Experimental determination of cross sections for K-shell ionization by electron impact for C, O, Al, Si, and Ti
Autor(a) principal: | |
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Data de Publicação: | 2012 |
Outros Autores: | , , |
Tipo de documento: | Artigo |
Idioma: | eng |
Título da fonte: | Repositório Institucional da UFRGS |
Texto Completo: | http://hdl.handle.net/10183/104535 |
Resumo: | Cross sections for K-shell ionization by electron impact were determined from films of Al, Si, and Ti and their oxides deposited on carbon substrates, for incident energies between 2.5 and 25 keV. The spectral processing of the x-ray emission spectra took into account corrections due to the presence of a spontaneous oxide layer formed on the monoelemental films and to the supporting material. CarbonK-shell ionization cross sections were determined from the contribution of the substrate to the measured spectra, while for oxygen, data from the three oxide films were taken. The mass thickness of the coatings was characterized by x-ray reflectivity. The results obtained were compared with other experimental data sets, semiempirical approaches, and theoretical models. |
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Limandri, Silvina P.Vasconcellos, Marcos Antonio ZenHinrichs, RuthTrincavelli, Jorge C.2014-10-14T02:13:11Z20121050-2947http://hdl.handle.net/10183/104535000863282Cross sections for K-shell ionization by electron impact were determined from films of Al, Si, and Ti and their oxides deposited on carbon substrates, for incident energies between 2.5 and 25 keV. The spectral processing of the x-ray emission spectra took into account corrections due to the presence of a spontaneous oxide layer formed on the monoelemental films and to the supporting material. CarbonK-shell ionization cross sections were determined from the contribution of the substrate to the measured spectra, while for oxygen, data from the three oxide films were taken. The mass thickness of the coatings was characterized by x-ray reflectivity. The results obtained were compared with other experimental data sets, semiempirical approaches, and theoretical models.application/pdfengPhysical review. A, Atomic, molecular, and optical physics. New York. Vol. 86, n. 4 (Oct. 2012), 042701, 10 p.Física da matéria condensadaIonizacao de atomosExperimental determination of cross sections for K-shell ionization by electron impact for C, O, Al, Si, and TiEstrangeiroinfo:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/openAccessreponame:Repositório Institucional da UFRGSinstname:Universidade Federal do Rio Grande do Sul (UFRGS)instacron:UFRGSORIGINAL000863282.pdf000863282.pdfTexto completo (inglês)application/pdf779894http://www.lume.ufrgs.br/bitstream/10183/104535/1/000863282.pdf2cd6d12a171be5572de66063c657ac8bMD51TEXT000863282.pdf.txt000863282.pdf.txtExtracted Texttext/plain47546http://www.lume.ufrgs.br/bitstream/10183/104535/2/000863282.pdf.txt75a5708140329b743c40ae29b373b744MD5210183/1045352018-06-07 02:32:53.914448oai:www.lume.ufrgs.br:10183/104535Repositório de PublicaçõesPUBhttps://lume.ufrgs.br/oai/requestopendoar:2018-06-07T05:32:53Repositório Institucional da UFRGS - Universidade Federal do Rio Grande do Sul (UFRGS)false |
dc.title.pt_BR.fl_str_mv |
Experimental determination of cross sections for K-shell ionization by electron impact for C, O, Al, Si, and Ti |
title |
Experimental determination of cross sections for K-shell ionization by electron impact for C, O, Al, Si, and Ti |
spellingShingle |
Experimental determination of cross sections for K-shell ionization by electron impact for C, O, Al, Si, and Ti Limandri, Silvina P. Física da matéria condensada Ionizacao de atomos |
title_short |
Experimental determination of cross sections for K-shell ionization by electron impact for C, O, Al, Si, and Ti |
title_full |
Experimental determination of cross sections for K-shell ionization by electron impact for C, O, Al, Si, and Ti |
title_fullStr |
Experimental determination of cross sections for K-shell ionization by electron impact for C, O, Al, Si, and Ti |
title_full_unstemmed |
Experimental determination of cross sections for K-shell ionization by electron impact for C, O, Al, Si, and Ti |
title_sort |
Experimental determination of cross sections for K-shell ionization by electron impact for C, O, Al, Si, and Ti |
author |
Limandri, Silvina P. |
author_facet |
Limandri, Silvina P. Vasconcellos, Marcos Antonio Zen Hinrichs, Ruth Trincavelli, Jorge C. |
author_role |
author |
author2 |
Vasconcellos, Marcos Antonio Zen Hinrichs, Ruth Trincavelli, Jorge C. |
author2_role |
author author author |
dc.contributor.author.fl_str_mv |
Limandri, Silvina P. Vasconcellos, Marcos Antonio Zen Hinrichs, Ruth Trincavelli, Jorge C. |
dc.subject.por.fl_str_mv |
Física da matéria condensada Ionizacao de atomos |
topic |
Física da matéria condensada Ionizacao de atomos |
description |
Cross sections for K-shell ionization by electron impact were determined from films of Al, Si, and Ti and their oxides deposited on carbon substrates, for incident energies between 2.5 and 25 keV. The spectral processing of the x-ray emission spectra took into account corrections due to the presence of a spontaneous oxide layer formed on the monoelemental films and to the supporting material. CarbonK-shell ionization cross sections were determined from the contribution of the substrate to the measured spectra, while for oxygen, data from the three oxide films were taken. The mass thickness of the coatings was characterized by x-ray reflectivity. The results obtained were compared with other experimental data sets, semiempirical approaches, and theoretical models. |
publishDate |
2012 |
dc.date.issued.fl_str_mv |
2012 |
dc.date.accessioned.fl_str_mv |
2014-10-14T02:13:11Z |
dc.type.driver.fl_str_mv |
Estrangeiro info:eu-repo/semantics/article |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
format |
article |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://hdl.handle.net/10183/104535 |
dc.identifier.issn.pt_BR.fl_str_mv |
1050-2947 |
dc.identifier.nrb.pt_BR.fl_str_mv |
000863282 |
identifier_str_mv |
1050-2947 000863282 |
url |
http://hdl.handle.net/10183/104535 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.ispartof.pt_BR.fl_str_mv |
Physical review. A, Atomic, molecular, and optical physics. New York. Vol. 86, n. 4 (Oct. 2012), 042701, 10 p. |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
application/pdf |
dc.source.none.fl_str_mv |
reponame:Repositório Institucional da UFRGS instname:Universidade Federal do Rio Grande do Sul (UFRGS) instacron:UFRGS |
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UFRGS |
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Repositório Institucional da UFRGS |
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Repositório Institucional da UFRGS |
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