Experimental determination of cross sections for K-shell ionization by electron impact for C, O, Al, Si, and Ti

Detalhes bibliográficos
Autor(a) principal: Limandri, Silvina P.
Data de Publicação: 2012
Outros Autores: Vasconcellos, Marcos Antonio Zen, Hinrichs, Ruth, Trincavelli, Jorge C.
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Repositório Institucional da UFRGS
Texto Completo: http://hdl.handle.net/10183/104535
Resumo: Cross sections for K-shell ionization by electron impact were determined from films of Al, Si, and Ti and their oxides deposited on carbon substrates, for incident energies between 2.5 and 25 keV. The spectral processing of the x-ray emission spectra took into account corrections due to the presence of a spontaneous oxide layer formed on the monoelemental films and to the supporting material. CarbonK-shell ionization cross sections were determined from the contribution of the substrate to the measured spectra, while for oxygen, data from the three oxide films were taken. The mass thickness of the coatings was characterized by x-ray reflectivity. The results obtained were compared with other experimental data sets, semiempirical approaches, and theoretical models.
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spelling Limandri, Silvina P.Vasconcellos, Marcos Antonio ZenHinrichs, RuthTrincavelli, Jorge C.2014-10-14T02:13:11Z20121050-2947http://hdl.handle.net/10183/104535000863282Cross sections for K-shell ionization by electron impact were determined from films of Al, Si, and Ti and their oxides deposited on carbon substrates, for incident energies between 2.5 and 25 keV. The spectral processing of the x-ray emission spectra took into account corrections due to the presence of a spontaneous oxide layer formed on the monoelemental films and to the supporting material. CarbonK-shell ionization cross sections were determined from the contribution of the substrate to the measured spectra, while for oxygen, data from the three oxide films were taken. The mass thickness of the coatings was characterized by x-ray reflectivity. The results obtained were compared with other experimental data sets, semiempirical approaches, and theoretical models.application/pdfengPhysical review. A, Atomic, molecular, and optical physics. New York. Vol. 86, n. 4 (Oct. 2012), 042701, 10 p.Física da matéria condensadaIonizacao de atomosExperimental determination of cross sections for K-shell ionization by electron impact for C, O, Al, Si, and TiEstrangeiroinfo:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/openAccessreponame:Repositório Institucional da UFRGSinstname:Universidade Federal do Rio Grande do Sul (UFRGS)instacron:UFRGSORIGINAL000863282.pdf000863282.pdfTexto completo (inglês)application/pdf779894http://www.lume.ufrgs.br/bitstream/10183/104535/1/000863282.pdf2cd6d12a171be5572de66063c657ac8bMD51TEXT000863282.pdf.txt000863282.pdf.txtExtracted Texttext/plain47546http://www.lume.ufrgs.br/bitstream/10183/104535/2/000863282.pdf.txt75a5708140329b743c40ae29b373b744MD5210183/1045352018-06-07 02:32:53.914448oai:www.lume.ufrgs.br:10183/104535Repositório de PublicaçõesPUBhttps://lume.ufrgs.br/oai/requestopendoar:2018-06-07T05:32:53Repositório Institucional da UFRGS - Universidade Federal do Rio Grande do Sul (UFRGS)false
dc.title.pt_BR.fl_str_mv Experimental determination of cross sections for K-shell ionization by electron impact for C, O, Al, Si, and Ti
title Experimental determination of cross sections for K-shell ionization by electron impact for C, O, Al, Si, and Ti
spellingShingle Experimental determination of cross sections for K-shell ionization by electron impact for C, O, Al, Si, and Ti
Limandri, Silvina P.
Física da matéria condensada
Ionizacao de atomos
title_short Experimental determination of cross sections for K-shell ionization by electron impact for C, O, Al, Si, and Ti
title_full Experimental determination of cross sections for K-shell ionization by electron impact for C, O, Al, Si, and Ti
title_fullStr Experimental determination of cross sections for K-shell ionization by electron impact for C, O, Al, Si, and Ti
title_full_unstemmed Experimental determination of cross sections for K-shell ionization by electron impact for C, O, Al, Si, and Ti
title_sort Experimental determination of cross sections for K-shell ionization by electron impact for C, O, Al, Si, and Ti
author Limandri, Silvina P.
author_facet Limandri, Silvina P.
Vasconcellos, Marcos Antonio Zen
Hinrichs, Ruth
Trincavelli, Jorge C.
author_role author
author2 Vasconcellos, Marcos Antonio Zen
Hinrichs, Ruth
Trincavelli, Jorge C.
author2_role author
author
author
dc.contributor.author.fl_str_mv Limandri, Silvina P.
Vasconcellos, Marcos Antonio Zen
Hinrichs, Ruth
Trincavelli, Jorge C.
dc.subject.por.fl_str_mv Física da matéria condensada
Ionizacao de atomos
topic Física da matéria condensada
Ionizacao de atomos
description Cross sections for K-shell ionization by electron impact were determined from films of Al, Si, and Ti and their oxides deposited on carbon substrates, for incident energies between 2.5 and 25 keV. The spectral processing of the x-ray emission spectra took into account corrections due to the presence of a spontaneous oxide layer formed on the monoelemental films and to the supporting material. CarbonK-shell ionization cross sections were determined from the contribution of the substrate to the measured spectra, while for oxygen, data from the three oxide films were taken. The mass thickness of the coatings was characterized by x-ray reflectivity. The results obtained were compared with other experimental data sets, semiempirical approaches, and theoretical models.
publishDate 2012
dc.date.issued.fl_str_mv 2012
dc.date.accessioned.fl_str_mv 2014-10-14T02:13:11Z
dc.type.driver.fl_str_mv Estrangeiro
info:eu-repo/semantics/article
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
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dc.identifier.uri.fl_str_mv http://hdl.handle.net/10183/104535
dc.identifier.issn.pt_BR.fl_str_mv 1050-2947
dc.identifier.nrb.pt_BR.fl_str_mv 000863282
identifier_str_mv 1050-2947
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dc.language.iso.fl_str_mv eng
language eng
dc.relation.ispartof.pt_BR.fl_str_mv Physical review. A, Atomic, molecular, and optical physics. New York. Vol. 86, n. 4 (Oct. 2012), 042701, 10 p.
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