Tbulk-BICS : a Built-in current sensor robust to process and temperature variations for soft error detection

Detalhes bibliográficos
Autor(a) principal: Henes Neto, Egas
Data de Publicação: 2008
Outros Autores: Kastensmidt, Fernanda Gusmão de Lima, Wirth, Gilson Inacio
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Repositório Institucional da UFRGS
Texto Completo: http://hdl.handle.net/10183/27615
Resumo: This paper presents a parameterized current sensor able to detect transient ionization in the silicon substrate. Each sensor is controlled by a set of trimming bits that can be used to attune the sensitivity of the sensor compensating process and temperature variations. By choosing different configurations in the trimming bits, it is possible to adjust the performance of the sensor, which can increase the number of transistors monitored by a single sensor reducing the area overhead. Monte Carlo simulations are used to evaluate the sensor behavior. Results from a case-study circuit with embedded Tbulk-BICS confirm the efficiency of the technique.
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spelling Henes Neto, EgasKastensmidt, Fernanda Gusmão de LimaWirth, Gilson Inacio2011-01-29T06:00:41Z20080018-9499http://hdl.handle.net/10183/27615000684869This paper presents a parameterized current sensor able to detect transient ionization in the silicon substrate. Each sensor is controlled by a set of trimming bits that can be used to attune the sensitivity of the sensor compensating process and temperature variations. By choosing different configurations in the trimming bits, it is possible to adjust the performance of the sensor, which can increase the number of transistors monitored by a single sensor reducing the area overhead. Monte Carlo simulations are used to evaluate the sensor behavior. Results from a case-study circuit with embedded Tbulk-BICS confirm the efficiency of the technique.application/pdfengIEEE transactions on nuclear science. New York. vol. 55, no. 4, part 1 (Aug. 2008), p. 2281-2288MicroeletrônicaBuilt-in current sensorFault toleranceProcess variationsSoft errorsTbulk-BICS : a Built-in current sensor robust to process and temperature variations for soft error detectionEstrangeiroinfo:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/openAccessreponame:Repositório Institucional da UFRGSinstname:Universidade Federal do Rio Grande do Sul (UFRGS)instacron:UFRGSORIGINAL000684869.pdf000684869.pdfTexto completo (inglês)application/pdf866257http://www.lume.ufrgs.br/bitstream/10183/27615/1/000684869.pdf3a3e2376e109b2ad60eb2e82483e6baaMD51TEXT000684869.pdf.txt000684869.pdf.txtExtracted Texttext/plain35282http://www.lume.ufrgs.br/bitstream/10183/27615/2/000684869.pdf.txt08a3b4fc7d1a2121e755658001dc1b2bMD52THUMBNAIL000684869.pdf.jpg000684869.pdf.jpgGenerated Thumbnailimage/jpeg2274http://www.lume.ufrgs.br/bitstream/10183/27615/3/000684869.pdf.jpg945968f8822bc88059c5ddcdefad80faMD5310183/276152018-10-08 08:41:19.368oai:www.lume.ufrgs.br:10183/27615Repositório de PublicaçõesPUBhttps://lume.ufrgs.br/oai/requestopendoar:2018-10-08T11:41:19Repositório Institucional da UFRGS - Universidade Federal do Rio Grande do Sul (UFRGS)false
dc.title.pt_BR.fl_str_mv Tbulk-BICS : a Built-in current sensor robust to process and temperature variations for soft error detection
title Tbulk-BICS : a Built-in current sensor robust to process and temperature variations for soft error detection
spellingShingle Tbulk-BICS : a Built-in current sensor robust to process and temperature variations for soft error detection
Henes Neto, Egas
Microeletrônica
Built-in current sensor
Fault tolerance
Process variations
Soft errors
title_short Tbulk-BICS : a Built-in current sensor robust to process and temperature variations for soft error detection
title_full Tbulk-BICS : a Built-in current sensor robust to process and temperature variations for soft error detection
title_fullStr Tbulk-BICS : a Built-in current sensor robust to process and temperature variations for soft error detection
title_full_unstemmed Tbulk-BICS : a Built-in current sensor robust to process and temperature variations for soft error detection
title_sort Tbulk-BICS : a Built-in current sensor robust to process and temperature variations for soft error detection
author Henes Neto, Egas
author_facet Henes Neto, Egas
Kastensmidt, Fernanda Gusmão de Lima
Wirth, Gilson Inacio
author_role author
author2 Kastensmidt, Fernanda Gusmão de Lima
Wirth, Gilson Inacio
author2_role author
author
dc.contributor.author.fl_str_mv Henes Neto, Egas
Kastensmidt, Fernanda Gusmão de Lima
Wirth, Gilson Inacio
dc.subject.por.fl_str_mv Microeletrônica
topic Microeletrônica
Built-in current sensor
Fault tolerance
Process variations
Soft errors
dc.subject.eng.fl_str_mv Built-in current sensor
Fault tolerance
Process variations
Soft errors
description This paper presents a parameterized current sensor able to detect transient ionization in the silicon substrate. Each sensor is controlled by a set of trimming bits that can be used to attune the sensitivity of the sensor compensating process and temperature variations. By choosing different configurations in the trimming bits, it is possible to adjust the performance of the sensor, which can increase the number of transistors monitored by a single sensor reducing the area overhead. Monte Carlo simulations are used to evaluate the sensor behavior. Results from a case-study circuit with embedded Tbulk-BICS confirm the efficiency of the technique.
publishDate 2008
dc.date.issued.fl_str_mv 2008
dc.date.accessioned.fl_str_mv 2011-01-29T06:00:41Z
dc.type.driver.fl_str_mv Estrangeiro
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dc.identifier.uri.fl_str_mv http://hdl.handle.net/10183/27615
dc.identifier.issn.pt_BR.fl_str_mv 0018-9499
dc.identifier.nrb.pt_BR.fl_str_mv 000684869
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dc.language.iso.fl_str_mv eng
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dc.relation.ispartof.pt_BR.fl_str_mv IEEE transactions on nuclear science. New York. vol. 55, no. 4, part 1 (Aug. 2008), p. 2281-2288
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