Eletrodeposição galvanostática de telureto de cádmio sobre silício monocristalino (111)

• Autor(a) principal: Guimarães, Luciano de Moura
• Data de Publicação: 2006
• Tipo de documento: Dissertação
• Idioma: por
• Título da fonte: LOCUS Repositório Institucional da UFV
• Texto Completo: http://locus.ufv.br/handle/123456789/4262
• topic: CdTe; Eletrodeposição; Galvanostática; CdTe; Eletrodeposition; Galvanostatic; CNPQ::CIENCIAS EXATAS E DA TERRA::FISICA::FISICA DA MATERIA CONDENSADA

In the present work, we study films CdTe electrodeposited galvanostatically from aqueous acidic solution (pH<1) onto n-type monocrystalline silicon wafer (111). The optimum current density to obtain good crystalline quality CdTe films was found to be 0,3 mA/cm2. The films were characterized by X-ray diffraction (XRD), scanning electron microscope (SEM) and photoacoustic spectroscopy (PAS). The CdTe films were deposited at room temperature or at 85 ºC and covered evenly the substrate surface. The as-prepared films were non-reflecting and presented a grey color which showed dependence with current density and temperature The SEM pictures revealed a granular structure, without indications of faces that evidenced some crystalline arrangement. The XRD patterns of the films deposited at 85 ºC show peaks associated to the CdTe cubic phase. Additionally, peaks corresponding to a hexagonal phase of the elemental cadmium and tellurium were also detected. However, in the XRD patterns of the films which were grown at low temperature, no peaks were associated to CdTe. This film was passed by chemical treatment in saturated solution of CdCl2 followed by thermal annealing at 420 and 450 °C in nitrogen atmosphere. The XRD patterns of the films after annealing showed only signals associated to the cubic phase of CdTe. These results suggest improvement in the crystallinity of the films grown at room temperature and reduction of the amount of present elemental Te e Cd. Change in microstructure due to the annealing with CdCl2 was observed in the SEM pictures, which show completely recrystallized grains. The measurements of optical absorption in the films grown after annealing by PAS, showed an absorption band around the expected band gap energy value of CdTe. Our experimental results also showed that the CdTe films adhered better to unpolished surfaces.