Estimation of buckwheat leaf area by leaf dimensions

• Autor(a) principal: Cargnelutti Filho, Alberto
• Data de Publicação: 2021
• Outros Autores: Pezzini, Rafael Vieira, Neu, Ismael Mario Márcio, Dumke, Gabriel Elias
• Tipo de documento: Artigo
• Idioma: eng
• Título da fonte: Semina. Ciências Agrárias (Online)
• Texto Completo: https://ojs.uel.br/revistas/uel/index.php/semagrarias/article/view/41574
• topic: Leaf area by digital photos; Fagopyrum esculentum Moench; Non-destructive method; Modeling; Buckwheat.; Leaf area by digital photos; Fagopyrum esculentum Moench; Non-destructive method; Modeling; Buckwheat.

The objective of this work was to model and identify the best models for estimating the leaf area, determined by digital photos, of buckwheat (Fagopyrum esculentum Moench) of the cultivars IPR91-Baili and IPR92-Altar, as a function of length (L), width (W) or length x width product (LW) of the leaf blade. Ten uniformity trials (blank experiments) were carried out, five with IPR91-Baili cultivar and five with IPR92-Altar cultivar. The trials were performed on five sowing dates. In each trial and cultivar, expanded leaves were collected at random from the lower, middle and upper segments of the plants, totaling 1,815 leaves. In these 1,815 leaves, L and W were measured and the LW of the leaf blade was calculated, which were used as independent variables in the model. The leaf area of each leaf was determined using the digital photo method (Y), which was used as a dependent variable of the model. For each sowing date, cultivar and thirds of the plant, 80% of the leaves (1,452 leaves) were randomly separated for the generation of the models and 20% of the leaves (363 leaves) for the validation of the models of leaf area estimation as a function of linear dimensions. For buckwheat, IPR91-Baili and IPR92-Altar cultivars, the quadratic model (Y = 0.5217 + 0.6581LW + 0.0004LW2, R2 = 0.9590), power model (Y = 0.6809LW1.0037, R2 = 0.9587), linear model (Y = 0.0653 + 0.6892LW, R2 = 0.9587) and linear model without intercept (Y = 0.6907LW, R2 = 0.9587) are indicated for the estimation of leaf area determined by digital photos (Y) based on the LW of the leaf blade (x), and, preferably, the linear model without intercept can be used, due to its greater simplicity.