Synthesis of an 8051-like micro-controller tolerant to transient faults

Detalhes bibliográficos
Autor(a) principal: Cota, Erika Fernandes
Data de Publicação: 2001
Outros Autores: Lima, Fernanda Gusmao de, Rezgui, Sana, Carro, Luigi, Velazco, Raoul, Lubaszewski, Marcelo Soares, Reis, Ricardo Augusto da Luz
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Repositório Institucional da UFRGS
Texto Completo: http://hdl.handle.net/10183/218926
Resumo: This paper presents the implementation of a fault detection and correction technique used to design a robust 8051 micro-controller with respect to a particular transient fault called Single Event Upset (SEU). A specific study regarding the effects of a SEU in the micro-controller behavior was performed. Furthermore, a fault tolerant technique was implemented in a version of the 8051. The VHDL description of the fault-tolerant microprocessor was prototyped in a FPGA environment and results in terms of area overhead, level of protection and performance penalties are discussed.
id UFRGS-2_6d82664f15b3f68f8f9af268be0d4c4e
oai_identifier_str oai:www.lume.ufrgs.br:10183/218926
network_acronym_str UFRGS-2
network_name_str Repositório Institucional da UFRGS
repository_id_str
spelling Cota, Erika FernandesLima, Fernanda Gusmao deRezgui, SanaCarro, LuigiVelazco, RaoulLubaszewski, Marcelo SoaresReis, Ricardo Augusto da Luz2021-03-16T04:26:43Z20010923-8174http://hdl.handle.net/10183/218926000329139This paper presents the implementation of a fault detection and correction technique used to design a robust 8051 micro-controller with respect to a particular transient fault called Single Event Upset (SEU). A specific study regarding the effects of a SEU in the micro-controller behavior was performed. Furthermore, a fault tolerant technique was implemented in a version of the 8051. The VHDL description of the fault-tolerant microprocessor was prototyped in a FPGA environment and results in terms of area overhead, level of protection and performance penalties are discussed.application/pdfengJournal of electronic testing : theory and applications. Hingham. Vol. 17, n. 2 (2001), p. 149-161MicroeletrônicaIntegrated circuits radiation effectsAerospace testingBuilt-in-testingMicroprocessor testingSynthesis of an 8051-like micro-controller tolerant to transient faultsEstrangeiroinfo:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/openAccessreponame:Repositório Institucional da UFRGSinstname:Universidade Federal do Rio Grande do Sul (UFRGS)instacron:UFRGSTEXT000329139.pdf.txt000329139.pdf.txtExtracted Texttext/plain49371http://www.lume.ufrgs.br/bitstream/10183/218926/2/000329139.pdf.txt8b6abc8236f9454260f597bd7e80d8e3MD52ORIGINAL000329139.pdfTexto completo (inglês)application/pdf405634http://www.lume.ufrgs.br/bitstream/10183/218926/1/000329139.pdf67797ecce5fb7f47d88aed371d0d88c6MD5110183/2189262021-06-26 04:46:22.805169oai:www.lume.ufrgs.br:10183/218926Repositório de PublicaçõesPUBhttps://lume.ufrgs.br/oai/requestopendoar:2021-06-26T07:46:22Repositório Institucional da UFRGS - Universidade Federal do Rio Grande do Sul (UFRGS)false
dc.title.pt_BR.fl_str_mv Synthesis of an 8051-like micro-controller tolerant to transient faults
title Synthesis of an 8051-like micro-controller tolerant to transient faults
spellingShingle Synthesis of an 8051-like micro-controller tolerant to transient faults
Cota, Erika Fernandes
Microeletrônica
Integrated circuits radiation effects
Aerospace testing
Built-in-testing
Microprocessor testing
title_short Synthesis of an 8051-like micro-controller tolerant to transient faults
title_full Synthesis of an 8051-like micro-controller tolerant to transient faults
title_fullStr Synthesis of an 8051-like micro-controller tolerant to transient faults
title_full_unstemmed Synthesis of an 8051-like micro-controller tolerant to transient faults
title_sort Synthesis of an 8051-like micro-controller tolerant to transient faults
author Cota, Erika Fernandes
author_facet Cota, Erika Fernandes
Lima, Fernanda Gusmao de
Rezgui, Sana
Carro, Luigi
Velazco, Raoul
Lubaszewski, Marcelo Soares
Reis, Ricardo Augusto da Luz
author_role author
author2 Lima, Fernanda Gusmao de
Rezgui, Sana
Carro, Luigi
Velazco, Raoul
Lubaszewski, Marcelo Soares
Reis, Ricardo Augusto da Luz
author2_role author
author
author
author
author
author
dc.contributor.author.fl_str_mv Cota, Erika Fernandes
Lima, Fernanda Gusmao de
Rezgui, Sana
Carro, Luigi
Velazco, Raoul
Lubaszewski, Marcelo Soares
Reis, Ricardo Augusto da Luz
dc.subject.por.fl_str_mv Microeletrônica
topic Microeletrônica
Integrated circuits radiation effects
Aerospace testing
Built-in-testing
Microprocessor testing
dc.subject.eng.fl_str_mv Integrated circuits radiation effects
Aerospace testing
Built-in-testing
Microprocessor testing
description This paper presents the implementation of a fault detection and correction technique used to design a robust 8051 micro-controller with respect to a particular transient fault called Single Event Upset (SEU). A specific study regarding the effects of a SEU in the micro-controller behavior was performed. Furthermore, a fault tolerant technique was implemented in a version of the 8051. The VHDL description of the fault-tolerant microprocessor was prototyped in a FPGA environment and results in terms of area overhead, level of protection and performance penalties are discussed.
publishDate 2001
dc.date.issued.fl_str_mv 2001
dc.date.accessioned.fl_str_mv 2021-03-16T04:26:43Z
dc.type.driver.fl_str_mv Estrangeiro
info:eu-repo/semantics/article
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
format article
status_str publishedVersion
dc.identifier.uri.fl_str_mv http://hdl.handle.net/10183/218926
dc.identifier.issn.pt_BR.fl_str_mv 0923-8174
dc.identifier.nrb.pt_BR.fl_str_mv 000329139
identifier_str_mv 0923-8174
000329139
url http://hdl.handle.net/10183/218926
dc.language.iso.fl_str_mv eng
language eng
dc.relation.ispartof.pt_BR.fl_str_mv Journal of electronic testing : theory and applications. Hingham. Vol. 17, n. 2 (2001), p. 149-161
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv application/pdf
dc.source.none.fl_str_mv reponame:Repositório Institucional da UFRGS
instname:Universidade Federal do Rio Grande do Sul (UFRGS)
instacron:UFRGS
instname_str Universidade Federal do Rio Grande do Sul (UFRGS)
instacron_str UFRGS
institution UFRGS
reponame_str Repositório Institucional da UFRGS
collection Repositório Institucional da UFRGS
bitstream.url.fl_str_mv http://www.lume.ufrgs.br/bitstream/10183/218926/2/000329139.pdf.txt
http://www.lume.ufrgs.br/bitstream/10183/218926/1/000329139.pdf
bitstream.checksum.fl_str_mv 8b6abc8236f9454260f597bd7e80d8e3
67797ecce5fb7f47d88aed371d0d88c6
bitstream.checksumAlgorithm.fl_str_mv MD5
MD5
repository.name.fl_str_mv Repositório Institucional da UFRGS - Universidade Federal do Rio Grande do Sul (UFRGS)
repository.mail.fl_str_mv
_version_ 1815447735338270720

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