Voids in Kesterites and the Influence of Lamellae Preparation by Focused Ion Beam for Transmission Electron Microscopy Analyses

Detalhes bibliográficos
Autor(a) principal: Ribeiro-Andrade, Rodrigo
Data de Publicação: 2019
Outros Autores: Sahayaraj, Sylvester, Vermang, Bart, Correia, M. Rosario, Sadewasser, Sascha, Gonzalez, Juan Carlos, Fernandes, P. A., Salome, Pedro M. P.
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
Texto Completo: http://hdl.handle.net/10400.22/17164
Resumo: Kesterite solar cells based on Cu 2 ZnSnS 4 and Cu 2 ZnSnSe 4 (CZTSe) are potential future candidates to be used in thin-film solar cells. The technology still has to be developed to a great extent and for this to happen, high levels of confidence in the characterization methods are required, so that improvements can be made on solid interpretations. In this study, we show that the interpretations of one of the most used characterization techniques in kesterites, scanning transmission electron microscopy (STEM), might be affected by its specimen preparation when using focused ion beam (FIB). Using complementary measurements based on scanning electron microscopy and Raman scattering spectroscopy, compelling evidence shows that secondary phases of ZnSe mixed in the bulk of CZTSe are the likely cause of the appearance of voids in STEM lamellae. Sputtering simulations support this interpretation by showing that Zn in a ZnSe matrix is preferentially sputtered compared with any metal atom in a CZTSe matrix.
id RCAP_a975af23369452546ebb94537cd6028b
oai_identifier_str oai:recipp.ipp.pt:10400.22/17164
network_acronym_str RCAP
network_name_str Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
repository_id_str 7160
spelling Voids in Kesterites and the Influence of Lamellae Preparation by Focused Ion Beam for Transmission Electron Microscopy AnalysesCu2 ZnSn(S, Se)4 (CZTSSe)Focused Ion Beam (FIB)KesteriteThin-film solar cellsTransmission electron microscopy (TEM)Kesterite solar cells based on Cu 2 ZnSnS 4 and Cu 2 ZnSnSe 4 (CZTSe) are potential future candidates to be used in thin-film solar cells. The technology still has to be developed to a great extent and for this to happen, high levels of confidence in the characterization methods are required, so that improvements can be made on solid interpretations. In this study, we show that the interpretations of one of the most used characterization techniques in kesterites, scanning transmission electron microscopy (STEM), might be affected by its specimen preparation when using focused ion beam (FIB). Using complementary measurements based on scanning electron microscopy and Raman scattering spectroscopy, compelling evidence shows that secondary phases of ZnSe mixed in the bulk of CZTSe are the likely cause of the appearance of voids in STEM lamellae. Sputtering simulations support this interpretation by showing that Zn in a ZnSe matrix is preferentially sputtered compared with any metal atom in a CZTSe matrix.IEEERepositório Científico do Instituto Politécnico do PortoRibeiro-Andrade, RodrigoSahayaraj, SylvesterVermang, BartCorreia, M. RosarioSadewasser, SaschaGonzalez, Juan CarlosFernandes, P. A.Salome, Pedro M. P.20192120-01-01T00:00:00Z2019-01-01T00:00:00Zinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articleapplication/pdfhttp://hdl.handle.net/10400.22/17164eng10.1109/JPHOTOV.2018.2889602metadata only accessinfo:eu-repo/semantics/openAccessreponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãoinstacron:RCAAP2023-03-13T13:06:47Zoai:recipp.ipp.pt:10400.22/17164Portal AgregadorONGhttps://www.rcaap.pt/oai/openaireopendoar:71602024-03-19T17:36:51.026043Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãofalse
dc.title.none.fl_str_mv Voids in Kesterites and the Influence of Lamellae Preparation by Focused Ion Beam for Transmission Electron Microscopy Analyses
title Voids in Kesterites and the Influence of Lamellae Preparation by Focused Ion Beam for Transmission Electron Microscopy Analyses
spellingShingle Voids in Kesterites and the Influence of Lamellae Preparation by Focused Ion Beam for Transmission Electron Microscopy Analyses
Ribeiro-Andrade, Rodrigo
Cu2 ZnSn(S, Se)4 (CZTSSe)
Focused Ion Beam (FIB)
Kesterite
Thin-film solar cells
Transmission electron microscopy (TEM)
title_short Voids in Kesterites and the Influence of Lamellae Preparation by Focused Ion Beam for Transmission Electron Microscopy Analyses
title_full Voids in Kesterites and the Influence of Lamellae Preparation by Focused Ion Beam for Transmission Electron Microscopy Analyses
title_fullStr Voids in Kesterites and the Influence of Lamellae Preparation by Focused Ion Beam for Transmission Electron Microscopy Analyses
title_full_unstemmed Voids in Kesterites and the Influence of Lamellae Preparation by Focused Ion Beam for Transmission Electron Microscopy Analyses
title_sort Voids in Kesterites and the Influence of Lamellae Preparation by Focused Ion Beam for Transmission Electron Microscopy Analyses
author Ribeiro-Andrade, Rodrigo
author_facet Ribeiro-Andrade, Rodrigo
Sahayaraj, Sylvester
Vermang, Bart
Correia, M. Rosario
Sadewasser, Sascha
Gonzalez, Juan Carlos
Fernandes, P. A.
Salome, Pedro M. P.
author_role author
author2 Sahayaraj, Sylvester
Vermang, Bart
Correia, M. Rosario
Sadewasser, Sascha
Gonzalez, Juan Carlos
Fernandes, P. A.
Salome, Pedro M. P.
author2_role author
author
author
author
author
author
author
dc.contributor.none.fl_str_mv Repositório Científico do Instituto Politécnico do Porto
dc.contributor.author.fl_str_mv Ribeiro-Andrade, Rodrigo
Sahayaraj, Sylvester
Vermang, Bart
Correia, M. Rosario
Sadewasser, Sascha
Gonzalez, Juan Carlos
Fernandes, P. A.
Salome, Pedro M. P.
dc.subject.por.fl_str_mv Cu2 ZnSn(S, Se)4 (CZTSSe)
Focused Ion Beam (FIB)
Kesterite
Thin-film solar cells
Transmission electron microscopy (TEM)
topic Cu2 ZnSn(S, Se)4 (CZTSSe)
Focused Ion Beam (FIB)
Kesterite
Thin-film solar cells
Transmission electron microscopy (TEM)
description Kesterite solar cells based on Cu 2 ZnSnS 4 and Cu 2 ZnSnSe 4 (CZTSe) are potential future candidates to be used in thin-film solar cells. The technology still has to be developed to a great extent and for this to happen, high levels of confidence in the characterization methods are required, so that improvements can be made on solid interpretations. In this study, we show that the interpretations of one of the most used characterization techniques in kesterites, scanning transmission electron microscopy (STEM), might be affected by its specimen preparation when using focused ion beam (FIB). Using complementary measurements based on scanning electron microscopy and Raman scattering spectroscopy, compelling evidence shows that secondary phases of ZnSe mixed in the bulk of CZTSe are the likely cause of the appearance of voids in STEM lamellae. Sputtering simulations support this interpretation by showing that Zn in a ZnSe matrix is preferentially sputtered compared with any metal atom in a CZTSe matrix.
publishDate 2019
dc.date.none.fl_str_mv 2019
2019-01-01T00:00:00Z
2120-01-01T00:00:00Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/article
format article
status_str publishedVersion
dc.identifier.uri.fl_str_mv http://hdl.handle.net/10400.22/17164
url http://hdl.handle.net/10400.22/17164
dc.language.iso.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv 10.1109/JPHOTOV.2018.2889602
dc.rights.driver.fl_str_mv metadata only access
info:eu-repo/semantics/openAccess
rights_invalid_str_mv metadata only access
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv application/pdf
dc.publisher.none.fl_str_mv IEEE
publisher.none.fl_str_mv IEEE
dc.source.none.fl_str_mv reponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação
instacron:RCAAP
instname_str Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação
instacron_str RCAAP
institution RCAAP
reponame_str Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
collection Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
repository.name.fl_str_mv Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação
repository.mail.fl_str_mv
_version_ 1799131458773712896