Tbulk-BICS : a Built-in current sensor robust to process and temperature variations for soft error detection
Autor(a) principal: | |
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Data de Publicação: | 2008 |
Outros Autores: | , |
Tipo de documento: | Artigo |
Idioma: | eng |
Título da fonte: | Repositório Institucional da UFRGS |
Texto Completo: | http://hdl.handle.net/10183/27615 |
Resumo: | This paper presents a parameterized current sensor able to detect transient ionization in the silicon substrate. Each sensor is controlled by a set of trimming bits that can be used to attune the sensitivity of the sensor compensating process and temperature variations. By choosing different configurations in the trimming bits, it is possible to adjust the performance of the sensor, which can increase the number of transistors monitored by a single sensor reducing the area overhead. Monte Carlo simulations are used to evaluate the sensor behavior. Results from a case-study circuit with embedded Tbulk-BICS confirm the efficiency of the technique. |
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Henes Neto, EgasKastensmidt, Fernanda Gusmão de LimaWirth, Gilson Inacio2011-01-29T06:00:41Z20080018-9499http://hdl.handle.net/10183/27615000684869This paper presents a parameterized current sensor able to detect transient ionization in the silicon substrate. Each sensor is controlled by a set of trimming bits that can be used to attune the sensitivity of the sensor compensating process and temperature variations. By choosing different configurations in the trimming bits, it is possible to adjust the performance of the sensor, which can increase the number of transistors monitored by a single sensor reducing the area overhead. Monte Carlo simulations are used to evaluate the sensor behavior. Results from a case-study circuit with embedded Tbulk-BICS confirm the efficiency of the technique.application/pdfengIEEE transactions on nuclear science. New York. vol. 55, no. 4, part 1 (Aug. 2008), p. 2281-2288MicroeletrônicaBuilt-in current sensorFault toleranceProcess variationsSoft errorsTbulk-BICS : a Built-in current sensor robust to process and temperature variations for soft error detectionEstrangeiroinfo:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/openAccessreponame:Repositório Institucional da UFRGSinstname:Universidade Federal do Rio Grande do Sul (UFRGS)instacron:UFRGSORIGINAL000684869.pdf000684869.pdfTexto completo (inglês)application/pdf866257http://www.lume.ufrgs.br/bitstream/10183/27615/1/000684869.pdf3a3e2376e109b2ad60eb2e82483e6baaMD51TEXT000684869.pdf.txt000684869.pdf.txtExtracted Texttext/plain35282http://www.lume.ufrgs.br/bitstream/10183/27615/2/000684869.pdf.txt08a3b4fc7d1a2121e755658001dc1b2bMD52THUMBNAIL000684869.pdf.jpg000684869.pdf.jpgGenerated Thumbnailimage/jpeg2274http://www.lume.ufrgs.br/bitstream/10183/27615/3/000684869.pdf.jpg945968f8822bc88059c5ddcdefad80faMD5310183/276152018-10-08 08:41:19.368oai:www.lume.ufrgs.br:10183/27615Repositório de PublicaçõesPUBhttps://lume.ufrgs.br/oai/requestopendoar:2018-10-08T11:41:19Repositório Institucional da UFRGS - Universidade Federal do Rio Grande do Sul (UFRGS)false |
dc.title.pt_BR.fl_str_mv |
Tbulk-BICS : a Built-in current sensor robust to process and temperature variations for soft error detection |
title |
Tbulk-BICS : a Built-in current sensor robust to process and temperature variations for soft error detection |
spellingShingle |
Tbulk-BICS : a Built-in current sensor robust to process and temperature variations for soft error detection Henes Neto, Egas Microeletrônica Built-in current sensor Fault tolerance Process variations Soft errors |
title_short |
Tbulk-BICS : a Built-in current sensor robust to process and temperature variations for soft error detection |
title_full |
Tbulk-BICS : a Built-in current sensor robust to process and temperature variations for soft error detection |
title_fullStr |
Tbulk-BICS : a Built-in current sensor robust to process and temperature variations for soft error detection |
title_full_unstemmed |
Tbulk-BICS : a Built-in current sensor robust to process and temperature variations for soft error detection |
title_sort |
Tbulk-BICS : a Built-in current sensor robust to process and temperature variations for soft error detection |
author |
Henes Neto, Egas |
author_facet |
Henes Neto, Egas Kastensmidt, Fernanda Gusmão de Lima Wirth, Gilson Inacio |
author_role |
author |
author2 |
Kastensmidt, Fernanda Gusmão de Lima Wirth, Gilson Inacio |
author2_role |
author author |
dc.contributor.author.fl_str_mv |
Henes Neto, Egas Kastensmidt, Fernanda Gusmão de Lima Wirth, Gilson Inacio |
dc.subject.por.fl_str_mv |
Microeletrônica |
topic |
Microeletrônica Built-in current sensor Fault tolerance Process variations Soft errors |
dc.subject.eng.fl_str_mv |
Built-in current sensor Fault tolerance Process variations Soft errors |
description |
This paper presents a parameterized current sensor able to detect transient ionization in the silicon substrate. Each sensor is controlled by a set of trimming bits that can be used to attune the sensitivity of the sensor compensating process and temperature variations. By choosing different configurations in the trimming bits, it is possible to adjust the performance of the sensor, which can increase the number of transistors monitored by a single sensor reducing the area overhead. Monte Carlo simulations are used to evaluate the sensor behavior. Results from a case-study circuit with embedded Tbulk-BICS confirm the efficiency of the technique. |
publishDate |
2008 |
dc.date.issued.fl_str_mv |
2008 |
dc.date.accessioned.fl_str_mv |
2011-01-29T06:00:41Z |
dc.type.driver.fl_str_mv |
Estrangeiro info:eu-repo/semantics/article |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
format |
article |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://hdl.handle.net/10183/27615 |
dc.identifier.issn.pt_BR.fl_str_mv |
0018-9499 |
dc.identifier.nrb.pt_BR.fl_str_mv |
000684869 |
identifier_str_mv |
0018-9499 000684869 |
url |
http://hdl.handle.net/10183/27615 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.ispartof.pt_BR.fl_str_mv |
IEEE transactions on nuclear science. New York. vol. 55, no. 4, part 1 (Aug. 2008), p. 2281-2288 |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
application/pdf |
dc.source.none.fl_str_mv |
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Repositório Institucional da UFRGS |
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Repositório Institucional da UFRGS |
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