Characterization of asymmetric fragmentation patterns in SFM images of porous silicon

Detalhes bibliográficos
Autor(a) principal: Silva, A. Ferreira da
Data de Publicação: 2000
Outros Autores: Rosa, R.R., Roman, L.S., Veje, E., Pepe, Iuri Muniz
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Repositório Institucional da UFBA
Texto Completo: http://www.repositorio.ufba.br/ri/handle/ri/7965
Resumo: Texto completo: acesso restrito. p.703-708
id UFBA-2_c9980049744f2afea3d5253af61ffdee
oai_identifier_str oai:repositorio.ufba.br:ri/7965
network_acronym_str UFBA-2
network_name_str Repositório Institucional da UFBA
repository_id_str 1932
spelling Silva, A. Ferreira daRosa, R.R.Roman, L.S.Veje, E.Pepe, Iuri MunizSilva, A. Ferreira daRosa, R.R.Roman, L.S.Veje, E.Pepe, Iuri Muniz2013-01-17T10:47:15Z20000038-1098http://www.repositorio.ufba.br/ri/handle/ri/7965v. 113, n. 12Texto completo: acesso restrito. p.703-708Due to possible technological applications in opto-electronic devices, the interest in characterizing porous silicon structure patterns has recently increased. From scanning force microscopy (SFM) we have obtained images of different samples of porous silicon and applied pattern characterization operators on these matrices. In this paper, asymmetric spatial fragmentation in amplitude envelopes of porous silicon samples are characterized by means of a parameter that quantifies the amount of spatial asymmetry in the gradient field. The results show that this method is well suited to characterize silicon porosity quantitatively.Submitted by Suelen Reis (suelen_suzane@hotmail.com) on 2013-01-17T10:47:15Z No. of bitstreams: 1 silva.pdf: 307236 bytes, checksum: 74ea16a56cbffa0377ac24464497b55e (MD5)Made available in DSpace on 2013-01-17T10:47:15Z (GMT). No. of bitstreams: 1 silva.pdf: 307236 bytes, checksum: 74ea16a56cbffa0377ac24464497b55e (MD5) Previous issue date: 2000http://dx.doi.org/10.1016/S0038-1098(99)00557-8reponame:Repositório Institucional da UFBAinstname:Universidade Federal da Bahia (UFBA)instacron:UFBAA. SemiconductorsB. NanofabricationsC. Crystal structure and symmetryD. Optical propertiesCharacterization of asymmetric fragmentation patterns in SFM images of porous siliconSolid State Communicationsinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/article10000-01-01enginfo:eu-repo/semantics/openAccessORIGINALsilva.pdfsilva.pdfapplication/pdf307236https://repositorio.ufba.br/bitstream/ri/7965/1/silva.pdf74ea16a56cbffa0377ac24464497b55eMD51LICENSElicense.txtlicense.txttext/plain1762https://repositorio.ufba.br/bitstream/ri/7965/2/license.txt1b89a9a0548218172d7c829f87a0eab9MD52TEXTsilva.pdf.txtsilva.pdf.txtExtracted texttext/plain22721https://repositorio.ufba.br/bitstream/ri/7965/3/silva.pdf.txtade3e5fe7ea786ad05f4bd7a18339d6fMD53ri/79652022-07-05 14:03:46.297oai:repositorio.ufba.br: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Repositório InstitucionalPUBhttp://192.188.11.11:8080/oai/requestopendoar:19322022-07-05T17:03:46Repositório Institucional da UFBA - Universidade Federal da Bahia (UFBA)false
dc.title.pt_BR.fl_str_mv Characterization of asymmetric fragmentation patterns in SFM images of porous silicon
dc.title.alternative.pt_BR.fl_str_mv Solid State Communications
title Characterization of asymmetric fragmentation patterns in SFM images of porous silicon
spellingShingle Characterization of asymmetric fragmentation patterns in SFM images of porous silicon
Silva, A. Ferreira da
A. Semiconductors
B. Nanofabrications
C. Crystal structure and symmetry
D. Optical properties
title_short Characterization of asymmetric fragmentation patterns in SFM images of porous silicon
title_full Characterization of asymmetric fragmentation patterns in SFM images of porous silicon
title_fullStr Characterization of asymmetric fragmentation patterns in SFM images of porous silicon
title_full_unstemmed Characterization of asymmetric fragmentation patterns in SFM images of porous silicon
title_sort Characterization of asymmetric fragmentation patterns in SFM images of porous silicon
author Silva, A. Ferreira da
author_facet Silva, A. Ferreira da
Rosa, R.R.
Roman, L.S.
Veje, E.
Pepe, Iuri Muniz
author_role author
author2 Rosa, R.R.
Roman, L.S.
Veje, E.
Pepe, Iuri Muniz
author2_role author
author
author
author
dc.contributor.author.fl_str_mv Silva, A. Ferreira da
Rosa, R.R.
Roman, L.S.
Veje, E.
Pepe, Iuri Muniz
Silva, A. Ferreira da
Rosa, R.R.
Roman, L.S.
Veje, E.
Pepe, Iuri Muniz
dc.subject.por.fl_str_mv A. Semiconductors
B. Nanofabrications
C. Crystal structure and symmetry
D. Optical properties
topic A. Semiconductors
B. Nanofabrications
C. Crystal structure and symmetry
D. Optical properties
description Texto completo: acesso restrito. p.703-708
publishDate 2000
dc.date.issued.fl_str_mv 2000
dc.date.accessioned.fl_str_mv 2013-01-17T10:47:15Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/article
format article
status_str publishedVersion
dc.identifier.uri.fl_str_mv http://www.repositorio.ufba.br/ri/handle/ri/7965
dc.identifier.issn.none.fl_str_mv 0038-1098
dc.identifier.number.pt_BR.fl_str_mv v. 113, n. 12
identifier_str_mv 0038-1098
v. 113, n. 12
url http://www.repositorio.ufba.br/ri/handle/ri/7965
dc.language.iso.fl_str_mv eng
language eng
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.source.pt_BR.fl_str_mv http://dx.doi.org/10.1016/S0038-1098(99)00557-8
dc.source.none.fl_str_mv reponame:Repositório Institucional da UFBA
instname:Universidade Federal da Bahia (UFBA)
instacron:UFBA
instname_str Universidade Federal da Bahia (UFBA)
instacron_str UFBA
institution UFBA
reponame_str Repositório Institucional da UFBA
collection Repositório Institucional da UFBA
bitstream.url.fl_str_mv https://repositorio.ufba.br/bitstream/ri/7965/1/silva.pdf
https://repositorio.ufba.br/bitstream/ri/7965/2/license.txt
https://repositorio.ufba.br/bitstream/ri/7965/3/silva.pdf.txt
bitstream.checksum.fl_str_mv 74ea16a56cbffa0377ac24464497b55e
1b89a9a0548218172d7c829f87a0eab9
ade3e5fe7ea786ad05f4bd7a18339d6f
bitstream.checksumAlgorithm.fl_str_mv MD5
MD5
MD5
repository.name.fl_str_mv Repositório Institucional da UFBA - Universidade Federal da Bahia (UFBA)
repository.mail.fl_str_mv
_version_ 1808459416158076928

Registros relacionados