A high-fault-coverage approach for the test of data, control, and handshake interconnects in mesh networks-on-chip

Detalhes bibliográficos
Autor(a) principal: Cota, Erika Fernandes
Data de Publicação: 2008
Outros Autores: Kastensmidt, Fernanda Gusmão de Lima, Santos, Maico Cassel dos, Hervé, Marcos Barcellos, Almeida, Pedro Rogério Vieira de, Meirelles, Paulo Roberto Miranda, Amory, Alexandre de Morais, Lubaszewski, Marcelo Soares
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Repositório Institucional da UFRGS
Texto Completo: http://hdl.handle.net/10183/27611
Resumo: A novel strategy for detecting interconnect faults between distinct channels in networks-on-chip is proposed. Short faults between distinct channels in the data, control, and communication handshake wires are considered in a cost-effective test sequence for mesh NoC topologies based on XY routing.
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spelling Cota, Erika FernandesKastensmidt, Fernanda Gusmão de LimaSantos, Maico Cassel dosHervé, Marcos BarcellosAlmeida, Pedro Rogério Vieira deMeirelles, Paulo Roberto MirandaAmory, Alexandre de MoraisLubaszewski, Marcelo Soares2011-01-29T06:00:40Z20080018-9340http://hdl.handle.net/10183/27611000666993A novel strategy for detecting interconnect faults between distinct channels in networks-on-chip is proposed. Short faults between distinct channels in the data, control, and communication handshake wires are considered in a cost-effective test sequence for mesh NoC topologies based on XY routing.application/pdfengIEEE transactions on computers. New York. Vol. 57, no 9 (Sept. 2008), p. 1202-1215MicroeletrônicaFault coverageInterconnect testingTest generationReliabilityA high-fault-coverage approach for the test of data, control, and handshake interconnects in mesh networks-on-chipEstrangeiroinfo:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/openAccessreponame:Repositório Institucional da UFRGSinstname:Universidade Federal do Rio Grande do Sul (UFRGS)instacron:UFRGSORIGINAL000666993.pdf000666993.pdfTexto completo (inglês)application/pdf4149350http://www.lume.ufrgs.br/bitstream/10183/27611/1/000666993.pdf9389d55f459115e3d7fa7d8d131ad20fMD51TEXT000666993.pdf.txt000666993.pdf.txtExtracted Texttext/plain62497http://www.lume.ufrgs.br/bitstream/10183/27611/2/000666993.pdf.txt04d994c9067a534414b7bd7c23827d97MD52THUMBNAIL000666993.pdf.jpg000666993.pdf.jpgGenerated Thumbnailimage/jpeg2196http://www.lume.ufrgs.br/bitstream/10183/27611/3/000666993.pdf.jpgb30fa21e5df08a46d1179c3769662336MD5310183/276112021-06-13 04:34:17.733446oai:www.lume.ufrgs.br:10183/27611Repositório InstitucionalPUBhttps://lume.ufrgs.br/oai/requestlume@ufrgs.bropendoar:2021-06-13T07:34:17Repositório Institucional da UFRGS - Universidade Federal do Rio Grande do Sul (UFRGS)false
dc.title.pt_BR.fl_str_mv A high-fault-coverage approach for the test of data, control, and handshake interconnects in mesh networks-on-chip
title A high-fault-coverage approach for the test of data, control, and handshake interconnects in mesh networks-on-chip
spellingShingle A high-fault-coverage approach for the test of data, control, and handshake interconnects in mesh networks-on-chip
Cota, Erika Fernandes
Microeletrônica
Fault coverage
Interconnect testing
Test generation
Reliability
title_short A high-fault-coverage approach for the test of data, control, and handshake interconnects in mesh networks-on-chip
title_full A high-fault-coverage approach for the test of data, control, and handshake interconnects in mesh networks-on-chip
title_fullStr A high-fault-coverage approach for the test of data, control, and handshake interconnects in mesh networks-on-chip
title_full_unstemmed A high-fault-coverage approach for the test of data, control, and handshake interconnects in mesh networks-on-chip
title_sort A high-fault-coverage approach for the test of data, control, and handshake interconnects in mesh networks-on-chip
author Cota, Erika Fernandes
author_facet Cota, Erika Fernandes
Kastensmidt, Fernanda Gusmão de Lima
Santos, Maico Cassel dos
Hervé, Marcos Barcellos
Almeida, Pedro Rogério Vieira de
Meirelles, Paulo Roberto Miranda
Amory, Alexandre de Morais
Lubaszewski, Marcelo Soares
author_role author
author2 Kastensmidt, Fernanda Gusmão de Lima
Santos, Maico Cassel dos
Hervé, Marcos Barcellos
Almeida, Pedro Rogério Vieira de
Meirelles, Paulo Roberto Miranda
Amory, Alexandre de Morais
Lubaszewski, Marcelo Soares
author2_role author
author
author
author
author
author
author
dc.contributor.author.fl_str_mv Cota, Erika Fernandes
Kastensmidt, Fernanda Gusmão de Lima
Santos, Maico Cassel dos
Hervé, Marcos Barcellos
Almeida, Pedro Rogério Vieira de
Meirelles, Paulo Roberto Miranda
Amory, Alexandre de Morais
Lubaszewski, Marcelo Soares
dc.subject.por.fl_str_mv Microeletrônica
topic Microeletrônica
Fault coverage
Interconnect testing
Test generation
Reliability
dc.subject.eng.fl_str_mv Fault coverage
Interconnect testing
Test generation
Reliability
description A novel strategy for detecting interconnect faults between distinct channels in networks-on-chip is proposed. Short faults between distinct channels in the data, control, and communication handshake wires are considered in a cost-effective test sequence for mesh NoC topologies based on XY routing.
publishDate 2008
dc.date.issued.fl_str_mv 2008
dc.date.accessioned.fl_str_mv 2011-01-29T06:00:40Z
dc.type.driver.fl_str_mv Estrangeiro
info:eu-repo/semantics/article
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
format article
status_str publishedVersion
dc.identifier.uri.fl_str_mv http://hdl.handle.net/10183/27611
dc.identifier.issn.pt_BR.fl_str_mv 0018-9340
dc.identifier.nrb.pt_BR.fl_str_mv 000666993
identifier_str_mv 0018-9340
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url http://hdl.handle.net/10183/27611
dc.language.iso.fl_str_mv eng
language eng
dc.relation.ispartof.pt_BR.fl_str_mv IEEE transactions on computers. New York. Vol. 57, no 9 (Sept. 2008), p. 1202-1215
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv application/pdf
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instname:Universidade Federal do Rio Grande do Sul (UFRGS)
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reponame_str Repositório Institucional da UFRGS
collection Repositório Institucional da UFRGS
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