Device degradation and resilient computing

Detalhes bibliográficos
Autor(a) principal: Glösekötter, Peter
Data de Publicação: 2008
Outros Autores: Greveler, Ulrich, Wirth, Gilson Inacio
Tipo de documento: Artigo de conferência
Idioma: eng
Título da fonte: Repositório Institucional da UFRGS
Texto Completo: http://hdl.handle.net/10183/30284
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dc.title.pt_BR.fl_str_mv Device degradation and resilient computing
title Device degradation and resilient computing
spellingShingle Device degradation and resilient computing
Glösekötter, Peter
Microeletrônica
title_short Device degradation and resilient computing
title_full Device degradation and resilient computing
title_fullStr Device degradation and resilient computing
title_full_unstemmed Device degradation and resilient computing
title_sort Device degradation and resilient computing
author Glösekötter, Peter
author_facet Glösekötter, Peter
Greveler, Ulrich
Wirth, Gilson Inacio
author_role author
author2 Greveler, Ulrich
Wirth, Gilson Inacio
author2_role author
author
dc.contributor.event.pt_BR.fl_str_mv Iscas ( 2008 May 18-21 : Seattle, Washington)
dc.contributor.author.fl_str_mv Glösekötter, Peter
Greveler, Ulrich
Wirth, Gilson Inacio
dc.subject.por.fl_str_mv Microeletrônica
topic Microeletrônica
publishDate 2008
dc.date.issued.fl_str_mv 2008
dc.date.accessioned.fl_str_mv 2011-07-22T06:00:51Z
dc.type.driver.fl_str_mv Estrangeiro
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dc.relation.ispartof.pt_BR.fl_str_mv IEEE International Symposium on Circuits and Systems (2008 May 18-21 : Seattle, Washington). [Proceedings]. [Los Alamitos] : IEEE, 2008.
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