Testing a fault tolerant mixed-signal design under TID and heavy ions
Autor(a) principal: | |
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Data de Publicação: | 2021 |
Outros Autores: | , , , , , , , , , , , |
Tipo de documento: | Artigo |
Idioma: | eng |
Título da fonte: | Repositório Institucional da UFRGS |
Texto Completo: | http://hdl.handle.net/10183/256486 |
Resumo: | This work presents results of three distinctradiation tests performed upon a fault tolerant data acqui-sition system comprising a design diversity redundancytechnique. The first and second experiments are Total Ion-izing Dose (TID) essays, comprising gamma and X-rayirradiations. The last experiment considers single eventeffects, in which two heavy ion irradiation campaignsare carried out. The case study system comprises threeanalog-to-digital converters and two software-based vot-ers, besides additional software and hardware resourcesused for controlling, monitoring and memory manage-ment. The applied Diversity Triple Modular Redundancy(DTMR) technique, comprises different levels of diversity(temporal and architectural). The circuit was designed ina programmable System-on-Chip (PSoC), fabricated in a130nm CMOS technology process. Results show that thetechnique may increase the lifetime of the system underTID if comparing with a non-redundant implementation.Considering the heavy ions experiments the system wasproved effective to tolerate 100% of the observed errorsoriginated in the converters, while errors in the process-ing unit present a higher criticality. Critical errors occur-ring in one of the voters were also observed. A secondheavy ion campaign was then carried out to investigatethe voters reliability, comparing the the dynamic cross sec-tion of three different software-based voter schemes im-plemented in the considered PSoC. |
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González Aguilera, Carlos JulioMachado, Diego do NascimentoVaz, Rafael GalhardoVilas Bôas, Alexis CristianoGonçalez, Odair LelisPuchner, Helmut K.Added, NemitalaMacchione, EduardoAguiar, Vitor Ângelo Paulino deKastensmidt, Fernanda Gusmão de LimaMedina, Nilberto HedarGuazzelli, Marcilei AparecidaBalen, Tiago Roberto2023-03-30T03:23:21Z20211807-1953http://hdl.handle.net/10183/256486001164218This work presents results of three distinctradiation tests performed upon a fault tolerant data acqui-sition system comprising a design diversity redundancytechnique. The first and second experiments are Total Ion-izing Dose (TID) essays, comprising gamma and X-rayirradiations. The last experiment considers single eventeffects, in which two heavy ion irradiation campaignsare carried out. The case study system comprises threeanalog-to-digital converters and two software-based vot-ers, besides additional software and hardware resourcesused for controlling, monitoring and memory manage-ment. The applied Diversity Triple Modular Redundancy(DTMR) technique, comprises different levels of diversity(temporal and architectural). The circuit was designed ina programmable System-on-Chip (PSoC), fabricated in a130nm CMOS technology process. Results show that thetechnique may increase the lifetime of the system underTID if comparing with a non-redundant implementation.Considering the heavy ions experiments the system wasproved effective to tolerate 100% of the observed errorsoriginated in the converters, while errors in the process-ing unit present a higher criticality. Critical errors occur-ring in one of the voters were also observed. A secondheavy ion campaign was then carried out to investigatethe voters reliability, comparing the the dynamic cross sec-tion of three different software-based voter schemes im-plemented in the considered PSoC.application/pdfengJournal of integrated circuits and systems. Porto Alegre. Vol. 16, no.3 (2021), p. 1-10Aquisição de dadosEfeitos da radiaçãoConversor analogico/digitalDesign diversity redundancyMixed-signalRadiationSingle eventsSoft errorsFault toleranceAnalog-to-digital convertersProgrammable devicePSoCTesting a fault tolerant mixed-signal design under TID and heavy ionsinfo:eu-repo/semantics/articleinfo:eu-repo/semantics/otherinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/openAccessreponame:Repositório Institucional da UFRGSinstname:Universidade Federal do Rio Grande do Sul (UFRGS)instacron:UFRGSTEXT001164218.pdf.txt001164218.pdf.txtExtracted Texttext/plain49930http://www.lume.ufrgs.br/bitstream/10183/256486/2/001164218.pdf.txtc8d578727105466fdbbe11963ada56f0MD52ORIGINAL001164218.pdfTexto completo (inglês)application/pdf13080210http://www.lume.ufrgs.br/bitstream/10183/256486/1/001164218.pdf739a699738a7f3fbfa0a950d44601e0aMD5110183/2564862023-06-30 03:32:51.15929oai:www.lume.ufrgs.br:10183/256486Repositório de PublicaçõesPUBhttps://lume.ufrgs.br/oai/requestopendoar:2023-06-30T06:32:51Repositório Institucional da UFRGS - Universidade Federal do Rio Grande do Sul (UFRGS)false |
dc.title.pt_BR.fl_str_mv |
Testing a fault tolerant mixed-signal design under TID and heavy ions |
title |
Testing a fault tolerant mixed-signal design under TID and heavy ions |
spellingShingle |
Testing a fault tolerant mixed-signal design under TID and heavy ions González Aguilera, Carlos Julio Aquisição de dados Efeitos da radiação Conversor analogico/digital Design diversity redundancy Mixed-signal Radiation Single events Soft errors Fault tolerance Analog-to-digital converters Programmable device PSoC |
title_short |
Testing a fault tolerant mixed-signal design under TID and heavy ions |
title_full |
Testing a fault tolerant mixed-signal design under TID and heavy ions |
title_fullStr |
Testing a fault tolerant mixed-signal design under TID and heavy ions |
title_full_unstemmed |
Testing a fault tolerant mixed-signal design under TID and heavy ions |
title_sort |
Testing a fault tolerant mixed-signal design under TID and heavy ions |
author |
González Aguilera, Carlos Julio |
author_facet |
González Aguilera, Carlos Julio Machado, Diego do Nascimento Vaz, Rafael Galhardo Vilas Bôas, Alexis Cristiano Gonçalez, Odair Lelis Puchner, Helmut K. Added, Nemitala Macchione, Eduardo Aguiar, Vitor Ângelo Paulino de Kastensmidt, Fernanda Gusmão de Lima Medina, Nilberto Hedar Guazzelli, Marcilei Aparecida Balen, Tiago Roberto |
author_role |
author |
author2 |
Machado, Diego do Nascimento Vaz, Rafael Galhardo Vilas Bôas, Alexis Cristiano Gonçalez, Odair Lelis Puchner, Helmut K. Added, Nemitala Macchione, Eduardo Aguiar, Vitor Ângelo Paulino de Kastensmidt, Fernanda Gusmão de Lima Medina, Nilberto Hedar Guazzelli, Marcilei Aparecida Balen, Tiago Roberto |
author2_role |
author author author author author author author author author author author author |
dc.contributor.author.fl_str_mv |
González Aguilera, Carlos Julio Machado, Diego do Nascimento Vaz, Rafael Galhardo Vilas Bôas, Alexis Cristiano Gonçalez, Odair Lelis Puchner, Helmut K. Added, Nemitala Macchione, Eduardo Aguiar, Vitor Ângelo Paulino de Kastensmidt, Fernanda Gusmão de Lima Medina, Nilberto Hedar Guazzelli, Marcilei Aparecida Balen, Tiago Roberto |
dc.subject.por.fl_str_mv |
Aquisição de dados Efeitos da radiação Conversor analogico/digital |
topic |
Aquisição de dados Efeitos da radiação Conversor analogico/digital Design diversity redundancy Mixed-signal Radiation Single events Soft errors Fault tolerance Analog-to-digital converters Programmable device PSoC |
dc.subject.eng.fl_str_mv |
Design diversity redundancy Mixed-signal Radiation Single events Soft errors Fault tolerance Analog-to-digital converters Programmable device PSoC |
description |
This work presents results of three distinctradiation tests performed upon a fault tolerant data acqui-sition system comprising a design diversity redundancytechnique. The first and second experiments are Total Ion-izing Dose (TID) essays, comprising gamma and X-rayirradiations. The last experiment considers single eventeffects, in which two heavy ion irradiation campaignsare carried out. The case study system comprises threeanalog-to-digital converters and two software-based vot-ers, besides additional software and hardware resourcesused for controlling, monitoring and memory manage-ment. The applied Diversity Triple Modular Redundancy(DTMR) technique, comprises different levels of diversity(temporal and architectural). The circuit was designed ina programmable System-on-Chip (PSoC), fabricated in a130nm CMOS technology process. Results show that thetechnique may increase the lifetime of the system underTID if comparing with a non-redundant implementation.Considering the heavy ions experiments the system wasproved effective to tolerate 100% of the observed errorsoriginated in the converters, while errors in the process-ing unit present a higher criticality. Critical errors occur-ring in one of the voters were also observed. A secondheavy ion campaign was then carried out to investigatethe voters reliability, comparing the the dynamic cross sec-tion of three different software-based voter schemes im-plemented in the considered PSoC. |
publishDate |
2021 |
dc.date.issued.fl_str_mv |
2021 |
dc.date.accessioned.fl_str_mv |
2023-03-30T03:23:21Z |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/article info:eu-repo/semantics/other |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
format |
article |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://hdl.handle.net/10183/256486 |
dc.identifier.issn.pt_BR.fl_str_mv |
1807-1953 |
dc.identifier.nrb.pt_BR.fl_str_mv |
001164218 |
identifier_str_mv |
1807-1953 001164218 |
url |
http://hdl.handle.net/10183/256486 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.ispartof.pt_BR.fl_str_mv |
Journal of integrated circuits and systems. Porto Alegre. Vol. 16, no.3 (2021), p. 1-10 |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
application/pdf |
dc.source.none.fl_str_mv |
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