Testing a fault tolerant mixed-signal design under TID and heavy ions

Detalhes bibliográficos
Autor(a) principal: González Aguilera, Carlos Julio
Data de Publicação: 2021
Outros Autores: Machado, Diego do Nascimento, Vaz, Rafael Galhardo, Vilas Bôas, Alexis Cristiano, Gonçalez, Odair Lelis, Puchner, Helmut K., Added, Nemitala, Macchione, Eduardo, Aguiar, Vitor Ângelo Paulino de, Kastensmidt, Fernanda Gusmão de Lima, Medina, Nilberto Hedar, Guazzelli, Marcilei Aparecida, Balen, Tiago Roberto
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Repositório Institucional da UFRGS
Texto Completo: http://hdl.handle.net/10183/256486
Resumo: This work presents results of three distinctradiation tests performed upon a fault tolerant data acqui-sition system comprising a design diversity redundancytechnique. The first and second experiments are Total Ion-izing Dose (TID) essays, comprising gamma and X-rayirradiations. The last experiment considers single eventeffects, in which two heavy ion irradiation campaignsare carried out. The case study system comprises threeanalog-to-digital converters and two software-based vot-ers, besides additional software and hardware resourcesused for controlling, monitoring and memory manage-ment. The applied Diversity Triple Modular Redundancy(DTMR) technique, comprises different levels of diversity(temporal and architectural). The circuit was designed ina programmable System-on-Chip (PSoC), fabricated in a130nm CMOS technology process. Results show that thetechnique may increase the lifetime of the system underTID if comparing with a non-redundant implementation.Considering the heavy ions experiments the system wasproved effective to tolerate 100% of the observed errorsoriginated in the converters, while errors in the process-ing unit present a higher criticality. Critical errors occur-ring in one of the voters were also observed. A secondheavy ion campaign was then carried out to investigatethe voters reliability, comparing the the dynamic cross sec-tion of three different software-based voter schemes im-plemented in the considered PSoC.
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spelling González Aguilera, Carlos JulioMachado, Diego do NascimentoVaz, Rafael GalhardoVilas Bôas, Alexis CristianoGonçalez, Odair LelisPuchner, Helmut K.Added, NemitalaMacchione, EduardoAguiar, Vitor Ângelo Paulino deKastensmidt, Fernanda Gusmão de LimaMedina, Nilberto HedarGuazzelli, Marcilei AparecidaBalen, Tiago Roberto2023-03-30T03:23:21Z20211807-1953http://hdl.handle.net/10183/256486001164218This work presents results of three distinctradiation tests performed upon a fault tolerant data acqui-sition system comprising a design diversity redundancytechnique. The first and second experiments are Total Ion-izing Dose (TID) essays, comprising gamma and X-rayirradiations. The last experiment considers single eventeffects, in which two heavy ion irradiation campaignsare carried out. The case study system comprises threeanalog-to-digital converters and two software-based vot-ers, besides additional software and hardware resourcesused for controlling, monitoring and memory manage-ment. The applied Diversity Triple Modular Redundancy(DTMR) technique, comprises different levels of diversity(temporal and architectural). The circuit was designed ina programmable System-on-Chip (PSoC), fabricated in a130nm CMOS technology process. Results show that thetechnique may increase the lifetime of the system underTID if comparing with a non-redundant implementation.Considering the heavy ions experiments the system wasproved effective to tolerate 100% of the observed errorsoriginated in the converters, while errors in the process-ing unit present a higher criticality. Critical errors occur-ring in one of the voters were also observed. A secondheavy ion campaign was then carried out to investigatethe voters reliability, comparing the the dynamic cross sec-tion of three different software-based voter schemes im-plemented in the considered PSoC.application/pdfengJournal of integrated circuits and systems. Porto Alegre. Vol. 16, no.3 (2021), p. 1-10Aquisição de dadosEfeitos da radiaçãoConversor analogico/digitalDesign diversity redundancyMixed-signalRadiationSingle eventsSoft errorsFault toleranceAnalog-to-digital convertersProgrammable devicePSoCTesting a fault tolerant mixed-signal design under TID and heavy ionsinfo:eu-repo/semantics/articleinfo:eu-repo/semantics/otherinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/openAccessreponame:Repositório Institucional da UFRGSinstname:Universidade Federal do Rio Grande do Sul (UFRGS)instacron:UFRGSTEXT001164218.pdf.txt001164218.pdf.txtExtracted Texttext/plain49930http://www.lume.ufrgs.br/bitstream/10183/256486/2/001164218.pdf.txtc8d578727105466fdbbe11963ada56f0MD52ORIGINAL001164218.pdfTexto completo (inglês)application/pdf13080210http://www.lume.ufrgs.br/bitstream/10183/256486/1/001164218.pdf739a699738a7f3fbfa0a950d44601e0aMD5110183/2564862023-06-30 03:32:51.15929oai:www.lume.ufrgs.br:10183/256486Repositório de PublicaçõesPUBhttps://lume.ufrgs.br/oai/requestopendoar:2023-06-30T06:32:51Repositório Institucional da UFRGS - Universidade Federal do Rio Grande do Sul (UFRGS)false
dc.title.pt_BR.fl_str_mv Testing a fault tolerant mixed-signal design under TID and heavy ions
title Testing a fault tolerant mixed-signal design under TID and heavy ions
spellingShingle Testing a fault tolerant mixed-signal design under TID and heavy ions
González Aguilera, Carlos Julio
Aquisição de dados
Efeitos da radiação
Conversor analogico/digital
Design diversity redundancy
Mixed-signal
Radiation
Single events
Soft errors
Fault tolerance
Analog-to-digital converters
Programmable device
PSoC
title_short Testing a fault tolerant mixed-signal design under TID and heavy ions
title_full Testing a fault tolerant mixed-signal design under TID and heavy ions
title_fullStr Testing a fault tolerant mixed-signal design under TID and heavy ions
title_full_unstemmed Testing a fault tolerant mixed-signal design under TID and heavy ions
title_sort Testing a fault tolerant mixed-signal design under TID and heavy ions
author González Aguilera, Carlos Julio
author_facet González Aguilera, Carlos Julio
Machado, Diego do Nascimento
Vaz, Rafael Galhardo
Vilas Bôas, Alexis Cristiano
Gonçalez, Odair Lelis
Puchner, Helmut K.
Added, Nemitala
Macchione, Eduardo
Aguiar, Vitor Ângelo Paulino de
Kastensmidt, Fernanda Gusmão de Lima
Medina, Nilberto Hedar
Guazzelli, Marcilei Aparecida
Balen, Tiago Roberto
author_role author
author2 Machado, Diego do Nascimento
Vaz, Rafael Galhardo
Vilas Bôas, Alexis Cristiano
Gonçalez, Odair Lelis
Puchner, Helmut K.
Added, Nemitala
Macchione, Eduardo
Aguiar, Vitor Ângelo Paulino de
Kastensmidt, Fernanda Gusmão de Lima
Medina, Nilberto Hedar
Guazzelli, Marcilei Aparecida
Balen, Tiago Roberto
author2_role author
author
author
author
author
author
author
author
author
author
author
author
dc.contributor.author.fl_str_mv González Aguilera, Carlos Julio
Machado, Diego do Nascimento
Vaz, Rafael Galhardo
Vilas Bôas, Alexis Cristiano
Gonçalez, Odair Lelis
Puchner, Helmut K.
Added, Nemitala
Macchione, Eduardo
Aguiar, Vitor Ângelo Paulino de
Kastensmidt, Fernanda Gusmão de Lima
Medina, Nilberto Hedar
Guazzelli, Marcilei Aparecida
Balen, Tiago Roberto
dc.subject.por.fl_str_mv Aquisição de dados
Efeitos da radiação
Conversor analogico/digital
topic Aquisição de dados
Efeitos da radiação
Conversor analogico/digital
Design diversity redundancy
Mixed-signal
Radiation
Single events
Soft errors
Fault tolerance
Analog-to-digital converters
Programmable device
PSoC
dc.subject.eng.fl_str_mv Design diversity redundancy
Mixed-signal
Radiation
Single events
Soft errors
Fault tolerance
Analog-to-digital converters
Programmable device
PSoC
description This work presents results of three distinctradiation tests performed upon a fault tolerant data acqui-sition system comprising a design diversity redundancytechnique. The first and second experiments are Total Ion-izing Dose (TID) essays, comprising gamma and X-rayirradiations. The last experiment considers single eventeffects, in which two heavy ion irradiation campaignsare carried out. The case study system comprises threeanalog-to-digital converters and two software-based vot-ers, besides additional software and hardware resourcesused for controlling, monitoring and memory manage-ment. The applied Diversity Triple Modular Redundancy(DTMR) technique, comprises different levels of diversity(temporal and architectural). The circuit was designed ina programmable System-on-Chip (PSoC), fabricated in a130nm CMOS technology process. Results show that thetechnique may increase the lifetime of the system underTID if comparing with a non-redundant implementation.Considering the heavy ions experiments the system wasproved effective to tolerate 100% of the observed errorsoriginated in the converters, while errors in the process-ing unit present a higher criticality. Critical errors occur-ring in one of the voters were also observed. A secondheavy ion campaign was then carried out to investigatethe voters reliability, comparing the the dynamic cross sec-tion of three different software-based voter schemes im-plemented in the considered PSoC.
publishDate 2021
dc.date.issued.fl_str_mv 2021
dc.date.accessioned.fl_str_mv 2023-03-30T03:23:21Z
dc.type.driver.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/other
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dc.identifier.uri.fl_str_mv http://hdl.handle.net/10183/256486
dc.identifier.issn.pt_BR.fl_str_mv 1807-1953
dc.identifier.nrb.pt_BR.fl_str_mv 001164218
identifier_str_mv 1807-1953
001164218
url http://hdl.handle.net/10183/256486
dc.language.iso.fl_str_mv eng
language eng
dc.relation.ispartof.pt_BR.fl_str_mv Journal of integrated circuits and systems. Porto Alegre. Vol. 16, no.3 (2021), p. 1-10
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