
Optical properties
Films
Science & Technology
title_short Interrelation between microstructure and optical properties of erbium-doped nanocrystalline thin films
title_full Interrelation between microstructure and optical properties of erbium-doped nanocrystalline thin films
title_fullStr Interrelation between microstructure and optical properties of erbium-doped nanocrystalline thin films
title_full_unstemmed Interrelation between microstructure and optical properties of erbium-doped nanocrystalline thin films
title_sort Interrelation between microstructure and optical properties of erbium-doped nanocrystalline thin films
author Losurdo, M.
author_facet Losurdo, M.
Cerqueira, M. F.
Alves, E.
Stepikhova, M.
Giangregorio, M. M.
Bruno, G.
author_role author
author2 Cerqueira, M. F.
Alves, E.
Stepikhova, M.
Giangregorio, M. M.
Bruno, G.
author2_role author
author
author
author
author
dc.contributor.none.fl_str_mv Universidade do Minho
dc.contributor.author.fl_str_mv Losurdo, M.
Cerqueira, M. F.
Alves, E.
Stepikhova, M.
Giangregorio, M. M.
Bruno, G.
dc.subject.por.fl_str_mv nc-Si
Erbium doping
Spectroscopic ellipsometry
Optical properties
Films
Science & Technology
topic nc-Si
Erbium doping
Spectroscopic ellipsometry
Optical properties
Films
Science & Technology
description Nanocrystalline silicon thin films codoped with erbium, oxygen and hydrogen have been deposited by co-sputtering of Er and Si. Films with different crystallinity, crystallite size and oxygen content have been obtained in order to investigate the effect of the microstructure on the photoluminescence properties. The correlation between the optical properties and microstructural parameters of the films is investigated by spectroscopic ellipsometry. PL response of the discussed structures covers both the visible wavelength range (a crystallite size-dependent photoluminescence detected for 5–6 nm sized nanocrystals embedded in a SiO matrix) and near IR range at 1.54 microm (Er-related PL dominating in the films with 1–3 nm sized Si nanocrystals embedded in a-Si:H). It is demonstrated that the different PL properties can be also discriminated on the basis of ellipsometric spectra.
publishDate 2003
dc.date.none.fl_str_mv 2003
2003-01-01T00:00:00Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/article
format article
status_str publishedVersion
dc.identifier.uri.fl_str_mv http://hdl.handle.net/1822/13983
url http://hdl.handle.net/1822/13983
dc.language.iso.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv 1386-9477
10.1016/S1386-9477(02)00617-3
http://www.sciencedirect.com/science/article/pii/S1386947702006173
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv application/pdf
dc.publisher.none.fl_str_mv Elsevier
publisher.none.fl_str_mv Elsevier
dc.source.none.fl_str_mv reponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação
instacron:RCAAP
instname_str Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação
instacron_str RCAAP
institution RCAAP
reponame_str Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
collection Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
repository.name.fl_str_mv Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação
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